2019 IEEE Conference on Information and Communication Technology最新文献

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Stacked Filter Bank based descriptor for Human Action Recognition from Depth Sequences 基于堆叠滤波器组描述符的深度序列人体动作识别
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066216
P. Rathnakara Shetty, B. H. Shekar, L. Mestetsky, M. Manju Prasad
{"title":"Stacked Filter Bank based descriptor for Human Action Recognition from Depth Sequences","authors":"P. Rathnakara Shetty, B. H. Shekar, L. Mestetsky, M. Manju Prasad","doi":"10.1109/CICT48419.2019.9066216","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066216","url":null,"abstract":"Registering the motion cues from a video to produce a compact representation is a crucial stage in video based Human Action Recognition (HAR). Exploiting the most prominent features using an efficient descriptor from such a representation also plays equally significant role in the performance of recognition models. In this work, we present a concise Depth Motion Map with striding which registers the motion cues from depth sequences on a video and a novel Filter Bank based descriptor, wherein a Taylor Series Expansion (TSE) filter, a Riesz filter and a gradient filter are stacked together to extract the prominent features. We empirically evaluate the feasibility of our method on MSR Action 3D dataset under standard protocols, achieving state-of-the-art results.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129517006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Malaria Parasite Recognition in Thin Blood Smear Images using Squeeze and Excitation Networks 利用挤压和激励网络在薄血涂片图像中识别疟疾寄生虫
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066150
S. Singh, Prakhar Bansal, Somesh Kumar, P. Shrivastava
{"title":"Malaria Parasite Recognition in Thin Blood Smear Images using Squeeze and Excitation Networks","authors":"S. Singh, Prakhar Bansal, Somesh Kumar, P. Shrivastava","doi":"10.1109/CICT48419.2019.9066150","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066150","url":null,"abstract":"Malaria is a blood disease that is caused by the Plasmodium parasites transmitted through the bite of female Anopheles mosquito. To detect the existence of this parasite, the experts usually examine the thin blood smears. However, this requires considerable expertise in order to precisely make a distinction between the two categories. The result is that methods fail when the task of classification is largely-scaled. In recent times, researchers have started using machine learning techniques which require careful analysis of morphological, textural, and positional variations of the region of interest (ROI) in order to extract hand-engineered features. In this study, we tend to present an advanced method to automate the above process based upon the pre-trained CNN based model, SeNet. This model acts as a feature extractor towards classifying parasitized and uninfected cells. To carry out the process, we have used the dataset of microscopic images of red blood cells provided by United States National Library of Medicine. Our results show that the model achieved an accuracy of 97.24 % in identifying the malarial parasite in red blood cells. The AUC/ROC score (Area under Curve) came out to be around 0.97. The training loss was calculated using Categorical Cross-Entropy which was around 0.075. Statistical validation of the outcomes reveals the use of pre-trained CNNs as a favorable tool for feature extraction for this purpose.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132686899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Cyber Risk Assessment of Networked Cyber Assets using Probabilistic Model Checking 基于概率模型检验的网络资产网络风险评估
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066178
Anand Handa, Subhasis Mukhopadhyay, Shankhadip Mallick, Nitesh Kumar, S. Shukla, Remish L. Minz, Sanjana Pai Nagarmat, R. Rakesh
{"title":"Cyber Risk Assessment of Networked Cyber Assets using Probabilistic Model Checking","authors":"Anand Handa, Subhasis Mukhopadhyay, Shankhadip Mallick, Nitesh Kumar, S. Shukla, Remish L. Minz, Sanjana Pai Nagarmat, R. Rakesh","doi":"10.1109/CICT48419.2019.9066178","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066178","url":null,"abstract":"Attack path analysis to assess the path from the external facing entities to the inner hosts and network elements is a much researched problem. However, to compute a summary risk value per device, based on vulnerabilities discovered on a daily basis, is a much demanded capability in the arsenal of any security administrator of an enterprise network. Further, higher management such as CISOs have to be convinced with numerical risk comparisons to allow the down time required to patch the systems as opposed to defer it till a much later date during a scheduled shutdown. It must be noted that each security administrator's problem is different due to the difference in the structure and composition of the network they administer. Therefore, no industry data source can help in getting these numbers, as the risk numbers are specific to each network and its components. In this paper, we present a methodology based in probabilistic model checking to compute these risk scores for each device in an enterprise network.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133666359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Developing a Bayesian Network Framework for Root Cause Analysis of Observable Problems in Cyber-Physical Systems 开发一个贝叶斯网络框架,用于网络物理系统中可观察问题的根源分析
