2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)最新文献

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A Novel Fault-Tolerant Logic Style with Self-Checking Capability 一种具有自检能力的容错逻辑
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-09-12 DOI: 10.1109/IOLTS56730.2022.9897818
Mahdi Taheri, Saeideh Sheikhpour, A. Mahani, M. Jenihhin
{"title":"A Novel Fault-Tolerant Logic Style with Self-Checking Capability","authors":"Mahdi Taheri, Saeideh Sheikhpour, A. Mahani, M. Jenihhin","doi":"10.1109/IOLTS56730.2022.9897818","DOIUrl":"https://doi.org/10.1109/IOLTS56730.2022.9897818","url":null,"abstract":"We introduce a novel logic style with self-checking capability to enhance hardware reliability at logic level. The proposed logic cells have two-rail inputs/outputs, and the functionality for each rail of outputs enables construction of fault-tolerant configurable circuits. The AND and OR gates consist of 8 transistors based on CNFET technology, while the proposed XOR gate benefits from both CNFET and low-power MGDI technologies in its transistor arrangement. To demonstrate the feasibility of our new logic gates, we used an AES S-box implementation as the use case. The extensive simulation results using HSPICE indicate that the case-study circuit using on proposed gates has superior speed and power consumption compared to other implementations with error-detection capability.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117112087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IOLTS 2022 Cover Page IOLTS 2022封面页
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-09-12 DOI: 10.1109/iolts56730.2022.9897532
{"title":"IOLTS 2022 Cover Page","authors":"","doi":"10.1109/iolts56730.2022.9897532","DOIUrl":"https://doi.org/10.1109/iolts56730.2022.9897532","url":null,"abstract":"","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115484303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Towards AI-Enabled Hardware Security: Challenges and Opportunities 面向人工智能硬件安全:挑战与机遇
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-09-12 DOI: 10.1109/IOLTS56730.2022.9897507
H. Sayadi, Mehrdad Aliasgari, Furkan Aydin, S. Potluri, Aydin Aysu, Jacky Edmonds, Sara Tehranipoor
{"title":"Towards AI-Enabled Hardware Security: Challenges and Opportunities","authors":"H. Sayadi, Mehrdad Aliasgari, Furkan Aydin, S. Potluri, Aydin Aysu, Jacky Edmonds, Sara Tehranipoor","doi":"10.1109/IOLTS56730.2022.9897507","DOIUrl":"https://doi.org/10.1109/IOLTS56730.2022.9897507","url":null,"abstract":"Recent developments in Artificial Intelligence (AI) and Machine Learning (ML), driven by a substantial increase in the size of data in emerging computing systems, have led into successful applications of such intelligent techniques in various disciplines including security. Traditionally, integrity of data has been protected with various security protocols at the software level with the underlying hardware assumed to be secure. This assumption however is no longer true with an increasing number of attacks reported on the hardware. The emergence of new security threats (e.g., malware, side-channel attacks, etc.) requires patching/updating the software-based solutions that needs a vast amount of memory and hardware resources. Therefore, the security should be delegated to the underlying hardware, building a bottom-up solution for securing computing devices rather than treating it as an afterthought. This paper highlights the growing role of AI/ML techniques in hardware and architecture security field and provides insightful discussions on pressing challenges, opportunities, and future directions of designing accurate and efficient machine learning-based attacks and defense mechanisms in response to emerging hardware security vulnerabilities in modern computer systems and next generation of cryptosystems.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127093524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Sources of Single Event Effects in the NVIDIA Xavier SoC Family under Proton Irradiation 质子照射下NVIDIA Xavier SoC系列中单事件效应的来源
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-09-12 DOI: 10.1109/iolts56730.2022.9897236
Ivan Rodriguez-Ferrandez, M. Tali, Leonidas Kosmidis, M. Rovituso, D. Steenari
{"title":"Sources of Single Event Effects in the NVIDIA Xavier SoC Family under Proton Irradiation","authors":"Ivan Rodriguez-Ferrandez, M. Tali, Leonidas Kosmidis, M. Rovituso, D. Steenari","doi":"10.1109/iolts56730.2022.9897236","DOIUrl":"https://doi.org/10.1109/iolts56730.2022.9897236","url":null,"abstract":"In this paper we characterise two embedded GPU devices from the NVIDIA Xavier family System-on-Chip (SoC) using a proton beam. We compare the NVIDIA Xavier NX and Industrial devices, that respectively target commercial and automotive applications. We evaluate the Single-Event Effect (SEE) rate of both modules and their sub-components, both the CPU and GPU, using different power modes, and we try for the first time to identify their exact sources using the on-line testing facilities included in their ARM based system. Our conclusion is that the most sensitive part of the CPU complex of the SoC is the tag array of the various cache structures, while no errors were observed in the GPU, probably because of its fast execution compared to the CPU part of the application during the radiation campaign.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126378767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Detecting Functional Safety Violations in Online AI Accelerators 在线AI加速器的功能安全违规检测
