发布求助
文献互助 智能选刊 最新文献

Records of the 1993 IEEE International Workshop on Memory Testing最新文献

筛选
英文 中文
Functional testing of RAMs by random testing simulation 随机测试仿真对ram进行功能测试
Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI: 10.1109/MT.1993.263151
M. Ashtijou, Fusheng Chen
{"title":"Functional testing of RAMs by random testing simulation","authors":"M. Ashtijou, Fusheng Chen","doi":"10.1109/MT.1993.263151","DOIUrl":"https://doi.org/10.1109/MT.1993.263151","url":null,"abstract":"An algorithm for random testing of functional faults in RAMs based on the modification of a random testing experiment algorithm is developed. To examine the effectiveness of the algorithm for the testing of stuck-at faults, inversion 2-coupling faults, and type 1 active neighborhood pattern sensitive faults on a reduced memory model, the authors present a simulation package.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"123 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115653723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Algorithms to test PSF and coupling faults in random access memories 随机存储器中PSF和耦合故障的测试算法
Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI: 10.1109/MT.1993.263150
R. Rajsuman
{"title":"Algorithms to test PSF and coupling faults in random access memories","authors":"R. Rajsuman","doi":"10.1109/MT.1993.263150","DOIUrl":"https://doi.org/10.1109/MT.1993.263150","url":null,"abstract":"With the growing complexity of semiconductor memories a good understanding of memory fault models becomes very important. In this paper, the author discusses the coupling and pattern sensitive fault (PSF) models in detail. Test algorithms to cover these faults are given. Pros and cons of different test algorithms are discussed and validity of fault models is examined.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"129 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132013756","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A 20 MHz test vector generator for producing tests that detect single 4- and 5-coupling faults in RAMs 20 MHz测试矢量发生器，用于检测ram中的单个4耦合和5耦合故障
Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI: 10.1109/MT.1993.263157
B. Cockburn
{"title":"A 20 MHz test vector generator for producing tests that detect single 4- and 5-coupling faults in RAMs","authors":"B. Cockburn","doi":"10.1109/MT.1993.263157","DOIUrl":"https://doi.org/10.1109/MT.1993.263157","url":null,"abstract":"The author describes a 20 MHz RAM test vector generator that generates both deterministic and probabilistic tests for detecting single 4-coupling or 5-coupling faults (as defined by Nair, Thatte, and Abraham). Such faults model pattern sensitivities involving 4 or 5 cells, respectively, when nothing is known about the mapping from logical cell addresses to physical cell locations. The generated tests are thus unaffected by cell re-arrangements resulting from multiple vendors, decoder address scrambling, and repair using redundant cells. Using a parallel test mode, all sub-arrays in a RAM can be tested together even if each sub-array has a different cell arrangement. The generator consists of one 60 K transistor semicustom IC and one 4 Mbit look-up PROM.<<ETX>>","PeriodicalId":248811,"journal":{"name":"Records of the 1993 IEEE International Workshop on Memory Testing","volume":"99 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1993-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132324927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
首页 上一页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信