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066167
S. Chockalingam, Vikash Katta
{"title":"Developing a Bayesian Network Framework for Root Cause Analysis of Observable Problems in Cyber-Physical Systems","authors":"S. Chockalingam, Vikash Katta","doi":"10.1109/CICT48419.2019.9066167","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066167","url":null,"abstract":"Because critical infrastructures rely on Cyber-Physical Systems (CPSs), appropriate response to problems in such infrastructures operated by CPSs is important. Firstly, it is essential for decision-makers to be able to determine whether the observed problem is due to an attack or technical failure. In previous work, we developed a framework for building Bayesian Network (BN) models to enable decision-makers to determine whether the observed problem is due to an attack or technical failure. However, this information alone is not adequate to choose effective response strategies for the observed problem. It is also essential for the decisionmakers to be able to determine the most likely attack vector used to cause the observed problem or failure mode caused the observed problem to choose effective response strategies. However, the decision support to determine the most likely root cause for an observed problem is missing. In this paper, we develop a framework for building BN models to enable decisionmakers to determine the most likely root cause of problems. We demonstrate the developed framework using an example problem in smart grids.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"39 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132532641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Stacking based approach for prediction of faulty modules 基于堆叠的故障模块预测方法
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066206
Pradeep Singh
{"title":"Stacking based approach for prediction of faulty modules","authors":"Pradeep Singh","doi":"10.1109/CICT48419.2019.9066206","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066206","url":null,"abstract":"Determination of a software module, prone to fault is important before the defects are discovered; because it can be used for better prioritization of resources. Software fault prediction is one of such tasks that predicts the fault proneness of the developed modules by applying machine learning techniques on software defect data. State-of-art software defect prediction techniques suffer from achieving good accuracy due to the imbalanced nature of software defect datasets. To address this issue, here we present an approach for software defect prediction by combining imbalance removal and ensemble-model. As ensemble approach is very effective and provides better prediction results as compared to the individual techniques. The stacking-based framework is developed by considering the outperforming ensemble classifiers in order to predict the faulty software modules. All the experiments are performed over twelve benchmark NASA MDP datasets. The paper presents an improved ensemble-based stacking approach to classify the fault prediction for the software system in an effective way.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114556561","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Three Phase Authentication Protocol for Smart Grid Communication 智能电网通信的三相认证协议
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066209
Himank Goel, Ayush Gupta, Harshit Jain, Aashutosh Khandelwal, Harsh Jain, Ayush Sinha, Ranjana Vyas
{"title":"Three Phase Authentication Protocol for Smart Grid Communication","authors":"Himank Goel, Ayush Gupta, Harshit Jain, Aashutosh Khandelwal, Harsh Jain, Ayush Sinha, Ranjana Vyas","doi":"10.1109/CICT48419.2019.9066209","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066209","url":null,"abstract":"Due to the recent IT enabled development of the Smart Grid (SG) technologies, the authentication of such systems has become a key concern. In this paper, we review some of the work that has been undertaken in this area and discuss the drawbacks that these approaches lacked. We then propose a new, secure and robust authentication protocol for smart grid authentication. In our work, we have proposed a mathematical model for a secure communication channel involving four different entities namely Trusted Authority, Sub-station, Smart Meter and the User. We have also performed a security analysis which comprehensively shows how the designed protocol is able fend-off various well known cyber security attacks. The security of our proposed work is built on the fact that given a publicly known base point, finding the random element on a curve is infeasible (also known as the Elliptic Curve Discrete Logarithm Problem (ECDLP)) along with various encryption and hashing algorithms. Therefore, it is safe against several cyber-security attacks.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114307260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Investigating the Challenges and Methodologies of Sentiment Analysis 调查情感分析的挑战和方法
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066186
Mayank Shrivastava, Shishir Kumar
