18th International Reliability Physics Symposium最新文献

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Alpha-Particle-Induced Soft Errors and 64K Dynamic RAM Design Interaction α粒子诱导软误差与64K动态RAM设计交互

18th International Reliability Physics Symposium Pub Date : 1980-04-01 DOI: 10.1109/IRPS.1980.362951

R. McPartland, J. T. Nelson, W. R. Huber

引用次数: 10

Experimental Studies of ZnS Alpha Particle Counters and Methods for Minimizing Detector Background ZnS α粒子计数器的实验研究及最小化探测器背景的方法

18th International Reliability Physics Symposium Pub Date : 1980-04-01 DOI: 10.1109/IRPS.1980.362953

B. Masters

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引用次数: 1

SEM Techniques for the Analysis of Memory Circuits 存储电路分析的扫描电镜技术

18th International Reliability Physics Symposium Pub Date : 1980-04-01 DOI: 10.1109/IRPS.1980.362914

J. R. Beall, D. Wilson, W. Echols, LT. M. J. Walter

引用次数: 1

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