随机测试仿真对ram进行功能测试

Records of the 1993 IEEE International Workshop on Memory Testing Pub Date : 1993-08-09 DOI:10.1109/MT.1993.263151

M. Ashtijou, Fusheng Chen

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引用次数: 1

摘要

在改进随机测试实验算法的基础上，提出了一种随机测试ram功能故障的算法。为了检验该算法在减少内存模型上测试卡滞故障、反演2-耦合故障和1型活动邻域模式敏感故障的有效性，作者提出了一个仿真包

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Functional testing of RAMs by random testing simulation

An algorithm for random testing of functional faults in RAMs based on the modification of a random testing experiment algorithm is developed. To examine the effectiveness of the algorithm for the testing of stuck-at faults, inversion 2-coupling faults, and type 1 active neighborhood pattern sensitive faults on a reduced memory model, the authors present a simulation package.<>

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Records of the 1993 IEEE International Workshop on Memory Testing

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