1982 IEEE International Symposium on Electromagnetic Compatibility最新文献

筛选
英文 中文
Evaluation of Radiated Emission and Susceptibility Measurement Techniques 辐射发射和磁化率测量技术的评价
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567753
J. Daher, E. E. Donaldson, J. A. Woody
{"title":"Evaluation of Radiated Emission and Susceptibility Measurement Techniques","authors":"J. Daher, E. E. Donaldson, J. A. Woody","doi":"10.1109/ISEMC.1982.7567753","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567753","url":null,"abstract":"Abstract : The objective of this program was to evaluate current radiated emission and susceptibility measurement techniques to determine their applicability to performing measurements required under MIL-STD-462. To accomplish this objective, program efforts were directed to a review and comparison of the technical capabilities and limitations of current radiated emission and susceptibility measurement techniques and to the identification of voids and deficiencies in current measurement methodologies. From the results of this program, it is concluded that a number of measurement techniques offer the potential of serving as viable alternates to those measurement techniques currently employed to satisfy the measurement requirements of MIL-STD-462. Shortcomings in current measurement techniques include (1) deficiencies which prevent the maximum utilization of available measurement techniques, (2) deficiencies in reducing to practice those measurement techniques which have been identified as possible alternates to current techniques, and (3) deficiencies related to the lack of correlation of measurement results obtained with different techniques.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"6 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131892845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
RF Discharge Interference 射频放电干扰
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567780
D. Clark, T. Shands
{"title":"RF Discharge Interference","authors":"D. Clark, T. Shands","doi":"10.1109/ISEMC.1982.7567780","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567780","url":null,"abstract":"When high-power radiating systems irradiate metal structures, RF discharges or arcs can be generated between parasitic electrodes located on the metal structures. These RF discharges have been known to cause interference to sensitive electronic systems. This paper discusses the physical and spectral properties of RF discharges in both a single and multiple source environment. Previous research is reviewed and an apparatus is shown which was used to generate RF discharges. The measured physical and spectral characteristics of discharges are given and the effect of these characteristics on some EMI aspects of RF discharges are determined.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129263094","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radiation from Printed Wiring Boards 印刷线路板的辐射
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567728
B. Cooperstein
{"title":"Radiation from Printed Wiring Boards","authors":"B. Cooperstein","doi":"10.1109/ISEMC.1982.7567728","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567728","url":null,"abstract":"Owing to the ever increasing use of high frequency clock circuits used to control the timing of microprocessors, and to the legal requirements to control radiated as well as con­ ducted electrom agnetic emissions, it is necessary to minimize radiation from printed wiring boards, as they have been found to be serious radiated EME sources, if not carefully designed. This paper describes the results of experiments made to better understand and to isolate some of the parameters that a ffec t radiation levels.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"17 9","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121004179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Analysis Models for Case Design Above 1 GHz 1ghz以上机箱设计分析模型
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567717
L. Campbell, D. G. Williams
{"title":"Analysis Models for Case Design Above 1 GHz","authors":"L. Campbell, D. G. Williams","doi":"10.1109/ISEMC.1982.7567717","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567717","url":null,"abstract":"This paper describes an analysis method used to provide enclosure (case) design guidance applicable at frequencies above 1 GHz. The models developed herein establish design constraints for EMI gaskets, fastener spacing, cover to case flatness, and case thickness. Additionally, this paper shows the usefulness of the models for evaluating existing design discrepancies uncovered bv tests. Summary This analysis approach, including models, and their application technique, was developed when a need was determined by a 200V/M R.F. Susceptibility requirement up to 40 GHz. Hardware was being designed and no method to determine a higher design confidence was available. This analysis was used to provide early design analysis of equipment enclosures for compliance with the 200V/M requirement above 1 GHz. The shielding effectiveness of cases was evaluated for leakage.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131398619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Theoretical and Experimental Transfer Impedance for Concentric Layers of Coaxial Shielding 同轴屏蔽同心层传输阻抗的理论与实验研究
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567766
M. Dinallo
{"title":"Theoretical and Experimental Transfer Impedance for Concentric Layers of Coaxial Shielding","authors":"M. Dinallo","doi":"10.1109/ISEMC.1982.7567766","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567766","url":null,"abstract":"Modeling c o n c en tr i c layers o f braided s h i e l d s i s an in t e g r a l par t o f system hardening techno logy fo r Elec tromagnet ic Pulse (EMP) phenomena. To determine the accuracy o f a m u l t i p l e s h i e l d model, the model i s compared to measured data . This paper compares th e o ­ r e t i c a l and experimental t r a n s f e r impedance data f o r one , two and three la y er s o f machine-braided s h i e l d s . The experimental data was obta ined us ing a quadraxial t e s t f i x t u r e from 1 kHz t o 100 MHz. These r e s u l t s confirm S c h e lk u n o f f ' s t o t a l t r a n s f e r imped­ ance theorem^. The measured data a l s o showed t h a t the h igh-frequency , t o t a l t r a n s f e r impedance model (due to aperture coupl ing) i s inadequate to de sc r ib e m u l t i p l e l a y e r e d braided s h i e l d s s i n c e the t r a n s f e r impedance i s found not t o be d i r e c t l y proport ional to frequencyZ .","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126490259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Evaluation of Electromagnetic Environment Profiles in Urban Areas: Method and Results 城市电磁环境剖面评价方法与结果
