{"title":"Quantitative solder inspection with computed tomography","authors":"Ray Huang, Adam Sorini, J. Mcnulty","doi":"10.1109/ISPCE.2014.6842006","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6842006","url":null,"abstract":"In this paper we present a quantitative, three-dimensional method to analyze solder characteristics and defect voids using X-ray Computed Tomography (CT). We also present a range of case studies where this methodology has enabled a more precise and time-efficient quality assurance process for printed circuit board suppliers, manufacturers and designers. This methodology also allows a comprehensive, non-destructive inspection and reconstruction of field return or failed samples involving printed circuit boards, hand-soldered assemblies or components, home appliances, and electrical systems.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127610237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An implementation of toy safety assessment model","authors":"S. Mak, H. Lau","doi":"10.1109/ISPCE.2014.6841994","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6841994","url":null,"abstract":"Many toys manufacturers developed the new products in order to survive in the serious market competition. They relied on the current toys product safety assessment model. In the current toy product safety testing, the third party testing laboratories just followed the mandatory safety regulations and standards to test the products. Some newly developed feature or function of the products were not properly evaluated. It is often found that the products met all mandatory regulations and standards, it still causes the serious accident. In this paper, we discuss the current assessment model by analyzing two accident cases and evaluate the effectiveness of implementing the enhanced toys safety assessment model.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129641688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Lightning surge damage to Ethernet and POTS ports connected to inside wiring","authors":"J. Randolph","doi":"10.1109/ISPCE.2014.6842005","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6842005","url":null,"abstract":"In recent years, many suppliers of telecom equipment have reported higher than expected rates of lightning damage to Ethernet and POTS ports connected to cables located entirely within the same building. There are three known mechanisms by which lightning surges can be coupled onto inside wiring, but these mechanisms are statistically infrequent. Given the reported rates of surge damage, these known mechanisms do not provide a simple explanation. It appears that additional surge coupling mechanisms may be involved. The three known mechanisms are described, and it is shown that surge damage from these mechanisms should be infrequent. Three new theories for additional coupling mechanisms are then described. All three of these new theories are based on the notion that surges appearing on the AC mains outlets in the building are being coupled onto inside wiring communication cables. The analysis suggests that the first of these additional coupling mechanisms seems an unlikely cause for the apparent increase in surge failures. The second mechanism appears more plausible, particularly because it correlates to the recent industry trend of implementing wall mount Class II AC mains power supplies as switching converters rather than traditional linear supplies. However, the theory behind this second mechanism only applies to surge failures of Ethernet ports. A third potential mechanism is based on unintended side effects of consumer grade multi-port surge protectors used in installations with poor grounding. This mechanism applies to both Ethernet and POTS failures. Further study will be necessary to determine whether any of the three additional mechanisms are in fact the cause of the apparent increase in field failures. In the meantime, some guidelines are presented for manufacturers who wish to implement enhanced surge protection on Ethernet and POTS ports that connect to inside wiring.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127479647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"What does your touch current look like? Making proper touch current measurements","authors":"P. E. Perkins","doi":"10.1109/ISPCE.2014.6841996","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6841996","url":null,"abstract":"This paper responds to continued questions regarding the measurement of non-sinusoidal touch current with `spikes' as introduced by Switched Mode Power Supplies and their performance modifiers - PFC correction circuits and Energy Efficiency control circuits. The history is given to provide the proper background, The IEC electric shock level requirements are reviewed especially pointing out the factor of safety designed into these requirements. The allowance for high-frequency components is discussed as included in the IEC 60990 touch current measurement circuits. Examples are shown for AC, DC and mixed AC/DC waveforms with emphasis on the peak values and their proper measurement.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133764347","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Are amps and volts created equal?","authors":"G. Tornquist","doi":"10.1109/ISPCE.2014.6842004","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6842004","url":null,"abstract":"This paper briefly reviews the way current IT and consumer electronics safety standards treat the risk of electrically caused fire is purely proportional to power. That implies it is symmetrical in regards to available voltage and current. It then proposes a simple general model to divide electrical failure modes that may be fire risks into two distinct types series and parallel resistive faults. It considers the relative merits of real inductors and capacitors as energy storage devices. Then it looks at some real world high voltage and high current electrical sources and failure modes, and finally argues based on the previous points that the available voltage is a greater risk factor than the available current.