Yuli Lai, P. Kallio, Hao Zhang, Hui Xie, Yasuhito Sugano, J. Bobacka
{"title":"Study of adhesion force between cellulose micro-sphere and cellulose membrane","authors":"Yuli Lai, P. Kallio, Hao Zhang, Hui Xie, Yasuhito Sugano, J. Bobacka","doi":"10.1109/3M-NANO.2016.7824941","DOIUrl":"https://doi.org/10.1109/3M-NANO.2016.7824941","url":null,"abstract":"Development of novel high added value cellulose products requires improved understanding of interaction forces, which includes also the adhesion force, between cellulose surfaces. However, the interaction forces between cellulose surfaces have not been adequately studied. In this paper, cellulose-cellulose adhesion force is studied by using a customized dual-probe atomic force microscope (AFM) with a cellulose colloidal probe. Two different types of cellulose membranes (CM) with cellulose concentration of 1.5% and 2% are used as test samples, and about ten thousand tests are repeated on each CM sample type. Adhesion force histograms are provided and they show a large difference between the two types of CM. The average adhesion force on CM 1.5% is approximately 10 times higher than that on CM 2%. On CM 1.5%, the adhesion forces concentrate on the range from 450nN to 650nN, whereas on CM 2% the force distribute from 50 to 75nN. The difference in the adhesion force on these two types of CM can be attributed to their difference in surface roughness and surface energy.","PeriodicalId":273846,"journal":{"name":"2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133370567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Irzhak, N. Tabachkova, D. A. Dikan, N. Sitnikov, A. Shelyakov, V. Koledov, P. Lega, V. Shavrov, A. Mashirov, S. von Gratowski, A. Zhikharev, V. Y. Pokrovsky, S. Y. Zibtsev, D. Zakharov, P. Mazaev, M. Berezin, N. Kasyanov, G. Martynov, A. Orlov
{"title":"The shape memory effect in nanoscale composites based on Ti2NiCU alloy","authors":"A. Irzhak, N. Tabachkova, D. A. Dikan, N. Sitnikov, A. Shelyakov, V. Koledov, P. Lega, V. Shavrov, A. Mashirov, S. von Gratowski, A. Zhikharev, V. Y. Pokrovsky, S. Y. Zibtsev, D. Zakharov, P. Mazaev, M. Berezin, N. Kasyanov, G. Martynov, A. Orlov","doi":"10.1109/3M-NANO.2016.7824971","DOIUrl":"https://doi.org/10.1109/3M-NANO.2016.7824971","url":null,"abstract":"The shape memory effect (SME) in alloys with thermoelastic martensitic transformation provides a unique possibility to create the tiny mechanical devices for NEMS / MEMS technology. SME observed in layered composite microstructors produced by FIB CVD technology, consisting of Ti2NiCu alloy layer with SME and platinum elastic layer at reducing the thickness of the active layer for at least 80 nm. In this paper the physical and technological restrictions were experimentally examined on the minimum thickness of the active layer of the composites for SME manifestation.","PeriodicalId":273846,"journal":{"name":"2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"153 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121254566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Mechanism and application of capillary-force self-assembly micro/nanofabrication","authors":"Shuhua Wei, Minglong Qin, Jing Zhang","doi":"10.1109/3M-NANO.2016.7824940","DOIUrl":"https://doi.org/10.1109/3M-NANO.2016.7824940","url":null,"abstract":"Self-assembly has attracted increasing attention as an effective strategy for fabrication of functional micro/nanostructures in recent years. Capillary-force as a significant driving force of self-assembly has become a versatile and scalable approach to build complex geometries at the micro/nanoscales. In order to take full advantage of capillary-force to fabricate specific micro/nanoscales devices, we have done a thorough research on the mechanism of capillary-force self-assembly and analyzed the impact factors of micro/nanostructures suffered during the self-assembly process. In the aspect of application, we classified the main assembly methods, micro/nanostructures which can be got and their potential applications. Finally, we indicated that capillary-force self-assembly would have broad utilization in micro/nanofabrication due to its tunability and simplicity. Meanwhile, we put forward some issues that need to be solved in the further research.","PeriodicalId":273846,"journal":{"name":"2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124064078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The study on error compensation of the probe system for nano coordinate measuring machine","authors":"Cuicui Du, Xugang Feng, Xinguang Li, Jiayan Zhang","doi":"10.1109/3M-NANO.2016.7824958","DOIUrl":"https://doi.org/10.1109/3M-NANO.2016.7824958","url":null,"abstract":"The probe is called the “heart” of Nano Coordinate Measuring Machine (Nano-CMM). In order to compensate the error of the probe for Nano-CMM, this paper studies the error of the probe, which is the largest source of the measurement deviation. Based on the probe system of Nano-CMM, this paper analyzes the source of the dynamic error system and the influencing factors, studies the compensation for the diameter of the probe. What's more, the paper proposes the method, which is composed of dynamic calibration of probe radius and microplane compensation method. For the sake of the effectiveness of the method, the present paper measures the outline of a concave wheel, which is measured and compared the outline of a concave wheel before and after in reverse engineering software. The results show that the method has a certain better compensation for the probe radius, but, there is existing the small discrepancies at certain points. It proves to be the method can enhance the accuracy of Nano-CMM and have a value for application.","PeriodicalId":273846,"journal":{"name":"2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133126110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}