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-09-12 DOI: 10.1109/IOLTS56730.2022.9897702
Shamik Kundu, K. Basu
{"title":"Detecting Functional Safety Violations in Online AI Accelerators","authors":"Shamik Kundu, K. Basu","doi":"10.1109/IOLTS56730.2022.9897702","DOIUrl":"https://doi.org/10.1109/IOLTS56730.2022.9897702","url":null,"abstract":"With the ubiquitous deployment of Deep Neural Networks (DNNs) in low latency mission critical applications, there has been an extensive proliferation of custom-built AI inference accelerators at the edge. Drastic technology scaling in recent years has made these circuits highly vulnerable to faults due to various reasons like aging, latent defects, single event upsets, etc. Such faults are highly detrimental to the classification accuracy of the AI accelerator, leading to the critical Functional Safety (FuSa) violation, when used in mission-critical applications. In order to detect such violations in mission mode, we analyze the efficiency of a software-based self test scheme that employs functional test patterns, akin to instances in the application dataset. Such patterns are either selected from the dataset of the DNN, or generated from scratch utilizing the concept of Generative Adversarial Networks (GANs). When evaluated on state-of-the-art DNNs on multivariate exhaustive datasets, the GAN generated test patterns significantly improve FuSa violation detection coverage by up to 130.28%, compared to the selected test patterns, thereby accomplishing efficient testing of the AI accelerator, online, in mission mode.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127799776","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function 新的基于BTI鲁棒环振子的物理不可克隆函数
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-09-12 DOI: 10.1109/IOLTS56730.2022.9897808
M. Grossi, M. Omaña, Daniele Rossi, Biagio Marzulli, C. Metra
{"title":"Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function","authors":"M. Grossi, M. Omaña, Daniele Rossi, Biagio Marzulli, C. Metra","doi":"10.1109/IOLTS56730.2022.9897808","DOIUrl":"https://doi.org/10.1109/IOLTS56730.2022.9897808","url":null,"abstract":"Physically Unclonable Functions (PUFs) have become a promising low-cost solution for authentication and key generation in cryptosystems. However, it has been shown in the literature that the reliability of PUFs is undermined by aging mechanisms, such as Bias Temperature Instability (BTI), which may compromise their correct operation. In this paper, we present a novel ring oscillator (RO) based PUF design that is robust against BTI degradation, hereinafter referred to as Low-sensitive-BTI RO - LBTIRO. We compare our proposed LBTIRO to the standard RO-based PUF and to an alternative NBTI-robust RO-PUF recently presented in the literature, for 90 nm and 32 nm CMOS technology nodes. We show that, for considered technology nodes, our proposed LBTIRO features a higher robustness against BTI. Particularly, our LBTIRO enables a reduction of the impact of BTI on the oscillation frequency over circuit lifetime, which reaches 85.3% and 72.1% against the standard RO and the recent alternate solution, respectively, for the 90 nm technology. Moreover, we show that our proposed LBTIRO features a reduction in terms of power consumption if compared to the alternative NBTIrobust RO-PUF.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"41 9","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120926115","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process 在130 nm批量工艺中,α-SER降低1/100,最大限度地减少面积,功耗和延迟开销
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-09-12 DOI: 10.1109/IOLTS56730.2022.9897814
Ryuichi Nakajima, Kazuya Ioki, J. Furuta, Kazutoshi Kobayashi
{"title":"Radiation Hardened Flip-Flops Minimizing Area, Power, and Delay Overheads with 1/100 Lower α-SER in a 130 nm Bulk Process","authors":"Ryuichi Nakajima, Kazuya Ioki, J. Furuta, Kazutoshi Kobayashi","doi":"10.1109/IOLTS56730.2022.9897814","DOIUrl":"https://doi.org/10.1109/IOLTS56730.2022.9897814","url":null,"abstract":"We examined the radiation hardness of the several types of flip-flops fabricated in a 130 nm bulk process by alpha-ray irradiation tests and circuit simulation. The simulated $alpha -$SER of FFs with the critical charge larger than 14 fC becomes 1/100 of that with the critical charge of 10 fC. We propose a radiation-hardened flip-flop minimizing area, delay, and power overheads with 1/100 lower $alpha -$SER in a 130 nm bulk process. The radiation hardness is achieved by adding series transistors and wires with only less than 14% area, 7% delay, and 12% power overheads in order to increase the critical charge. Alpha-ray irradiation tests revealed that the proposed method can reduce soft error rates to 1/100.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121072399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Experimental evaluation of neutron-induced errors on a multicore RISC-V platform 多核RISC-V平台上中子诱导误差的实验评估
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-06-17 DOI: 10.1109/IOLTS56730.2022.9897448
