{"title":"Power loss reduction in electrical network using optimized location and size of multi distributed generators","authors":"C. Nichita, A. Ameri","doi":"10.1109/ISEEE.2017.8170645","DOIUrl":"https://doi.org/10.1109/ISEEE.2017.8170645","url":null,"abstract":"The location of distributed generators (DG) with different size on the power distribution systems could modify the voltage profile and impacts the level of real power losses. Faster optimization technique as well as a high computational speed of load flow are therefore required. This paper presents a linear model and an algorithm that allow to calculate the real power losses of the system. This methodology is based on the graph theory for representing the electrical network and generate the incident matrix. The Interior Point (IP) method is chosen as a local optimization method to solve problems of large-scale nonlinearity of power grid flows. The proposed approach obtains the optimal location and size of the DG units for each bus system with an important saving computational time and it has been tested with three standard IEEE bus. The results demonstrate the capability of the proposed method to reduce the active power losses with an advantageous time saving comparing to nonlinear approach based on Newton Raphson method.","PeriodicalId":276733,"journal":{"name":"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121649327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Beiu, N. Golovanov, R. Porumb, C. Toader, G. Buica
{"title":"Power quality in relation to the requirements of electromagnetic compatibility","authors":"C. Beiu, N. Golovanov, R. Porumb, C. Toader, G. Buica","doi":"10.1109/ISEEE.2017.8170653","DOIUrl":"https://doi.org/10.1109/ISEEE.2017.8170653","url":null,"abstract":"In modern systems, where many equipment are controlled by electronic devices, power transmission and distribution networks are increasingly turning into “smart grids”. There is the question of the immunity of these equipment to the action of electromagnetic fields generated by other equipment, as well as the immunity of other control and monitoring devices to the action of electromagnetic fields generated by electrical installations. Transmission and distribution networks, due to their size, are one of the most important sources of disruptive electromagnetic fields. But due to their increased complexity and dependence on embedded technologies, new networks in turn can become “victims” of disruptive electromagnetic fields, which can adversely affect the reliability of the power supply.","PeriodicalId":276733,"journal":{"name":"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)","volume":"197 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113980595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Copyright page","authors":"","doi":"10.1109/ihmsc.2018.00003","DOIUrl":"https://doi.org/10.1109/ihmsc.2018.00003","url":null,"abstract":"","PeriodicalId":276733,"journal":{"name":"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1960-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133794009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Marinescu, I. Birou, V. Mînzu, Codres Bogdan, L. Moraru, A. Bratcu, D. Munteanu, M. Brojboiu, T. Munteanu, S. Caraman, T. Munteanu, E. Ceanga, C. Nichita, M. Ciobotaru, V. Nicolau, R. Paduraru, F. Constantinescu, I. Paraschiv, Anisia Culea, I. Piroi, M. Culea, R. Popa, M. Denai, Mihaela Popescu, R. Dogaru, Pentiuc Radu Dumitru, B. Dumitrascu, E. Răducan, A. Dumitrescu, M. Radulescu, M. Dumitrescu, E. Roșu, Toader Dumitru, Sami Sazak, S. Epure, Ion Sobor, D. Floricau, R. Șolea, L. Frangu, E. Spunei, M. Gaiceanu, M. Stępień, G. Gurguiatu, I. Susnea, E. Helerea, D. Tarniceriu, G. Ifrim, R. Vilanova, M. Kasprzak, C. Vlad
{"title":"The reviewers of the ISEEE-2017","authors":"A. Marinescu, I. Birou, V. Mînzu, Codres Bogdan, L. Moraru, A. Bratcu, D. Munteanu, M. Brojboiu, T. Munteanu, S. Caraman, T. Munteanu, E. Ceanga, C. Nichita, M. Ciobotaru, V. Nicolau, R. Paduraru, F. Constantinescu, I. Paraschiv, Anisia Culea, I. Piroi, M. Culea, R. Popa, M. Denai, Mihaela Popescu, R. Dogaru, Pentiuc Radu Dumitru, B. Dumitrascu, E. Răducan, A. Dumitrescu, M. Radulescu, M. Dumitrescu, E. Roșu, Toader Dumitru, Sami Sazak, S. Epure, Ion Sobor, D. Floricau, R. Șolea, L. Frangu, E. Spunei, M. Gaiceanu, M. Stępień, G. Gurguiatu, I. Susnea, E. Helerea, D. Tarniceriu, G. Ifrim, R. Vilanova, M. Kasprzak, C. Vlad","doi":"10.1109/iseee.2017.8170711","DOIUrl":"https://doi.org/10.1109/iseee.2017.8170711","url":null,"abstract":"","PeriodicalId":276733,"journal":{"name":"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124438586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Title page","authors":"M. Gaiceanu","doi":"10.7873/date2014.001","DOIUrl":"https://doi.org/10.7873/date2014.001","url":null,"abstract":"","PeriodicalId":276733,"journal":{"name":"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125839794","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}