2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)最新文献_第10页

Food Recognition and Calorie Measurement using Image Processing and Convolutional Neural Network 基于图像处理和卷积神经网络的食物识别和卡路里测量

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016694

V. H. Reddy, Soumya Kumari, V. Muralidharan, Karan Gigoo, B. Thakare

{"title":"Food Recognition and Calorie Measurement using Image Processing and Convolutional Neural Network","authors":"V. H. Reddy, Soumya Kumari, V. Muralidharan, Karan Gigoo, B. Thakare","doi":"10.1109/RTEICT46194.2019.9016694","DOIUrl":"https://doi.org/10.1109/RTEICT46194.2019.9016694","url":null,"abstract":"The ease with which food is being delivered at our doorsteps has lead to an outbreak of a major chronic disease known as obesity. As the necessity of the food arose among people, the apprehension related to their diet also simultaneously increased. In this paper we propose a calorie measurement system whereby the user is made to upload the image of food item and as a result, number of calories present in the uploaded food image will be predicted. It is a multi-task system which also displays the weekly statistics on how much calorie is consumed by the user and how more/less calories must be consumed to avoid obesity related diseases such as heart attack, cancer etc. We built a dataset of food images collected from existing datasets to detect complex images consisting of 20 classes and each class containing 500 images each. We have curated our own Convolutional Neural Network architecture of 6 layers to extract the features and classify the images. Our experimental results on food recognition showed 78.7% testing accuracy with 93.29% training accuracy.","PeriodicalId":269385,"journal":{"name":"2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126302581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Design and Analysis of Gate Underlapped/Overlapped Surround Gate Nanowire TFET for Analog Performance 栅极重叠/重叠环绕栅极纳米线TFET模拟性能的设计与分析

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016837

Shamshad Alam, A. Raman, B. Raj, Naveen Kumar

引用次数: 0

Reliability Evaluation of Modified Gamma Network with Reduced number of Stages 减阶改进伽玛网络的可靠性评估

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016724

S. Gupta, G. L. Pahuja

{"title":"Reliability Evaluation of Modified Gamma Network with Reduced number of Stages","authors":"S. Gupta, G. L. Pahuja","doi":"10.1109/RTEICT46194.2019.9016724","DOIUrl":"https://doi.org/10.1109/RTEICT46194.2019.9016724","url":null,"abstract":"Reliability of multiprocessing systems greatly depends upon performance of Interconnection Network (IN) employed in it. Multistage Interconnection Networks (MIN) provide cost effective communication between multiple processors and memory modules, connected in parallel. Hence to improve the performance of multiprocessing systems, reliability and fault tolerance enhancement of MIN is of paramount importance. Some of the major papers on gamma networks have been reviewed in this paper. It has been found that these networks still lack in achieving fault tolerance at input and output node, cost is high, regularity of the network has been compromised etc. In this paper a new framework of Gamma Network has been proposed, which is considerably more reliable and fault tolerant. This has been named as Modified Gamma Network (MGN). MGN demonstrates improved reliability as compared to existing MGN topologies. It has been shown that the proposed topology possesses less number of stages as compared to GIN. Additionally, it possesses more number of parallel paths with at least two totally disjoint paths between each Source Destination (S-D) node pair, hence increased reliability and fault tolerance has been achieved as compared to GIN and its variants. The proposed MGN possesses less cost with minimum latency for a packet to be transmitted from a source to required destination as it has to pass through minimum number of nodes. In this paper ST-Reliability (Source-Terminal Reliability) of proposed network has been evaluated and the results achieved are compared with most of the existing Gamma Networks in literature. MGN demonstrates 23 % improved reliability and reduction in cost with fault tolerance feature.","PeriodicalId":269385,"journal":{"name":"2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126817689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

