2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)最新文献_第3页

Realization of frequency-domain circuit analysis through random walk 通过随机游走实现频域电路分析

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509591

T. Miyakawa, Hiroshi Tsutsui, H. Ochi, Takashi Sato

引用次数: 0

High-density integration of functional modules using monolithic 3D-IC technology 采用单片3D-IC技术实现功能模块的高密度集成

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509679

Shreepad Panth, K. Samadi, Yang Du, S. Lim

引用次数: 53

Cache Capacity Aware Thread Scheduling for Irregular Memory Access on many-core GPGPUs 多核gpgpu非规则内存访问的缓存容量感知线程调度

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509618

Hsien-Kai Kuo, Ta-Kan Yen, B. Lai, Jing-Yang Jou

{"title":"Cache Capacity Aware Thread Scheduling for Irregular Memory Access on many-core GPGPUs","authors":"Hsien-Kai Kuo, Ta-Kan Yen, B. Lai, Jing-Yang Jou","doi":"10.1109/ASPDAC.2013.6509618","DOIUrl":"https://doi.org/10.1109/ASPDAC.2013.6509618","url":null,"abstract":"On-chip shared cache is effective to alleviate the memory bottleneck in modern many-core systems, such as GPGPUs. However, when scheduling numerous concurrent threads on a GPGPU, a cache capacity agnostic scheduling scheme could lead to severe cache contention among threads and thus significant performance degradation. Moreover, the diverse working sets in irregular applications make the cache contention issue an even more serious problem. As a result, taking cache capacity into account has become a critical scheduling issue of GPGPUs. This paper formulates a Cache Capacity Aware Thread Scheduling Problem to capture the impact of cache capacity as well as different architectural considerations. With a proof to be NP-hard, this paper has proposed two algorithms to perform the cache capacity aware thread scheduling. The simulation results on Nvidia's Fermi configuration have shown that the proposed scheduling scheme can effectively avoid cache contention, and achieve an average of 44.7% cache miss reduction and 28.5% runtime enhancement. The paper also shows the runtime can be enhanced up to 62.5% for more complex applications.","PeriodicalId":297528,"journal":{"name":"2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126872834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 12

Layer minimization in escape routing for staggered-pin-array PCBs 交错引脚阵列pcb的逃逸路由层最小化

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509594

Yuan-Kai Ho, Xin-Wei Shih, Yao-Wen Chang, Chung-Kuan Cheng

引用次数: 6

On potential design impacts of electromigration awareness 论电迁移意识对设计的潜在影响

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509650

A. Kahng, S. Nath, T. Simunic

{"title":"On potential design impacts of electromigration awareness","authors":"A. Kahng, S. Nath, T. Simunic","doi":"10.1109/ASPDAC.2013.6509650","DOIUrl":"https://doi.org/10.1109/ASPDAC.2013.6509650","url":null,"abstract":"Reliability issues significantly limit performance improvements from Moore's-Law scaling. At 45nm and below, electromigration (EM) is a serious reliability issue which affects global and local interconnects in a chip and limits performance scaling. Traditional IC implementation flows meet a 10-year lifetime requirement by overdesigning and sacrificing performance. At the same time, it is well-known among circuit designers that Black's Equation [2] suggests that lifetime can be traded for performance. In our work, we carefully study the impacts of EM-awareness on IC implementation outcomes, and show that circuit performance does not trade off so smoothly with mean time to failure (MTTF) as suggested by Black's Equation. We conduct two basic studies: EM lifetime versus performance with fixed resource budget, and EM lifetime versus resource with fixed performance. Using design examples implemented in two process nodes, we show that performance scaling achieved by reducing the EM lifetime requirement depends on the EM slack in the circuit, which in turn depends on factors such as timing constraints, length of critical paths and the mix of cell sizes. Depending on these factors, the performance gain can range from 10% to 80% when the lifetime requirement is reduced from 10 years to one year. We show that at a fixed performance requirement, power and area resources are affected by the timing slack and can either decrease by 3% or increase by 7.8% when the MTTF requirement is reduced. We also study how conventional EM fixes using per net Non-Default Rule (NDR) routing, downsizing of drivers, and fanout reduction affect performance at reduced lifetime requirements. Our study indicates, e.g., that NDR routing can increase performance by up to 5% but at the cost of 2% increase in area at a reduced 7-year lifetime requirement.","PeriodicalId":297528,"journal":{"name":"2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134053079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 35

