雷电浪涌损坏连接到内部线路的以太网和POTS端口

J. Randolph
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引用次数: 2

摘要

近年来,许多电信设备供应商报告说,完全位于同一建筑物内的以太网和POTS端口受到雷击的几率高于预期。有三种已知的机制可以将雷击浪涌耦合到内部线路上,但这些机制在统计上并不常见。鉴于报道的浪涌损害率,这些已知的机制并不能提供一个简单的解释。看来可能涉及额外的浪涌耦合机制。描述了三种已知的机制,并表明这些机制造成的浪涌损伤应该是罕见的。然后描述了附加耦合机制的三种新理论。这三种新理论都是基于这样一个概念,即大楼交流电源插座上出现的浪涌与内部布线的通信电缆耦合在一起。分析表明,这些附加耦合机制中的第一个似乎不太可能是浪涌故障明显增加的原因。第二种机制似乎更合理,特别是因为它与最近实现壁挂式II类交流电源作为开关转换器而不是传统线性电源的行业趋势相关。然而,第二种机制背后的理论只适用于以太网端口的浪涌故障。第三种潜在的机制是基于在接地不良的装置中使用的消费级多端口浪涌保护器的意外副作用。这种机制既适用于以太网故障,也适用于POTS故障。需要进行进一步的研究,以确定这三种附加机制中的任何一种是否实际上是导致现场故障明显增加的原因。同时,为希望在连接到内部线路的以太网和POTS端口上实施增强的浪涌保护的制造商提供了一些指导方针。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Lightning surge damage to Ethernet and POTS ports connected to inside wiring
In recent years, many suppliers of telecom equipment have reported higher than expected rates of lightning damage to Ethernet and POTS ports connected to cables located entirely within the same building. There are three known mechanisms by which lightning surges can be coupled onto inside wiring, but these mechanisms are statistically infrequent. Given the reported rates of surge damage, these known mechanisms do not provide a simple explanation. It appears that additional surge coupling mechanisms may be involved. The three known mechanisms are described, and it is shown that surge damage from these mechanisms should be infrequent. Three new theories for additional coupling mechanisms are then described. All three of these new theories are based on the notion that surges appearing on the AC mains outlets in the building are being coupled onto inside wiring communication cables. The analysis suggests that the first of these additional coupling mechanisms seems an unlikely cause for the apparent increase in surge failures. The second mechanism appears more plausible, particularly because it correlates to the recent industry trend of implementing wall mount Class II AC mains power supplies as switching converters rather than traditional linear supplies. However, the theory behind this second mechanism only applies to surge failures of Ethernet ports. A third potential mechanism is based on unintended side effects of consumer grade multi-port surge protectors used in installations with poor grounding. This mechanism applies to both Ethernet and POTS failures. Further study will be necessary to determine whether any of the three additional mechanisms are in fact the cause of the apparent increase in field failures. In the meantime, some guidelines are presented for manufacturers who wish to implement enhanced surge protection on Ethernet and POTS ports that connect to inside wiring.
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