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ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)最新文献

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Charging experiments on SiO/sub 2/ samples under electron irradiation SiO/ sub2 /样品在电子辐照下的充电实验
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955613
R. Gallet, J. Gosse, Y. Arnal
{"title":"Charging experiments on SiO/sub 2/ samples under electron irradiation","authors":"R. Gallet, J. Gosse, Y. Arnal","doi":"10.1109/ICSD.2001.955613","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955613","url":null,"abstract":"The charging of SiO/sub 2//glass samples under pulsed electron irradiation have been experimentally studied. More specifically, results about the secondary electron emission yield of the uncharged surface have been obtained and successfully compared to a semiempirical model. Moreover, we have pointed out a strong deviation of the evolution of the secondary emission yield (during a series of pulsed irradiation) compared to the theoretical expected one; these contradictory behaviors are explained by the influence of the trapped charges on the secondary electron emission from the charged sample surface.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134624687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Photoelectron emission from SiO/sub 2/ surface oxidized on Si wafer 硅片上氧化SiO/ sub2 /表面的光电子发射
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955513
M. Akagi, T. Sakakibara, Y. Hashimoto
{"title":"Photoelectron emission from SiO/sub 2/ surface oxidized on Si wafer","authors":"M. Akagi, T. Sakakibara, Y. Hashimoto","doi":"10.1109/ICSD.2001.955513","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955513","url":null,"abstract":"We have experimentally studied the relationship between photoelectron emission and surface current for SiO/sub 2/ layers on n-type Si. The photothreshold energy of untreated SiO/sub 2/ increased with increasing surface current from 5.05 to 5.3 eV, keeping a constant value up to about 20 pA of surface current. For the FAB (fast atom bombardment) treated specimen, the photothreshold energy decreased from 5.05 to 4.65 eV with increasing surface current. Such variations might be effected by surface conditions including surface states, surface structure, and electronic conduction in the surface.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121694333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The relationship between charge distribution, charge packet formation and electroluminescence in XLPE under DC 直流作用下XLPE中电荷分布、电荷包形成与电致发光的关系
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955523
A. See, L. Dissado, J. Fothergill, Gilbert Teyssedre, Christophe Laurent, G. Montanari, F. Palmieri
{"title":"The relationship between charge distribution, charge packet formation and electroluminescence in XLPE under DC","authors":"A. See, L. Dissado, J. Fothergill, Gilbert Teyssedre, Christophe Laurent, G. Montanari, F. Palmieri","doi":"10.1109/ICSD.2001.955523","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955523","url":null,"abstract":"Different reports describing the internal distribution of space charge in cross-linked polyethylene (XLPE) under DC field have been published recently. The most striking fact observed is the organization of the space charge into charge packets that cross the insulation. All models for charge packet formation imply that carrier recombination will occur. As the recombination region is potentially a luminescence one it is of interest to record the electroluminescence in this regime. This topic is addressed in this paper.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129044771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Conduction and partial discharge activity in HVDC cable insulation of lapped polypropylene films 搭接聚丙烯薄膜在高压直流电缆绝缘中的导电和局部放电活性
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955542
E. Ildstad, T. Haave
{"title":"Conduction and partial discharge activity in HVDC cable insulation of lapped polypropylene films","authors":"E. Ildstad, T. Haave","doi":"10.1109/ICSD.2001.955542","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955542","url":null,"abstract":"The purpose of the work presented here is to characterise polymeric HVDC cable insulation consisting of lapped thin film polypropylene with respect to DC current conduction and partial discharge activity in air filled butt gaps. The PD activity was found to strongly increase with increasing temperature and applied electric stress. The discharge frequency decreased with time after voltage application and the effect of the void size was found to be of minor importance. These observations agree very well with the proposed theory stating that the discharge frequency will be proportional to the current flowing through the insulation.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129387616","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 21
Study of electronic and optical properties of Zn/sub x/Cd/sub 1-x/Se Zn/sub -x/ Cd/sub - 1-x/Se的电子光学性质研究
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955591
Y. Al-Douri, H. Abid, H. Aourag
{"title":"Study of electronic and optical properties of Zn/sub x/Cd/sub 1-x/Se","authors":"Y. Al-Douri, H. Abid, H. Aourag","doi":"10.1109/ICSD.2001.955591","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955591","url":null,"abstract":"The calculated results of band gap for various compositions and charge density for the ternary alloy are presented. Also, the reflective index, the ionicity character, and the transverse effective charge are calculated. The authors present the pseudopotential method applied to semiconductor alloys. Selected results for the Zn/sub x/Cd/sub 1-x/Se alloy are presented.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126249781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The physico-chemical origins and nature of space charge in insulating solids under electrical stress 电应力作用下绝缘固体中空间电荷的物理化学来源和性质
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955600
T. J. Lewis
