{"title":"Mass Flowmeter for Screw Conveyors Based on Capacitive Sensing","authors":"A. Fuchs, H. Zangl, G. Brasseur","doi":"10.1109/IMTC.2007.379169","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379169","url":null,"abstract":"This paper presents a measurement principle for the reliable determination of the mass flow of material through screw conveyors. The device is based on capacitive sensing with the characteristic that parts of the pipe content can be analyzed in a spatially resolving manner. Finite element analysis is used to investigate the sensor head and to estimate the performance of the sensor.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125353813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Compensation of Coil Radial Offset in Single-Coil Measurement of Metal Tube Properties","authors":"D. Vasić, V. Bilas, D. Ambruš","doi":"10.1109/IMTC.2007.379458","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379458","url":null,"abstract":"Measurements of inner radius and electromagnetic properties (magnetic permeability and electrical conductivity) of metal, ferromagnetic tubes, such as oil-well casings, are essential in the assessment of their condition or as inputs for other measurement applications, e.g. reservoir electromagnetic evaluation through casing. In our previous work, we have shown that the inner radius and the permeability-to-conductivity ratio of the tube can be obtained by measurement of the impedance of a single coil axially centered within the tube. In this paper, we propose and experimentally verify the coil impedance model that is applicable for measurement of the tube properties when the tube and the coil axes are misaligned. Correction of the measured impedance for coil radial offset improves measurement accuracy and reduces the effect of the coil wobble.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126757052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Concurrent monitoring of PCI bus transactions for timely detection of errors initiated by FPGA-based applications","authors":"N. Bartzoudis, K. Mcdonald-Maier","doi":"10.1109/IMTC.2007.378985","DOIUrl":"https://doi.org/10.1109/IMTC.2007.378985","url":null,"abstract":"The integration of FPGAs as co-processing engines in various dependable workstations makes the real time detection of errors an important issue. Thus, concurrent error detection components should enforce the operation of such systems, in order to prevent the propagation of errors within the system. The functionality of such monitoring modules should not interfere with the performance of the workstation and must ensure high system availability. An embedded monitoring component with concurrent error detection features was implemented to illustrate the benefits of this approach. The monitor checks for PCI protocol and application errors based on the forensic analysis of a workstation with embedded FPGA-based co-processing support.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"137 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115990278","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Markovic, B. Jokanović, M. Marjanović, M. Djordjević
{"title":"Improved Method for Measurement of the Dielectric Properties of Microwave Substrates Using Microstrip T-resonator","authors":"D. Markovic, B. Jokanović, M. Marjanović, M. Djordjević","doi":"10.1109/IMTC.2007.379138","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379138","url":null,"abstract":"The paper presents an improved method for broadband characterization of dielectric materials at microwave frequencies. The results are calculated using closed form expressions and by HFSS. The proposed method provides more precise calculation of conductor losses by taking into account surface roughness. Compared with previously proposed methods, the new approach models loss tangent with more accuracy (both using closed-form expressions and EM simulator).","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116103522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. Cacciatore, S. Corbellini, M. Parvis, A. Vallan
{"title":"Conducted disturbance measurement system based on a GRID architecture","authors":"V. Cacciatore, S. Corbellini, M. Parvis, A. Vallan","doi":"10.1109/IMTC.2007.379154","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379154","url":null,"abstract":"Thanks to the recent GRID technologies growth, in more research and industrial environments it is possible to obtain a number of benefits about the resources availability that could be shared in a fully trusted net architecture. GRID frameworks allow users to discover, monitor and control distributed resources on the net and to develop dedicated services for cooperative elaboration as well. This paper describes the design and realization of a GRID-based measurement system for assessing the electromagnetic conducted disturbances. In such a context, the GRID allows the access to remote acquisition nodes and implements an algorithm studied for pre-compliance analysis that takes advantage of the overall GRID. This kind of structure is useful in laboratories where a cluster for intensive data elaboration is not available.