ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)最新文献_第2页

On the use of dielectric coatings in particle-contaminated gas insulated switchgear 介电涂层在微粒污染气体绝缘开关设备中的应用

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955510

M. Morcos, S. Zhang, M. Holmberg, K. Srivastava

{"title":"On the use of dielectric coatings in particle-contaminated gas insulated switchgear","authors":"M. Morcos, S. Zhang, M. Holmberg, K. Srivastava","doi":"10.1109/ICSD.2001.955510","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955510","url":null,"abstract":"Electrical insulation performance of GIS/GITL systems is adversely affected by metallic particle contaminants. These particles may be free to move in the electric field, or may be fixed on the conductors, thus enhancing local electric fields. Dielectric coatings applied to the inside surface of the outer enclosure of a coaxial GIS/GITL system improve the insulation performance. Coating reduces the degree of surface roughness on conductors, thus decreasing the high local electric fields. The electric field necessary to lift a particle resting on the bottom of a GIS/GITL enclosure is much increased due to the coating. In a horizontal coaxial system with particles resting on the inside surface of the enclosure, the motion of such particles is random in nature. Particles in practical systems can exist in a wide variety of shapes and sizes, and of materials of different densities. In this paper, only aluminum wire particles of 0.27 mm diameter in a 110 mm/304 mm diameter coaxial electrode system under 50 Hz AC applied voltage are considered. In the theoretical calculation, wire particles were represented by a cylinder hemispherically terminated at both ends.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123217421","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Investigation of charge transport and trapping in LDPE and HDPE through space charge and conduction current measurements 通过空间电荷和传导电流测量研究LDPE和HDPE中的电荷输运和俘获

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955606

G. Montanari, G. Mazzanti, F. Palmieri, A. Motori

{"title":"Investigation of charge transport and trapping in LDPE and HDPE through space charge and conduction current measurements","authors":"G. Montanari, G. Mazzanti, F. Palmieri, A. Motori","doi":"10.1109/ICSD.2001.955606","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955606","url":null,"abstract":"Space charge observation and conduction current measurements have proved to be fundamental tools for the characterisation of the behaviour under electrical field of insulating materials. They provide complementary information on the processes of charge injection and transport, from the threshold for space charge formation to the conduction mechanism, which can help in understanding the relation between chemical-physical-microstructural properties and the electrical properties. Even apparently simple and widely-used materials such as low-density polyethylene (LDPE) and high-density polyethylene (HDPE) have not been exhaustively investigated as regards injection and transport mechanisms. The purpose of this paper is to provide a contribution to the investigation of charge trapping and transport mechanisms under DC electrical field, using both space charge and charging current measurements. The information obtained by these two techniques allows the correlation between charge accumulation and transport to be discussed. In particular, the threshold characteristics, which provide the behaviour of trapped charge and conductivity as a function of electrical field, are determined.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128615840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 14

Impulse breakdown strength of irradiated LDPE 辐照LDPE脉冲击穿强度

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955684

O. S. Gefle, S. M. Lebedev, Y.P. Pokholkov, D. Agoris, I. Vitellas

引用次数: 1

Understanding electrical trees in solids: from experiment to theory 理解固体中的电树:从实验到理论

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955501

Len A. Dissado

引用次数: 301

Inter-foil electrical breakdown in high voltage ERIP condenser bushings 高压ERIP电容器衬套中箔间击穿

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955642

J. Champion, S. Dodd

引用次数: 12

High frequency and high voltage tests on electric motors stator windings 电机定子绕组高频高压试验

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955618

F. Guastavino, B. Cerutti, S. Bona, C. Colombo, A. Mariani

引用次数: 5

Propagation of electrical tree in extended chain crystal polyethylene 长链晶体聚乙烯中电子树的繁殖

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955570

A. Ishibashi, R. Hanaoka, T. Imamura, S. Takata, Y. Kondo, H. Shirai

引用次数: 6

Effects of ionic impurity on space charge distribution in solid dielectrics 离子杂质对固体介质中空间电荷分布的影响

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955519

M. Ezoe, K. Kuwada, T. Kawashima

引用次数: 12

Influence of polymer matrix on the PTC properties of polyethylene/carbon black composites 聚合物基体对聚乙烯/炭黑复合材料PTC性能的影响

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955527

B. Xi, G. Chen

引用次数: 5

Dielectric breakdown of SiO/sub 2/ thin films deposited by ion beam induced and plasma enhanced CVD 离子束诱导和等离子体增强CVD沉积SiO/ sub2 /薄膜的介电击穿

ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117) Pub Date : 2001-06-25 DOI: 10.1109/ICSD.2001.955633

Á. Barranco, A. Jimenez, F. Frutos, J. Cotrino, F. Yubero, J. Espinós, A. González‐Elipe

{"title":"Dielectric breakdown of SiO/sub 2/ thin films deposited by ion beam induced and plasma enhanced CVD","authors":"Á. Barranco, A. Jimenez, F. Frutos, J. Cotrino, F. Yubero, J. Espinós, A. González‐Elipe","doi":"10.1109/ICSD.2001.955633","DOIUrl":"https://doi.org/10.1109/ICSD.2001.955633","url":null,"abstract":"This paper presents a comparative study of SiO/sub 2/ thin films prepared at room temperature by ion beam induced chemical vapor deposition (IBICVD) and plasma enhanced chemical vapor deposition (PECVD) methods. The films are characterized by AFM, TEM, RBS, ERDA, NRA, X-ray reflectometry and spectroscopic ellipsometry. While the films prepared by IBICVD are very compact and dense and have a high refractive index, those prepared by PECVD exhibit a lower refractive index value, lower density and have a higher surface roughness. Films prepared by IBICVD present a breakdown electric field value (49.14 MV/cm), four times higher than that of the films prepared by PECVD (12.11 MV/cm) and other SiO/sub 2/ materials reported in the literature. This higher value is a consequence of the low roughness and high density of the IBICVD films. This type of microstructure is produced by the effect of the highly energetic ion beams (e.g. 400 eV) impinging on the surface of the growing films during their preparation.","PeriodicalId":239585,"journal":{"name":"ICSD'01. Proceedings of the 20001 IEEE 7th International Conference on Solid Dielectrics (Cat. No.01CH37117)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133752764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0