Multi-mode pipelined MPSoCs for streaming applications 流应用的多模式流水线mpsoc

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509601

Haris Javaid, D. Witono, S. Parameswaran

{"title":"Multi-mode pipelined MPSoCs for streaming applications","authors":"Haris Javaid, D. Witono, S. Parameswaran","doi":"10.1109/ASPDAC.2013.6509601","DOIUrl":"https://doi.org/10.1109/ASPDAC.2013.6509601","url":null,"abstract":"In this paper, we propose a design flow for the pipelined paradigm of Multi-Processor System on Chips (MPSoCs) targeting multiple streaming applications. A multi-mode pipelined MPSoC, used as a streaming accelerator, executes multiple, mutually exclusive applications through modes where each mode refers to the execution of one application. We model each application as a directed graph. The challenge is to merge application graphs into a single graph so that the multi-mode pipelined MPSoC derived from the merged graph contains minimal resources. We solve this problem by finding maximal overlap between application graphs. Three heuristics are proposed where two of them greedily merge application graphs while the third one finds an optimal merging at the cost of higher running time. The results indicate significant area saving (up to 62% processor area, 57% FIFO area and 44 processor/FIFO ports) with minuscule degradation of system throughput (up to 2%) and latency (up to 2%) and increase in energy values (up to 3%) when compared to widely used approach of designing distinct pipelined MPSoCs for individual applications. Our work is the first step in the direction of multi-mode pipelined MPSoCs, and the results demonstrate the usefulness of resource sharing among pipelined MPSoCs based streaming accelerators in a multimedia platform.","PeriodicalId":297528,"journal":{"name":"2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134527197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

A network-flow based valve-switching aware binding algorithm for flow-based microfluidic biochips 基于流量的微流控生物芯片基于网络流的阀开关感知绑定算法

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509598

Kai-Han Tseng, Sheng-Chi You, W. H. Minhass, Tsung-Yi Ho, P. Pop

引用次数: 12

Statistical analysis of BTI in the presence of process-induced voltage and temperature variations 过程感应电压和温度变化时BTI的统计分析

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509663

F. Firouzi, S. Kiamehr, M. Tahoori

{"title":"Statistical analysis of BTI in the presence of process-induced voltage and temperature variations","authors":"F. Firouzi, S. Kiamehr, M. Tahoori","doi":"10.1109/ASPDAC.2013.6509663","DOIUrl":"https://doi.org/10.1109/ASPDAC.2013.6509663","url":null,"abstract":"In nano-scale regime, there are various sources of uncertainty and unpredictability of VLSI designs such as transistor aging mainly due to Bias Temperature Instability (BTI) as well as Process-Voltage-Temperature (PVT) variations. BTI exponentially varies by temperature and the actual supply voltage seen by the transistors within the chip which are functions of leakage power. Leakage power is strongly impacted by PVT and BTI which in turn results in thermal-voltage variations. Hence, neglecting one or some of these aspects can lead to a considerable inaccuracy in the estimated BTI-induced delay degradation. However, a holistic approach to tackle all these issues and their interdependence is missing. In this paper, we develop an analytical model to predict the probability density function and covariance of temperatures and voltage droops of a die in the presence of the BTI and process variation. Based on this model, we propose a statistical method that characterizes the life-time of the circuit affected by BTI in the presence of process-induced temperature-voltage variations. We observe that for benchmark circuits, treating each aspect independently and ignoring their intrinsic interactions results in 16% over-design, translating to unnecessary yield and performance loss.","PeriodicalId":297528,"journal":{"name":"2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134398194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 26

Can we identify smartphone app by power trace? [Extended abstract for special session] 我们能通过电量追踪来识别智能手机应用吗?[特别会议扩展摘要]

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509624

Mian Dong, Po-Hsiang Lai, Zhu Li

引用次数: 0

Power optimization for application-specific 3D network-on-chip with multiple supply voltages 针对具有多个电源电压的特定应用的3D片上网络的电源优化

2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC) Pub Date : 2013-04-29 DOI: 10.1109/ASPDAC.2013.6509622

Kan Wang, Sheqin Dong

引用次数: 5