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A review on measurement of different parameters from retinal images to detect Glaucoma and Cataract 从视网膜图像中测量不同参数检测青光眼和白内障的综述
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981113
Sutapa Ray, Pritom Adhikary, Sanjay Chatterjee, Payel Midya, Ritwik Palui, Somasree Ghosh
{"title":"A review on measurement of different parameters from retinal images to detect Glaucoma and Cataract","authors":"Sutapa Ray, Pritom Adhikary, Sanjay Chatterjee, Payel Midya, Ritwik Palui, Somasree Ghosh","doi":"10.1109/IEMENTech48150.2019.8981113","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981113","url":null,"abstract":"In today's scenario diabetic eye disease is growing at an alarming rate that leads to retinal damage and vision loss. Diabetes is found in individuals with high blood sugar and it is of two types and is commonly known as type 1 diabetes and type 2 diabetes. The two most common eye diseases are glaucoma and cataract found in individuals with high concentration of glucose in blood. This paper survey presents the affects of glaucoma and post operative cataract surgery on different parameters of the eye like retinal nerve fiber layer(RNLF), Macular parameter, vessel density, per papillary and macular vessel density mostly using Optical Coherence Tomography (OCT).","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"145 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127216805","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Wide Triple Band Frequency Selective Surface Design and Analysis 一种宽三频带频率选择表面设计与分析
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981114
Somnath Purbey, Garima Tiwari
{"title":"A Wide Triple Band Frequency Selective Surface Design and Analysis","authors":"Somnath Purbey, Garima Tiwari","doi":"10.1109/IEMENTech48150.2019.8981114","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981114","url":null,"abstract":"This paper presents a wideband single-substrate-layer tri- band frequency selective surface (FSS). The proposed FSS designed on a FR4 substrate having relative permittivity of 4.4 with a loss tangent of 0.025 having conductive element on top and bottom side. The unit cell of the FSS structure comprises a tetra folded shaped geometry with a cross dipole in the middle. Triple band- stop filtering applications at the frequencies 6.03GHz,11.98 GHz and 16.67 GHz has been achieved. Small size, single substrate layer structure, simple conductive components, and coverage of in-service frequency bands are a portion of the benefits of the proposed FSS. The FSS structure methodology and results after simulation are introduced here. The proposed FSS design is simulated utilizing commercially accessible Ansys HFSS software.","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114285272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Li-Fi based Intelligent Speed Assistance 基于Li-Fi的智能速度辅助
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981056
T. K. Rana, Chayanika DharChoudhuri
{"title":"Li-Fi based Intelligent Speed Assistance","authors":"T. K. Rana, Chayanika DharChoudhuri","doi":"10.1109/IEMENTech48150.2019.8981056","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981056","url":null,"abstract":"To move faster than others, buses or private cars sometimes run at a very high speed. Competition in vehicles is very common in roads. As a result of ruthless driving civilians are sacrificing their lives in accidents. Traffic light is meant to control flow of cars in a particular direction. It can instruct whether to move or wait for a while. Implementation of a noble device on traffic lamps which can control vehicle's speed while those are crossing any signal post would be very efficient. Such a speed controller device can be made more efficient by using renewable energy source to run it. If LI-FI technology is used to send speed data through signal human eyes are unable to detect the high frequency light. It will appear as a steady light. By analyzing statistical data of number of vehicles on the road and time of accident, speed limit can be restricted for a particular traffic zone with time. Different high frequency light signal giving an indication of speed limit is generated and sent through signal light. A special sensor device mounted in the vehicle receives the light sensing frequencies and restricts the maximum speed limit. The vehicle is also equipped with an ultrasonic sensor that gauges the distance between consecutive vehicles on road and thus based on the distance limits the speed of the latter vehicle thus ensuring an operator-vehicle and vehicle-vehicle data transmission based traffic controlling system.","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126563130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Brainwave Sensing Device Based Musical Stress 基于音乐重音的脑波感应装置
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981289
Soumi Karmakar, Megha Basu, N. Sah, C. Choudhuri, T. K. Rana
{"title":"Brainwave Sensing Device Based Musical Stress","authors":"Soumi Karmakar, Megha Basu, N. Sah, C. Choudhuri, T. K. Rana","doi":"10.1109/IEMENTech48150.2019.8981289","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981289","url":null,"abstract":"In modern era of rat race, people are becoming very stressful to face the competitive world. In this paper, we are presenting an innovative system that will help to reduce the stress level and provides mental peace. Here, Brainwave Sensor is used to detect the mental condition of a person. After sensing the stress condition, some prerecorded musical tone of a specially designed Faraday's guitar is automatically turned on and played through a bluetooth activated speaker. This system will help in a great extent to get rid of mental stress which will in turn reduce the blood pressure and other physical parameters to improve the health condition.","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127884684","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Table of Content 目录表
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981384
dIgITal spInE
{"title":"Table of Content","authors":"dIgITal spInE","doi":"10.1109/IEMENTech48150.2019.8981384","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981384","url":null,"abstract":"Table of Content","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122398430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IOT Based Drone Operated Monitoring Of Distribution Transformers and Terminating Illegal Power Connections 基于物联网的无人机操作配电变压器监控和终止非法电源连接
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981224
Rohan Basak, Ipshita Pal, A. Bandyopadhayay, Tista Guha
