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2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)最新文献

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Metal Vapor Laser Pumping Source with a Multistage Charge of Storage Capacitor 存储电容多级充电的金属蒸汽激光抽运源
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/EDM52169.2021.9507719
K. Semenov, P. Gembukh, M. Trigub
{"title":"Metal Vapor Laser Pumping Source with a Multistage Charge of Storage Capacitor","authors":"K. Semenov, P. Gembukh, M. Trigub","doi":"10.1109/EDM52169.2021.9507719","DOIUrl":"https://doi.org/10.1109/EDM52169.2021.9507719","url":null,"abstract":"The article presents the development of a pump source for a metal vapor laser with a multistage charge of a storage capacitor. The source block diagram and schematic diagram are presented. An estimate of the source mass and size parameters and their comparison with the most common sources of charging a storage capacitor per one pulse is given. Waveforms of voltage and current through the main elements of the source are demonstrated. The design of the active element experimental plant is shown. The waveforms of voltage and current at high-frequency charging of the storage capacitor are shown. The efficiency of the multistage charging of a storage capacitor in pumping sources for excitation of metal and metal halide active media is estimated.","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"23 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131892727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Section 3 X-Ray, Sonic and Ultrasonic Devices: Physics, Electronics, Application 第三节x射线、声波和超声波设备:物理、电子、应用
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/edm52169.2021.9507685
{"title":"Section 3 X-Ray, Sonic and Ultrasonic Devices: Physics, Electronics, Application","authors":"","doi":"10.1109/edm52169.2021.9507685","DOIUrl":"https://doi.org/10.1109/edm52169.2021.9507685","url":null,"abstract":"","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130959216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Information Technologies in Evidence-Based Education 循证教育中的信息技术
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/EDM52169.2021.9507567
S. Storozheva, A. Popova, N. Mikidenko, A. Borisova, E. Borisova
{"title":"Information Technologies in Evidence-Based Education","authors":"S. Storozheva, A. Popova, N. Mikidenko, A. Borisova, E. Borisova","doi":"10.1109/EDM52169.2021.9507567","DOIUrl":"https://doi.org/10.1109/EDM52169.2021.9507567","url":null,"abstract":"The development of information technologies has determined the possibility of developing evidence-based education. The goal of evidence-based education as in evidence-based medicine is to use such pedagogical technologies that would allow students to achieve maximum results in the learning process. The adoption of information technologies made it possible through the digital accumulation of various data about the subject of the educational process and the digital analysis of this data. There is a unique opportunity to personalize learning, to create individual learning paths for many learners, as opposed to the practices of mass education and unification of the industrial era. The authors turn to the study of the possibilities for applying the evidence-based approach in education based on the use of information technologies in educational organizations in order to create individual educational trajectories of students. The article considers the possibilities of creating a system of diagnostics, monitoring, adaptation, and correction of students' educational achievements in an educational organization based on the analysis of “digital traces” of the educational activity of the subject of the educational process.","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128374166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Methods for Developing Digital Twins of Roles Based on Semantic Domain-Specific Languages 基于语义领域特定语言的角色数字孪生开发方法
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/EDM52169.2021.9507716
D. Palchunov, A. Vaganova
{"title":"Methods for Developing Digital Twins of Roles Based on Semantic Domain-Specific Languages","authors":"D. Palchunov, A. Vaganova","doi":"10.1109/EDM52169.2021.9507716","DOIUrl":"https://doi.org/10.1109/EDM52169.2021.9507716","url":null,"abstract":"A digital twin is a virtual representation of a physical object or system throughout its entire lifecycle using real-time data. Digital twins of business processes are used to develop management and production methodologies. To create such digital twins, it is necessary to describe the knowledge about the subject domain, to model the regulations and roles involved in the processes. To solve this problem, we use semantic domain-specific languages (sDSL). They allow knowledge about the subject domain to be declaratively described and this knowledge into executable code to be implemented. The d0s1 language implements the ideas of sDSL in practice and allows domain-specific languages for modeling business processes to be created. The digital twin of role includes the knowledge and competencies of the original, is described in the d0s1 language and is able to perform the actions of its original as part of the implementation of business processes.","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131633590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Section 6 Biomedical Electronics and Engineering 第六节生物医学电子与工程
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/edm52169.2021.9507683
{"title":"Section 6 Biomedical Electronics and Engineering","authors":"","doi":"10.1109/edm52169.2021.9507683","DOIUrl":"https://doi.org/10.1109/edm52169.2021.9507683","url":null,"abstract":"","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126880761","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Experimental Testing of the Complex Method for Increasing Decision-Making Reliability by Electro-Optical Device for Fire Detection on Background of Dynamic Optical Interferences 动态光干扰背景下提高光电火灾探测决策可靠性的复合方法实验测试
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/EDM52169.2021.9507681
N. Tupikina, Andrey I. Kin, S. Lisakov, E. Sypin