{"title":"Investigating the Challenges and Methodologies of Sentiment Analysis","authors":"Mayank Shrivastava, Shishir Kumar","doi":"10.1109/CICT48419.2019.9066186","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066186","url":null,"abstract":"Humans act as a social animal and drive on intuitions. These intuitions are the result of sentiments which one perceived through the life experiences. Applying analytics on Opinion Mining can help governments, businesses and educational institutions to define policy that best suits the consumer base. This study aims to review researches on sentiment analysis where techniques vary from early attempts to newly developed. The researches implementing supervised and unsupervised techniques which would identify the hidden sentiments from the texts have been categorized and discussed. Challenges and methodologies are the key points for selection of literatures. Tabular comparisons of the past researches have been provided. This paper is designed to provide a precise study for Sentiment Analysis.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121365986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Glaucoma Detection using Fuzzy C-means Optic Cup Segmentation and Feature Classification 基于模糊c均值光学杯分割和特征分类的青光眼检测
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066165
Rakshita Karmawat, Neha Gour, P. Khanna
{"title":"Glaucoma Detection using Fuzzy C-means Optic Cup Segmentation and Feature Classification","authors":"Rakshita Karmawat, Neha Gour, P. Khanna","doi":"10.1109/CICT48419.2019.9066165","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066165","url":null,"abstract":"Ophthalmological diseases cause damage to various parts of human retina. Glaucoma damages optic disc which may lead to progressive and irreversible vision loss. Early diagnosis and detection helps in prevention of vision loss and improves the quality of life of patients. The proposed method aims to develop a glaucoma detection system using fundus images. The method focuses on optic cup segmentation using fuzzy c-means (FCM) algorithm. Fusion of segmentation based and global image based features is used for fundus images classification into normal and glaucoma classes using support vector machine (SVM) and ensemble classifiers. Optic cup segmentation and glaucoma classification results are evaluated on publicly available Drishti-GSI database using relevant performance metrics and compared with methods in literature.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115364007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Tuning of Passbands in Compact Substrate Integrated Waveguide Bandpass Filter using perturbation slot 基于微扰槽的紧凑基板集成波导带通滤波器通带调谐
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066219
S. S. Chaudhury, S. Awasthi, R. Singh
{"title":"Tuning of Passbands in Compact Substrate Integrated Waveguide Bandpass Filter using perturbation slot","authors":"S. S. Chaudhury, S. Awasthi, R. Singh","doi":"10.1109/CICT48419.2019.9066219","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066219","url":null,"abstract":"Tuning the center frequencies and bandwidth of dual passbands using circular arc perturbation slot in compact substrate integrated waveguide (SIW) filter is presented here. A miniaturized SIW cavity is extracted from circular SIW cavity and perturbation slot is loaded to disturb the excited modes. After rightly placing the slot, the arc angle is adjusted to change the surface current path of the excited modes and control the frequency of resonance and passband bandwidth. 1st passband center frequency (CF) can be tuned within a range of 1.23 GHz while 2nd passband remains almost unchanged when the slot is placed 12 mm away from cavity center. If the slot is placed 8 mm away from the cavity center, 1 GHz shift in CF and 1.2 GHz change in 3dB BW of 2nd passband is attained keeping 1st passband undisturbed. Minimum insertion losses of passbands during the process of tuning are maintained within 1.2dB.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131559878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Impact of Channel Doping Fluctuation and Metal Gate Work Function Variation in FD-SOI MOSFET for 5nm BOX Thickness 5nm BOX厚度下FD-SOI MOSFET沟道掺杂波动和金属栅功函数变化的影响
2019 IEEE Conference on Information and Communication Technology Pub Date : 2019-12-01 DOI: 10.1109/CICT48419.2019.9066255
Avaneesh K. Dubey, P. K. Pal, Vikrant Varshney, Ankur Kumar, R. Nagaria
{"title":"Impact of Channel Doping Fluctuation and Metal Gate Work Function Variation in FD-SOI MOSFET for 5nm BOX Thickness","authors":"Avaneesh K. Dubey, P. K. Pal, Vikrant Varshney, Ankur Kumar, R. Nagaria","doi":"10.1109/CICT48419.2019.9066255","DOIUrl":"https://doi.org/10.1109/CICT48419.2019.9066255","url":null,"abstract":"This study presents the behavior of fully depleted silicon-on-insulator (FD-SOI) MOSFET by variation of channel doping concentration and work function of gate material. The channel doping concentration and work function of gate material are varied from 1012to 1019 cm-3and 4.4 to 4.8eV respectively. The investigation is presented for 5nm of silicon film thickness with 2nm and 5nm thickness of gate oxide and buried oxide (BOX) respectively. The comparative study of doping variation on several performance parameters has been characterized using Visual TCAD EDA Tool. The result shows that there is very sharp rise or fall in the device parameters value at very high doping (1019 cm-3), The required tuning of off current is also possible with respect to these variations as the 81 % sudden drop is noticed for 10 times increment in doping concentration from 1017 cm-3and at work function of 4.6eV.","PeriodicalId":234540,"journal":{"name":"2019 IEEE Conference on Information and Communication Technology","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114658234","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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