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116124312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Decentralized Information Filter for the State Estimation in Electrical Power Systems","authors":"G. D'Antona, A. Monti, F. Ponci","doi":"10.1109/IMTC.2007.379111","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379111","url":null,"abstract":"This paper shows the performance of a state estimator based on a decentralized information filter applied to an electric power system for avionic and naval applications. The main characteristics of this type of approach are firstly the increased computational efficiency, due to the parallel distribution of the computational burden among the local estimators, secondly an increased reliability of the estimator do to the distribution of the resources and thirdly the scalability of the estimation system.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122352714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Composite local-linear state-space models for the behavioral modeling of digital devices","authors":"I. Stievano, C. Siviero, F. Canavero, I. Maio","doi":"10.1109/IMTC.2007.379016","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379016","url":null,"abstract":"This paper discusses the generation of accurate and efficient behavioral models of digital ICs for the assessment of signal integrity effects in high-performance electronics systems. The proposed approach is based on the estimation of composite local-linear state-space models either from simulated or measured device port responses. These representations help to overcome some limitations of traditional parametric relations used so far and the obtained models are readily implemented in any simulation tool as SPICE subcircuits or VHDL-AMS hardware descriptions. The application of the advocated approach to the modeling of a real device exhibiting a strong nonlinear behavior and high order dynamical effects concludes the contribution.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122363627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Calibration, Measurement and Error Analysis of Optical Temperature Measurement via Laser Induced Fluorescence","authors":"M. Harker, P. O’Leary, M. S. Kharicha, S. Eck","doi":"10.1109/IMTC.2007.379008","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379008","url":null,"abstract":"This paper describes a measurement device for optical temperature measurement. The temperature measurement is based on light induced fluorescence, and hence the device is partly physical and partly theoretical in nature. Rather that estimating a single calibration curve for the measurement, as is the norm with optical measurement, we perform the calibration pixel-wise, which accounts for systematic non-uniformity over the images and measurement cell. With this approach, the measurement is less susceptible to gross outliers. A measurement device can hardly be called such, if the measurement is not accompanied by a measure of its accuracy. We therefore undertake the error propagation throughout the theoretical portion of the measurement device, which leads to a measure of the accuracy of the optical temperature measurement. The analysis not only gives insight into the measurement process, but facilitates the amelioration of the experimental apparatus.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122447598","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automatic System to Measure Complex Permittivity and Permeability using Cavity Perturbation Techniques","authors":"Yan Ye, A. Sklyuyev, C. Akyel, P. Ciureanu","doi":"10.1109/IMTC.2007.379006","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379006","url":null,"abstract":"A cavity perturbation technique suitable for measuring dielectric parameters of various dielectric materials and magnetic parameters of amorphous magnetic wires is discussed. From the shift in the resonant frequency and the Q-value, the complex permeability of the material can be calculated. Three different methods to determine the resonant frequency and the quality factor from complex transmission coefficient are used and compared to find which is most accurate and precise when tested using identical materials.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123014254","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Palani, V. Jayashankar, V. JagadeeshKumar, P. Sankaran, H. Maier
{"title":"Instrumentation for Onsite Measurements on Power Transformers","authors":"A. Palani, V. Jayashankar, V. JagadeeshKumar, P. Sankaran, H. Maier","doi":"10.1109/IMTC.2007.379355","DOIUrl":"https://doi.org/10.1109/IMTC.2007.379355","url":null,"abstract":"Precision measurement of the dielectric integrity and winding dislocation of a power transformer at site is difficult due to the limited accuracy and bandwidth of equipment available onsite. We propose electronic compensation techniques to enhance the accuracy and bandwidth of the bushing current transformers (CTs) and capacitive bushings/voltage transformer (VT) available at site so as to enable precision onsite measurement. A virtual instrument designed, assesses the dielectric integrity as well as winding dislocation by acquiring and processing test data from the electronically compensated CT and VT.","PeriodicalId":274130,"journal":{"name":"2007 IEEE Instrumentation & Measurement Technology Conference IMTC 2007","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114267710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}