{"title":"IOT Based Drone Operated Monitoring Of Distribution Transformers and Terminating Illegal Power Connections","authors":"Rohan Basak, Ipshita Pal, A. Bandyopadhayay, Tista Guha","doi":"10.1109/IEMENTech48150.2019.8981224","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981224","url":null,"abstract":"In this work a drone has been used as a surveillance unit. It is preprogrammed to follow the electrical route using GPS module and monitor any illegal connections. Once it detects any illegal connection it operates an inbuilt telescopic extension mounted cutter and terminates the illegal connections. It also monitors the temperature of distribution transformers along with the current drawn from it using thermographic camera and current measuring device. In case of any abnormalities in temperature or current drawn of the transformer it generates an alarm and conveys it to the local operating station. By the use of such a surveillance system the losses incurred by the power sector can be reduced drastically and also the system prevents detrimental effects arising from transformers.","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128857424","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Microwave Heating Study of Dielectric Material Placed at the Injection Port of an E-Plane Bend 介电材料在e平面弯管注入口的微波加热研究
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981091
S. Karmakar, S. Kundu, Aditya Mukherjee, Arpan Dutta, S. Bose, S. Mukherjee, G. S. Taki
{"title":"Microwave Heating Study of Dielectric Material Placed at the Injection Port of an E-Plane Bend","authors":"S. Karmakar, S. Kundu, Aditya Mukherjee, Arpan Dutta, S. Bose, S. Mukherjee, G. S. Taki","doi":"10.1109/IEMENTech48150.2019.8981091","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981091","url":null,"abstract":"Microwave heating of dielectric window material placed at the injection port of an E-Plane Bend is investigated in this study. 2.45 GHz microwave power is injected into a matched load through a microwave injection hardware consisting of one WR340 rectangular waveguide section and an E-plane waveguide bend. A 3-stub tuning arrangement is used to obtain a matched condition. Teflon is considered here as the dielectric window material, placed between WR340 waveguide section and E-plane bend. This study is essentially needed to know peak temperature of the dielectric material (Teflon) at various microwave power of 500W, 750W and 1kW. The objective of the work is to investigate the temperature rise in Teflon along with microwave injection hardware over predetermined time periods. The steady-state temperature analysis has also been carried out to stimulate the knowledge about the temperature variation in Teflon window, affecting loss tangent, at aforementioned power levels.","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114860285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Methodology for Congestion Reduction and Timing Closure During Placement 在安置期间减少拥堵和定时关闭的方法
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981032
S. Kulkarni, N. S. Murty
{"title":"Methodology for Congestion Reduction and Timing Closure During Placement","authors":"S. Kulkarni, N. S. Murty","doi":"10.1109/IEMENTech48150.2019.8981032","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981032","url":null,"abstract":"Congestion and timing problems are the main hindrance in backend VLSI flow. Due to changing technology, there arises a need for improved and adaptive techniques to fix congestion and DRC (design rule check) violations. This paper shows the ways to have a proper congestion reduction algorithm and design rule check (DRC) of any SOC. It mainly focuses on removing congestion, and different ways to tackle problem for SOC in checking whether the design and timing requirements have been met or not. It also explains a methodology which will minimize congestion despite of having timing and design constraints. Finally, comparative analysis is done at 65 nm and 28 nm shows that the proposed algorithm provides a significant improvement in reducing congestion by 82% and still maintaining the performance of SOC. The results were obtained on Cadence Encounter Digital Implementation (EDI).","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126235891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Investigation of dielectric relaxation of Molybdenum-Zinc-Selenite glass nanocomposites: temperature and frequency dependency 硒酸钼锌玻璃纳米复合材料的介电弛豫研究:温度和频率依赖性
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981133
D. Biswas, A. Das, L. S. Singh, Rittwick Mondal
{"title":"Investigation of dielectric relaxation of Molybdenum-Zinc-Selenite glass nanocomposites: temperature and frequency dependency","authors":"D. Biswas, A. Das, L. S. Singh, Rittwick Mondal","doi":"10.1109/IEMENTech48150.2019.8981133","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981133","url":null,"abstract":"Two bulk glass nanocomposites of xMoO3(1-x) (0.5Se02-0.5ZnO) for $x$ = 0.05, 0.1 and 0.2 compositions have been prepared via slow cooling process of the melt, and the dependency of dielectric properties on temperature and frequency has been studied. The results of the differential scanning calorimetry (DSC) process describes the thermal property of these compositions. The dielectric constant (ε/) and the dielectric loss (ε//) show an increasing nature with temperature and decrease with frequency. The dynamic conductivity relaxation process is non-Debye type, and the obtained relaxation time shows Arrhenius behavior. The scaled complex electric modulus spectra disclose that the dynamic conductivity relaxation process depends on composition but not depend on temperature.","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126521927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Microstrip Patch Antenna with Defected Ground Structure (DGS) and Inset Fed for ISM Band Applications 一种用于ISM波段的带有缺陷接地结构和插入馈电的微带贴片天线
2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech) Pub Date : 2019-08-01 DOI: 10.1109/IEMENTech48150.2019.8981024
Pragya Jain, S. Singh
{"title":"A Microstrip Patch Antenna with Defected Ground Structure (DGS) and Inset Fed for ISM Band Applications","authors":"Pragya Jain, S. Singh","doi":"10.1109/IEMENTech48150.2019.8981024","DOIUrl":"https://doi.org/10.1109/IEMENTech48150.2019.8981024","url":null,"abstract":"A microstrip rectangular patch antenna with inset fed and defected ground structure operating at 2.458 GHz frequency has been presented in this paper for ISM band applications. The presented antenna return loss is −32.65 dB with bandwidth for S11less than −10dB is 2.475 to 2.494 GHz, which covers IEEE 802.11 g/n OFDM 20MHz channel bandwidth. The patch antenna possess directional far field pattern at boresight direction of 0°. The presented microstrip antenna fabrication is easy and it is having light weight and it achieved good directive gain of 6.76 dBi and VSWR of 0.47 at a frequency of resonance, due to the reason it is suitable for the wireless or WLAN applications.","PeriodicalId":243805,"journal":{"name":"2019 3rd International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123229452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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