F. Santos, A. Kritikakou, O. Sentieys
{"title":"Experimental evaluation of neutron-induced errors on a multicore RISC-V platform","authors":"F. Santos, A. Kritikakou, O. Sentieys","doi":"10.1109/IOLTS56730.2022.9897448","DOIUrl":"https://doi.org/10.1109/IOLTS56730.2022.9897448","url":null,"abstract":"RISC-V architectures have gained importance in the last years due to their flexibility and open-source Instruction Set Architecture (ISA), allowing developers to efficiently adopt RISC-V processors in several domains with a reduced cost. For application domains, such as safety-critical and mission-critical, the execution must be reliable as a fault can compromise the system’s ability to operate correctly. However, the application’s error rate on RISC-V processors is not significantly evaluated, as it has been done for standard x86 processors. In this work, we investigate the error rate of a commercial RISC-V ASIC platform, the GAP8, exposed to a neutron beam. We show that for computing-intensive applications, such as classification Convolutional Neural Networks (CNN), the error rate can be $3.2 times$ higher than the average error rate. Additionally, we find that the majority (96.12%) of the errors on the CNN do not generate misclassifications. Finally, we also evaluate the events that cause application interruption on GAP8 and show that the major source of incorrect interruptions is application hangs (i.g., due to an infinite loop or a racing condition)","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126467585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
LIN-MM: Multiplexed Message Authentication Code for Local Interconnect Network message authentication in road vehicles LIN-MM:道路车辆本地互联网络消息认证的多路复用消息认证代码
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-06-06 DOI: 10.1109/IOLTS56730.2022.9897819
F. Oberti, Ernesto Sánchez, A. Savino, Filippo Parisi, Mirco Brero, S. Carlo
{"title":"LIN-MM: Multiplexed Message Authentication Code for Local Interconnect Network message authentication in road vehicles","authors":"F. Oberti, Ernesto Sánchez, A. Savino, Filippo Parisi, Mirco Brero, S. Carlo","doi":"10.1109/IOLTS56730.2022.9897819","DOIUrl":"https://doi.org/10.1109/IOLTS56730.2022.9897819","url":null,"abstract":"The automotive market is profitable for cyberattacks with the constant shift toward interconnected vehicles. Electronic Control Units (ECUs) installed on cars often operate in a critical and hostile environment. Hence, both carmakers and governments have supported initiatives to mitigate risks and threats belonging to the automotive domain. The Local Interconnect Network (LIN) is one of the most used communication protocols in the automotive field. Today’s LIN buses have just a few light security mechanisms to assure integrity through Message Authentication Codes (MAC). However, several limitations with strong constraints make applying those techniques to LIN networks challenging, leaving several vehicles still unprotected. This paper presents LIN Multiplexed MAC (LIN-MM), a new approach for exploiting signal modulation to multiplex MAC data with standard LIN communication. LIN-MM allows for transmitting MAC payloads, maintaining full-back compatibility with all versions of the standard LIN protocol.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"127 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125046639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Transient-Fault-Aware Design and Training to Enhance DNNs Reliability with Zero-Overhead 零开销下瞬态故障感知设计与训练提高深度神经网络可靠性
2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2022-05-28 DOI: 10.1109/IOLTS56730.2022.9897813
Niccolo Cavagnero, F. Santos, Marco Ciccone, Giuseppe Averta, T. Tommasi, P. Rech
{"title":"Transient-Fault-Aware Design and Training to Enhance DNNs Reliability with Zero-Overhead","authors":"Niccolo Cavagnero, F. Santos, Marco Ciccone, Giuseppe Averta, T. Tommasi, P. Rech","doi":"10.1109/IOLTS56730.2022.9897813","DOIUrl":"https://doi.org/10.1109/IOLTS56730.2022.9897813","url":null,"abstract":"Deep Neural Networks (DNNs) enable a wide series of technological advancements, ranging from clinical imaging, to predictive industrial maintenance and autonomous driving. However, recent findings indicate that transient hardware faults may corrupt the models prediction dramatically. For instance, the radiation-induced misprediction probability can be so high to impede a safe deployment of DNNs models at scale, urging the need for efficient and effective hardening solutions. In this work, we propose to tackle the reliability issue both at training and model design time. First, we show that vanilla models are highly affected by transient faults, that can induce a performances drop up to 37%. Hence, we provide three zero-overhead solutions, based on DNN re-design and re-train, that can improve DNNs reliability to transient faults up to one order of magnitude. We complement our work with extensive ablation studies to quantify the gain in performances of each hardening component.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"7 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129841216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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