随机存储器中PSF和耦合故障的测试算法

Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI:10.1109/MT.1993.263150

R. Rajsuman

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引用次数: 2

摘要

随着半导体存储器的日益复杂，对存储器故障模型的理解变得非常重要。本文详细讨论了耦合型和模式敏感型故障(PSF)模型。给出了覆盖这些故障的测试算法。讨论了不同测试算法的优缺点，并检验了故障模型的有效性

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Algorithms to test PSF and coupling faults in random access memories

With the growing complexity of semiconductor memories a good understanding of memory fault models becomes very important. In this paper, the author discusses the coupling and pattern sensitive fault (PSF) models in detail. Test algorithms to cover these faults are given. Pros and cons of different test algorithms are discussed and validity of fault models is examined.<>

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Records of the 1993 IEEE International Workshop on Memory Testing

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