The impact of sliding motion and current load on the deterioration of tin-coated connectors

T. Hammarm
{"title":"The impact of sliding motion and current load on the deterioration of tin-coated connectors","authors":"T. Hammarm","doi":"10.1109/HOLM.1999.795948","DOIUrl":null,"url":null,"abstract":"The deterioration of tin-coated connectors is mainly caused by macro wear during insertion/withdrawal and fretting during operation. The focal point of this macro-wear study is the increase in the contact resistance when the pure-tin layer is removed and the rider slides on the hard and uneven intermetallic compound, which is referred to as Stage II. Stage II has been divided into two \"sub-stages\", referred to as Stage IIa and Stage IIb, with the transition point between the two defined by a sharp rise in the magnitude of the voltage drop. The transition between Stages IIa and IIb ranged between 70-130 mV, independent of current load. The upper and lower ends of this range correspond to the softening and fusion voltages of tin respectively. The sliding speed has a significant effect on the deterioration during Stage IIa, while the current load does not significantly influence the deterioration as long as the electrically-induced heat is low. In this study an outline of an oxidation model is proposed for describing the deterioration during Stage IIa, and to determine an oxidation constant. Furthermore, the length of duration of Stage IIa can be derived and expressed simply as the inverted value of the oxidation constant.","PeriodicalId":299141,"journal":{"name":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts - 1999. Proceedings of the Forty-Fifth IEEE Holm Conference on Electrical Contacts (Cat. No.99CB36343)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1999.795948","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

The deterioration of tin-coated connectors is mainly caused by macro wear during insertion/withdrawal and fretting during operation. The focal point of this macro-wear study is the increase in the contact resistance when the pure-tin layer is removed and the rider slides on the hard and uneven intermetallic compound, which is referred to as Stage II. Stage II has been divided into two "sub-stages", referred to as Stage IIa and Stage IIb, with the transition point between the two defined by a sharp rise in the magnitude of the voltage drop. The transition between Stages IIa and IIb ranged between 70-130 mV, independent of current load. The upper and lower ends of this range correspond to the softening and fusion voltages of tin respectively. The sliding speed has a significant effect on the deterioration during Stage IIa, while the current load does not significantly influence the deterioration as long as the electrically-induced heat is low. In this study an outline of an oxidation model is proposed for describing the deterioration during Stage IIa, and to determine an oxidation constant. Furthermore, the length of duration of Stage IIa can be derived and expressed simply as the inverted value of the oxidation constant.
滑动运动和电流负载对镀锡连接器劣化的影响
镀锡连接器的劣化主要是由插拔过程中的宏观磨损和运行过程中的微动引起的。宏观磨损研究的重点是去除纯锡层,骑手在坚硬且不均匀的金属间化合物上滑动时接触电阻的增加,这被称为第二阶段。阶段II被分为两个“子阶段”,称为阶段IIa和阶段IIb,两者之间的过渡点由电压降幅度的急剧上升确定。阶段IIa和IIb之间的过渡范围在70-130 mV之间,与电流负载无关。该范围的上端和下端分别对应锡的软化电压和熔合电压。在IIa阶段,滑动速度对劣化有显著影响,而只要电致热较低,电流负载对劣化影响不显著。在这项研究中,提出了一个氧化模型的大纲,用于描述IIa阶段的恶化,并确定氧化常数。此外,IIa阶段的持续时间可以推导出来,并简单地表示为氧化常数的倒转值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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