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128106118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Injury from thermal energy","authors":"R. Nute","doi":"10.1109/ISPCE.2014.6841997","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6841997","url":null,"abstract":"Thermal energy transfer is responsible for many different types of injuries, most of which are called burns. Common to all of these injuries is the basic injury model: all injuries require a hazardous energy source, a means of transferring the energy to the body, and susceptibility of the body to the amount of energy transferred to it. This paper develops and discusses a basic model of how certain types of injuries occur from thermal energy. Each of the three parts of the injury model is defined so that this material can be applied to a wide range of thermal injury situations.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133052186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Rechargeable battery condition monitoring using vibrational properties","authors":"J. Backman, Antti Jarvinen","doi":"10.1109/ISPCE.2014.6842000","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6842000","url":null,"abstract":"A method is proposed for monitoring sealed battery condition, especially gas formation between electrode layers by detecting the vibrational characteristics on audio frequency range or low ultrasonic frequency range, measured using an actuator and one or more vibration sensors. The method can use driving point response, transmission response, or both to determine the battery status. Experimental results are presented to verify the method.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114527055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Breaking through the BRICs, Part 2","authors":"M. Maynard, L. Bai","doi":"10.1109/ISPCE.2014.6841992","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6841992","url":null,"abstract":"The emergent markets in Brazil, Russia, India and China, popularly referred to by the acronym BRIC, now are responsible for a growing portion of profits for global companies. Working against this prize is a formidable maze of culture, laws, and overlapping regulations, causing confusion surrounding the regulatory requirements. For those entering the BRIC marketplace with electrical and electronic products, knowledge of how to obtain the necessary approvals is needed. Preparation is paramount to face the distinct and unique obstacles that will be encountered. Distance, language, unfamiliar local business norms, and unsophisticated commercial market conditions can sometime make this a difficult and expensive procedure for the uninformed. In Part 2 of this paper, covering India and China, we will reveal the major regulatory compliance components in the mix for these two countries: the government agencies, the standards, the confounding bureaucracies, and some of the key unwritten rules in these emerging markets, and help product developers and manufacturers to access this massive group of desirable customers, navigating clear pathways to marketing and selling their electronic products.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130176296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Applying toy tests to consumer products","authors":"T. Eckert","doi":"10.1109/ISPCE.2014.6841993","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6841993","url":null,"abstract":"Many electronic products commonly found in the household are not considered children's products and are not regulated as such. However, these products may still be accessible to children, and in some cases, they may have designs that make them appealing to young children. Toddlers and young children will pick up and play with devices ranging from remote controls to cell phones. Although regulations may not require testing such products to the standards applicable to toys, doing so can reduce the risk that misuse or abuse of the product by young children will result in injury.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"6 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131162423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Historical methods of testing EMI gaskets","authors":"G. Kunkel","doi":"10.1109/ISPCE.2014.6842002","DOIUrl":"https://doi.org/10.1109/ISPCE.2014.6842002","url":null,"abstract":"This paper presents the various test methods developed and employed to grade the effectiveness of EMI gaskets in sealing the seams of EMI shielded boxes and enclosures. The test methods presented and evaluated are: 1) Shielding Effectiveness Testing a. MIL-STD-285 b. MIL-STD-285 as re-defined by the EMC design engineering community c. SAE, ARP-1173 prepared by the EMC design engineering community d. MIL-G-83528 (superseded by ML-DTL-83528) 2) Transfer Impedance Test Methods - designed by the EMP design engineering community. The conclusion compares the shielding effectiveness test method presently being used with the transfer impedance test method. It also recommends revisions to the shielding effectiveness test method contained in MIL-DTL-83528 that will provide more accurate shielding levels and provide corrosion compatibility information of a gasket as tested against the various structural materials and finishes used by industry.","PeriodicalId":262617,"journal":{"name":"2014 IEEE Symposium on Product Compliance Engineering (ISPCE)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133895000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}