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567759
J. LeBel, G. B. Craig, P. Bouliane
{"title":"An Evaluation of Electromagnetic Environment Profiles in Urban Areas: Method and Results","authors":"J. LeBel, G. B. Craig, P. Bouliane","doi":"10.1109/ISEMC.1982.7567759","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567759","url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129831369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improved Graphical Interference Analysis 改进的图形干扰分析
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567723
D. V. Gonshor, J. Osburn
{"title":"Improved Graphical Interference Analysis","authors":"D. V. Gonshor, J. Osburn","doi":"10.1109/ISEMC.1982.7567723","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567723","url":null,"abstract":"Well known techniques exist for graphically generating frequency domain characteristics of time domain interference signals, as well as coupling or transfer functions (field-to-wire, wire-to-wire, etc). The frequency domain interference source spectrum and transfer function are combined to produce a coupled interference spectrum. The. resulting coupled signal in the time domain is not as easy to determine without employing computer inverse Fourier transform codes. Simple graphical techniques for inverse transformations over-estimate the magnitude of the coupled signal, and reveal little about average coupled power, energy or waveforms. This paper will review a simple graphical inverse transformation technique, estimate the resulting error and identify new and more accurate graphical techniques using straightforward spectral analysis theorems. Review of a Simple Graphical Inverse Transformation","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":" 15","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133120017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fiber Optic Sensor Instrumentation Research and Development (FOSIRD) in Electromagnetic Field Measurements 电磁场测量中光纤传感器仪器的研究与开发
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567736
Melvin J. Johnson, C. Davis
{"title":"Fiber Optic Sensor Instrumentation Research and Development (FOSIRD) in Electromagnetic Field Measurements","authors":"Melvin J. Johnson, C. Davis","doi":"10.1109/ISEMC.1982.7567736","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567736","url":null,"abstract":"Extremely low-frequency electric and magnetic field mea­ surements have traditionally been made with capacitive and wire wound probes, respectively. Both types of probes have serious limitations. Although they easily meet the physical criteria of being much less than a wavelength in their largest dimension at these low frequencies, their sizes are such that they are impractical in confined spaces, as in biological use, or when placed in very close proximity to equipment around which the fields are mea­ sured. Also, the transmission of data from these probes requires that a transmitter be located in the field that is being measured, if the data lines are to be nonperturbing. This paper discusses the emerging “ Fiber Optic Sensor Instrumentation Research and Development (FOSIRD)” in EMC measurement applications.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133211853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Balance-Unbalance Transformer for Induction Noise Reduction in Cables 一种用于电缆感应降噪的平衡-不平衡变压器
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567768
Tadashi Kobayashi, O. Inui, Yoshihiko Miyazaki
{"title":"A Balance-Unbalance Transformer for Induction Noise Reduction in Cables","authors":"Tadashi Kobayashi, O. Inui, Yoshihiko Miyazaki","doi":"10.1109/ISEMC.1982.7567768","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567768","url":null,"abstract":"A balance-unbalance transformer has been used in transmission systems to reduce induction noise, which is translated to in-phase longitudinal current along a twin cable toward the g r o u n d . E q u i v a l e n t longitu­ dinal current circuits for the transformer have been derived, and computation formulas have been obtained. Two transformer configurations which eliminate the need for any shield between the windings are newly intro­ duced, and good agreement between experimental data and calculated data is demonstrated.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"336 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116653983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Advanced Concepts for Vulnerability and Susceptibility Testing 漏洞和敏感性测试的高级概念
1982 IEEE International Symposium on Electromagnetic Compatibility Pub Date : 1982-09-01 DOI: 10.1109/ISEMC.1982.7567733
Robert D. Goldblum, Donald R. Shepherd
{"title":"Advanced Concepts for Vulnerability and Susceptibility Testing","authors":"Robert D. Goldblum, Donald R. Shepherd","doi":"10.1109/ISEMC.1982.7567733","DOIUrl":"https://doi.org/10.1109/ISEMC.1982.7567733","url":null,"abstract":"This paper describes the general requirements for vulnerability and susceptibility testing required on military programs and recommended for commercial equipment., A new test method centered around the use of a CAVITENNA (Note 1) is explained, showing how expedient and accurate tests can be performed and emphasizing the resonance effects of a shielded enclosure. Broadband RF absorbing anechoic material was used to reduce this resonance and, although some­ what effective, the resonance was still prevalent. A low cost automatic test system concept is pre­ sented along with selected samples of the results to demonstrate successes, problem areas, and the need for further research and development.","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126115155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信