Improved Method for Measurement of the Dielectric Properties of Microwave Substrates Using Microstrip T-resonator

Abstract

The paper presents an improved method for broadband characterization of dielectric materials at microwave frequencies. The results are calculated using closed form expressions and by HFSS. The proposed method provides more precise calculation of conductor losses by taking into account surface roughness. Compared with previously proposed methods, the new approach models loss tangent with more accuracy (both using closed-form expressions and EM simulator).