{"title":"The physico-chemical origins and nature of space charge in insulating solids under electrical stress","authors":"T. J. Lewis","doi":"10.1109/ICSD.2001.955600","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955600","url":null,"abstract":"There is increasing interest in understanding the characteristics of excess charge in insulating polymeric materials. This interest arises not only from the conviction that such charge is conducive to failure of the insulation but also from the increasing ease and sophistication with which the spatial distribution of such charge can be detected under techniques with acronyms such as LIPP, LIMM, PEA and PWP. In spite of this growth of interest the descriptive models for the charge and its interaction with the polymeric environment frequently lack detail and tend to be confined to macroscopic concepts based on Poisson's equation and the classical ideas of conduction. The present aim is to consider in more detail how charge might exist and move in the insulating solid polyethylene and how it might transfer across the polyethylene-metal interface at an electrode. Polyethylene is chosen, not only because of its importance as a high-voltage insulation but also because its complex morphology introduces features, which are very much at variance with the classical concepts of a bland dielectric.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127233125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Dynamic ac surface discharge characteristics of PMMA and LDPE PMMA和LDPE的动态交流表面放电特性
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955574
Y. L. Sam, P. Lewin, A. Wilkinson, S. Sutton, S. Swingler
{"title":"Dynamic ac surface discharge characteristics of PMMA and LDPE","authors":"Y. L. Sam, P. Lewin, A. Wilkinson, S. Sutton, S. Swingler","doi":"10.1109/ICSD.2001.955574","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955574","url":null,"abstract":"It is necessary to develop an understanding of the surface discharge behaviour of insulating materials under the influence of high electrical stress. A more recent development is a measurement system that is capable of visualising the dynamic movement of surface discharge. The measurement system is based on the use of a birefringent crystal as the sensing element. The method utilises the electro-optic effect (Pockels effect) of the crystal in order to detect the electric stress within it. A test material is bonded to the backface of the crystal and any surface charge upon it will alter the local field within the crystal. The field will affect the polarisation of light passing through the crystal and the amount of reflected light for a given angle of polarisation can be easily measured. Determining the change in polarisation of the reflected light allows the local charge density to be calculated.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"138 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127692953","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Controlling flashover between electrode segments in DC power capacitors 直流电源电容器电极段间的闪络控制
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955623
M. A. Grafton, J. Fothergill, L. Dissado, J.R.R. Shirley-Elgood, Gary C. Stevens, J. L. Thomas
{"title":"Controlling flashover between electrode segments in DC power capacitors","authors":"M. A. Grafton, J. Fothergill, L. Dissado, J.R.R. Shirley-Elgood, Gary C. Stevens, J. L. Thomas","doi":"10.1109/ICSD.2001.955623","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955623","url":null,"abstract":"The aim of this research is to gain an understanding of the mechanisms leading to electrical failure in DC power capacitors based on a polypropylene (PP) dielectric and a \"self-healing\" electrode structure, Connolly et al. In this structure the electrode is sectioned into small parts, which are interconnected by fusible bridges. If a localised flashover occurs, the bridges connecting that part of the electrode fuse and isolate it from the neighbouring regions. Such a method for 'graceful' ageing will be reduced in effectiveness if surface flashover occurs between the disconnected sections.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122922847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Assessing aging of large transformers by furfural investigation 用糠醛调查法评估大型变压器的老化
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955620
Y. Shang, L. Yang, Z.J. Guo, Z. Yan
{"title":"Assessing aging of large transformers by furfural investigation","authors":"Y. Shang, L. Yang, Z.J. Guo, Z. Yan","doi":"10.1109/ICSD.2001.955620","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955620","url":null,"abstract":"Chinese research work of assessing transformer aging via furfural analysis is introduced. Abnormal, normal and deferred aging conditions of paper insulation in transformers are put forward by means of statistical analysis of furfural in the field. It is recommended that relevant measurement information such as moisture, oxygen, as well as power, voltage, etc. is recorded. Increasing rate of furfural in oil is highly emphasized. However, more laboratory studies should be undertaken, in order to get closer to the mechanism of paper degradation.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"517 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133337808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Influence of morphology on dielectric properties of PEN 形貌对PEN介电性能的影响
ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955579
J. Martinez-vega, N. Zouzou, J. Guastavino, L. Boudou
{"title":"Influence of morphology on dielectric properties of PEN","authors":"J. Martinez-vega, N. Zouzou, J. Guastavino, L. Boudou","doi":"10.1109/ICSD.2001.955579","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955579","url":null,"abstract":"The polyethylene naphthalene 2,6 dicarboxylate (PEN) is a biaxially oriented polymer film which can be manufactured to ultra thin thickness retaining all its important properties, thereby making it an excellent candidate for capacitor applications. The condensers undergo local heating in the implantation process as well as in SMT (surface mounted technology). Also, during their use, problems of overload in various applications, such as high frequency power conversion or input and output filtering can cause the same. A significant rise in temperature can cause changes of structure and morphology which is often at the origin of electrical system failure, if the operational nominal parameters are disturbed. From this point of view, a coupling of two techniques of characterization, differential scanning calorimetry and dynamic electrical analysis, was carried out. The analyses of the dielectric losses and the relaxation phenomena are interesting measures to appreciate the structural status of the material and the variation of the medium composition due to an annealing process.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128525534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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