An Analysis of Health System Log Files using ELK Stack 利用ELK堆栈分析卫生系统日志文件

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016706

D. Uday, G. Mamatha

{"title":"An Analysis of Health System Log Files using ELK Stack","authors":"D. Uday, G. Mamatha","doi":"10.1109/RTEICT46194.2019.9016706","DOIUrl":"https://doi.org/10.1109/RTEICT46194.2019.9016706","url":null,"abstract":"With the growth of machine data, logging is progressively critical. Logging helps in investigating and diagnosing the issues for the execution of ideal applications. The logs are not only used for discovering issues but also for searching the required data. The ELK stack abbreviated as Elasticsearch, Logstash, and Kibana is mainly centered around the logs. As the majority of logs are centered at one spot so that it can be able to see the procedure stream and query the questions against logs from all kind of applications from one spot. ELK underpins many log the executives and examination use cases that can get experiences from information. This finds what the information is defining all about and what needs to be done for the accomplishment of the business needs. In the current scenario the identification of the defect in the health system and system location is much difficult, So we propose a method to investigation on the log details of the health systems can give the assistance on identifying the defect on the existing safe guards using ELK stack, which in turn gives the assurance to the frameworks, by this it can have a learning from the data that was separated from the information so it can be able to assist us with keeping track of the defects in the system and the health of the system needs to be prioritized. The Log data is filtered based on system priority and country, because to identify the system state and location of the system, and this is visualized on the Kibana dashboard. This helps service engineers to identify the defect and location of system with short period of time.","PeriodicalId":269385,"journal":{"name":"2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130660181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

Venation Based Plant Leaves Classification Using GoogLeNet and VGG 基于GoogLeNet和VGG的植物叶片脉络分类

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016966

P. Jasitha, M. Dileep, M. Divya

引用次数: 8

Performance Improvement of QPSK MODEM in AWGN Channel Implemented in FPGA AWGN信道中QPSK调制解调器性能改进的FPGA实现

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016869

Umesharaddy Radder, B. Sujatha

引用次数: 0

A brief overview of Test Solution Development for Semiconductor Testing 半导体测试解决方案开发的简要概述

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016857

N. Rai, Namita Palecha, Mahesh Nagarai

{"title":"A brief overview of Test Solution Development for Semiconductor Testing","authors":"N. Rai, Namita Palecha, Mahesh Nagarai","doi":"10.1109/RTEICT46194.2019.9016857","DOIUrl":"https://doi.org/10.1109/RTEICT46194.2019.9016857","url":null,"abstract":"Semiconductor industries perform testing to ensure good performance of the device under different operating conditions. The time consumed in testing the device by traditional testing methods using multimeter is considerably high and the results are subject to manual errors. Thus, an automatic test equipment (ATE), which is a compact complex circuitry involving current/voltage forcing and measuring units, is used to reduce the test time and obtain accurate results. The paper presents a test solution development for a cable controller generation 3 (CCG3) wafer which is a type-C universal serial bus (USB). The first step is development of the test requirements document (TRD). Next, a TRD parser is developed which is a java-based tool that automatically generates the test program by using the TRD as an input. Finally, the generated test program is validated on an Advantest V93000 tester based on the Smartest8 (SMT8) platform. The TRD parser automatically generates the complete test program in 3.168s and 100% test coverage is achieved on the V93000 tester for the continuity tests. The paper thus covers the entire flow of testing a device under test (DUT) using an ATE at wafer level.","PeriodicalId":269385,"journal":{"name":"2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130976415","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

[Copyright notice] (版权)

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/rteict46194.2019.9016773

引用次数: 0

Fuzzy Logic Management of Hybrid Energy Storage System 混合储能系统的模糊逻辑管理

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016951

R. Divva, V. Prasad

引用次数: 3

Bond Graph Modelling and Simulation of LC Resonant Circuit for Quasiresonant DC-DC Power Converters 准谐振DC-DC功率变换器LC谐振电路的键合图建模与仿真

2019 4th International Conference on Recent Trends on Electronics, Information, Communication & Technology (RTEICT) Pub Date : 2019-05-01 DOI: 10.1109/RTEICT46194.2019.9016937

S. Vali, V. Ganesh

引用次数: 0