isee -2017的审稿人

{"title":"isee -2017的审稿人","authors":"A. Marinescu, I. Birou, V. Mînzu, Codres Bogdan, L. Moraru, A. Bratcu, D. Munteanu, M. Brojboiu, T. Munteanu, S. Caraman, T. Munteanu, E. Ceanga, C. Nichita, M. Ciobotaru, V. Nicolau, R. Paduraru, F. Constantinescu, I. Paraschiv, Anisia Culea, I. Piroi, M. Culea, R. Popa, M. Denai, Mihaela Popescu, R. Dogaru, Pentiuc Radu Dumitru, B. Dumitrascu, E. Răducan, A. Dumitrescu, M. Radulescu, M. Dumitrescu, E. Roșu, Toader Dumitru, Sami Sazak, S. Epure, Ion Sobor, D. Floricau, R. Șolea, L. Frangu, E. Spunei, M. Gaiceanu, M. Stępień, G. Gurguiatu, I. Susnea, E. Helerea, D. Tarniceriu, G. Ifrim, R. Vilanova, M. Kasprzak, C. Vlad","doi":"10.1109/iseee.2017.8170711","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":276733,"journal":{"name":"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The reviewers of the ISEEE-2017\",\"authors\":\"A. Marinescu, I. Birou, V. Mînzu, Codres Bogdan, L. Moraru, A. Bratcu, D. Munteanu, M. Brojboiu, T. Munteanu, S. Caraman, T. Munteanu, E. Ceanga, C. Nichita, M. Ciobotaru, V. Nicolau, R. Paduraru, F. Constantinescu, I. Paraschiv, Anisia Culea, I. Piroi, M. Culea, R. Popa, M. Denai, Mihaela Popescu, R. Dogaru, Pentiuc Radu Dumitru, B. Dumitrascu, E. Răducan, A. Dumitrescu, M. Radulescu, M. Dumitrescu, E. Roșu, Toader Dumitru, Sami Sazak, S. Epure, Ion Sobor, D. Floricau, R. Șolea, L. Frangu, E. Spunei, M. Gaiceanu, M. Stępień, G. Gurguiatu, I. Susnea, E. Helerea, D. Tarniceriu, G. Ifrim, R. Vilanova, M. Kasprzak, C. Vlad\",\"doi\":\"10.1109/iseee.2017.8170711\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":276733,\"journal\":{\"name\":\"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/iseee.2017.8170711\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 5th International Symposium on Electrical and Electronics Engineering (ISEEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/iseee.2017.8170711","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}