{"title":"Experimental Testing of the Complex Method for Increasing Decision-Making Reliability by Electro-Optical Device for Fire Detection on Background of Dynamic Optical Interferences","authors":"N. Tupikina, Andrey I. Kin, S. Lisakov, E. Sypin","doi":"10.1109/EDM52169.2021.9507681","DOIUrl":"https://doi.org/10.1109/EDM52169.2021.9507681","url":null,"abstract":"Experimental testing of the complex method for increasing the decision-making reliability by electro-optical device when detecting fire against dynamic optical interference background was carried out. As a result, the data on spectral radiant luminosity for fires in form of propane burner, alcohol burner, gasoline burner, wooden blocks burning and polyurethane foam mat burning were obtained at various times. The temperature calculation relative error for fires does not exceed 13% and corresponds to the literature data. The data on measured spectral radiant luminosity were obtained for dynamic optical interference. Dynamic optical interference is radiation of AC incandescent lamp with power of 40 W when the lamp power source was switched on and off. The calculated maximum temperature of incandescent lamp is 2479 K. The calculated maximum temperature is close to the maximum temperature of 2455 K which was experimentally obtained by the method with sweep along wavelength earlier. The lamp emissivity data are consistent with the literature data on emissivity of tungsten in the wavelength range from 1.9 to 2.9 µm. The rules for the decision-making by electro-optical device about the presence of fire or dynamic optical interference are determined. The complex method allows uniquely identifying the presence of fire and/or dynamic optical interference.","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128170679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Towards the Translation of Reflex Programs to Promela: Model Checking Wheelchair Lift Software 对反射程序到Promela的翻译:模型检查轮椅升降软件
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/EDM52169.2021.9507563
Anna A. Ponomarenko, N. Garanina, S. Staroletov, V. Zyubin
{"title":"Towards the Translation of Reflex Programs to Promela: Model Checking Wheelchair Lift Software","authors":"Anna A. Ponomarenko, N. Garanina, S. Staroletov, V. Zyubin","doi":"10.1109/EDM52169.2021.9507563","DOIUrl":"https://doi.org/10.1109/EDM52169.2021.9507563","url":null,"abstract":"In the paper, we examine an approach for verifying control programs initially specified in the process-oriented programming language Reflex using model checking, a formal verification method. We propose a technique to translate discrete-state Reflex programs into Promela language. The latter language fits into the class of modeling languages, and is used with the SPIN verifier. We consider a Reflex-program intended to control a wheelchair lift (platform for low-mobility users). We describe the program-to-model transformation for this example, elaborate requirements and discuss the result of verification consideration.","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123844502","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Checking Robustness of Web Services based on Solving Automata Equations 基于求解自动机方程的Web服务鲁棒性检验
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/EDM52169.2021.9507669
A. Kolomeets, Ekaterina Shirokova, M. Gromov, N. Yevtushenko
{"title":"Checking Robustness of Web Services based on Solving Automata Equations","authors":"A. Kolomeets, Ekaterina Shirokova, M. Gromov, N. Yevtushenko","doi":"10.1109/EDM52169.2021.9507669","DOIUrl":"https://doi.org/10.1109/EDM52169.2021.9507669","url":null,"abstract":"In this paper, we consider checking the robustness of web services using the model of finite state automata and analyzing the solvability of an automaton equation over the concatenation operator. The paper contains the procedure for constructing the largest solution for a solvable automata equation, since a solution to the equation describes a malicious input. Experimental results have shown that this approach can be effective when checking the robustness of web services.","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124263613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of the Dispersion-Geometric Model of MOSFET's Gate Structures for Production In-line Control by Means of Optical Scatterometry 用光学散射法建立用于生产在线控制的MOSFET栅极结构的色散几何模型
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/EDM52169.2021.9507679
I. Nelyubin, A. Volokhovskiy, A. Pavlova
{"title":"Development of the Dispersion-Geometric Model of MOSFET's Gate Structures for Production In-line Control by Means of Optical Scatterometry","authors":"I. Nelyubin, A. Volokhovskiy, A. Pavlova","doi":"10.1109/EDM52169.2021.9507679","DOIUrl":"https://doi.org/10.1109/EDM52169.2021.9507679","url":null,"abstract":"This paper discusses the developed production-worthy method to control of the critical dimensions and shape of the gate, the first and second sidewalls of field-effect transistors using the optical scatterometry. The results of measuring dimensions (thickness, inclination angle and other) were compared with independent measurements by scanning electron microscopy. Assessed of the possibility of control additional geometric parameters the above structures by developed method. The organization of control of additional shape parameters will allow us to identify technological problems earlier, which will lead to a decrease in production costs, an increase in reliability of semiconductor devices and, finally, an increase in yield.","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121517704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comparison of the Coplanar Waveguide to Microstrip Line Transition Design in the 77 GHz Frequency Range 77ghz频率范围内共面波导与微带线过渡设计的比较
2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM) Pub Date : 2021-06-30 DOI: 10.1109/EDM52169.2021.9507625
V. Chechetkin, S. Shabunin
{"title":"Comparison of the Coplanar Waveguide to Microstrip Line Transition Design in the 77 GHz Frequency Range","authors":"V. Chechetkin, S. Shabunin","doi":"10.1109/EDM52169.2021.9507625","DOIUrl":"https://doi.org/10.1109/EDM52169.2021.9507625","url":null,"abstract":"This paper presents various design approaches for a transition from coplanar waveguide to the microstrip transmission line for different applications in the 76–81 GHz frequency range. This work aims to analyze the impedance and decoupling characteristics of two types of transitions. One of them is a direct conversion of transmission line types, while the other is a transition through a substrate integrated waveguide. The usage of substrate integrated waveguide makes it possible to cover the radio frequency components with a shield. Shielding is used to increase the signal-to-noise ratio and to avoid possible electromagnetic compatibility problems. For both types, their reflection and transmission coefficients are analyzed. Decoupling between two transitions with half-wavelength spacing was studied. The presented results make it possible to choose the most suitable design of the transition, considering the requirements for its parameters.","PeriodicalId":281783,"journal":{"name":"2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124888040","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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