Ultramicroscopy最新文献_第4页

A simple and intuitive model for long-range 3D potential distributions of in-operando TEM-samples: Comparison with electron holographic tomography 操作中 TEM 样品长程三维电势分布的简单直观模型：与电子全息断层扫描的比较。

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-28 DOI: 10.1016/j.ultramic.2024.114057

Hüseyin Çelik , Robert Fuchs , Simon Gaebel , Christian M. Günther , Michael Lehmann , Tolga Wagner

{"title":"A simple and intuitive model for long-range 3D potential distributions of in-operando TEM-samples: Comparison with electron holographic tomography","authors":"Hüseyin Çelik , Robert Fuchs , Simon Gaebel , Christian M. Günther , Michael Lehmann , Tolga Wagner","doi":"10.1016/j.ultramic.2024.114057","DOIUrl":"10.1016/j.ultramic.2024.114057","url":null,"abstract":"<div><div>Electron holography is a powerful tool to investigate the properties of micro- and nanostructured electronic devices. A meaningful interpretation of the holographic data, however, requires an understanding of the 3D potential distribution inside and outside the sample. Standard approaches to resolve these potential distributions involve projective tilt series and their tomographic reconstruction, in addition to extensive simulations. Here, a simple and intuitive model for the approximation of such long-range potential distributions surrounding a nanostructured coplanar capacitor is presented. The model uses only independent convolutions of an initial potential distribution with a Gaussian kernel, allowing the reconstruction of the entire potential distribution from only one measured projection. By this, a significant reduction of the required computational power as well as a drastically simplified measurement process is achieved, paving the way towards quantitative electron holographic investigation of electrically biased nanostructures.</div></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"267 ","pages":"Article 114057"},"PeriodicalIF":2.1,"publicationDate":"2024-09-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142366704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries 使用倒置对比菊地衍射图样和替代测量几何图形进行 EBSD 和 TKD 分析

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-21 DOI: 10.1016/j.ultramic.2024.114055

Grzegorz Cios , Aimo Winkelmann , Gert Nolze , Tomasz Tokarski , Benedykt R. Jany , Piotr Bała

{"title":"EBSD and TKD analyses using inverted contrast Kikuchi diffraction patterns and alternative measurement geometries","authors":"Grzegorz Cios , Aimo Winkelmann , Gert Nolze , Tomasz Tokarski , Benedykt R. Jany , Piotr Bała","doi":"10.1016/j.ultramic.2024.114055","DOIUrl":"10.1016/j.ultramic.2024.114055","url":null,"abstract":"<div><div>Electron backscatter diffraction (EBSD) patterns can exhibit Kikuchi bands with inverted contrast due to anomalous absorption. This can be observed, for example, on samples with nanoscale topography, in case of a low tilt backscattering geometry, or for transmission Kikuchi diffraction (TKD) on thicker samples. Three examples are discussed where contrast-inverted physics-based simulated master patterns have been applied to find the correct crystal orientation. As first EBSD example, self-assembled gold nanostructures made of Au fcc and Au hcp phases on single-crystal germanium were investigated. Gold covered about 12% of the mapped area, with only two thirds being successfully interpreted using standard Hough-based indexing. The remaining third was solved by brute force indexing using a contrast-inverted master pattern. The second EBSD example deals with maps collected at a non-tilted surface instead of the commonly used 70° tilted one. As TKD example, a jet-polished foil made of duplex stainless steel 2205 was examined. The thin part close to the hole edge producing normal-contrast patterns were standard indexed. The areas of the foil that become thicker with increasing distance from the edge of the hole produce contrast-inverted patterns. They covered three times the evaluable area and were successfully processed using the contrast-inverted master pattern. In the last example, inverted patterns collected at a non-tiled sample were mathematically inverted to normal contrast, and Hough/Radon-based indexing was successfully applied.</div></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"267 ","pages":"Article 114055"},"PeriodicalIF":2.1,"publicationDate":"2024-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399124001347/pdfft?md5=805f0bcd2116a88f646294acc77c2b2c&pid=1-s2.0-S0304399124001347-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142314617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Ultra-low-noise transimpedance amplifier with a single HEMT in pre-amplifier for measuring shot noise in cryogenic STM 超低噪声互阻抗放大器，前置放大器采用单 HEMT，用于测量低温 STM 中的射出噪声

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-19 DOI: 10.1016/j.ultramic.2024.114051

Ying-Xin Liang

{"title":"Ultra-low-noise transimpedance amplifier with a single HEMT in pre-amplifier for measuring shot noise in cryogenic STM","authors":"Ying-Xin Liang","doi":"10.1016/j.ultramic.2024.114051","DOIUrl":"10.1016/j.ultramic.2024.114051","url":null,"abstract":"<div><div>In this work, a design of transimpedance amplifier (TIA) for cryogenic scanning tunneling microscope (CryoSTM) is proposed. TIA with the tip-sample component in CryoSTM is called as CryoSTM-TIA. With transimpedance gain of 1 G<span><math><mi>Ω</mi></math></span>, the bandwidth of the CryoSTM-TIA is larger than 200 kHz. The distinctive feature of the proposed CryoSTM-TIA is that its pre-amplifier is made of a single cryogenic high electron mobility transistor (HEMT), so the apparatus equivalent input noise current power spectral density at 100 kHz is lower than 6 (fA)<span><math><msup><mrow></mrow><mrow><mn>2</mn></mrow></msup></math></span>/Hz. In addition, “bias-cooling method” can be used to in-situ control the density of the frozen DX<span><math><msup><mrow></mrow><mrow><mo>−</mo></mrow></msup></math></span> centers in the HEMT doping area, changing its structure to reduce the device noises. With this apparatus, fast scanning tunneling spectra measurements with high-energy-resolution are capable to be performed. And, it is capable to measure scanning tunneling shot noise spectra (STSNS) at the atomic scale for various quantum systems, even if the shot noise is very low. It provides a powerful tool to investigate novel quantum states by measuring STSNS, such as detecting the existence of Majorana bound states in the topological quantum systems.</div></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"267 ","pages":"Article 114051"},"PeriodicalIF":2.1,"publicationDate":"2024-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142328350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

On the temporal transfer function in STEM imaging from finite detector response time 从有限探测器响应时间看 STEM 成像中的时间传递函数

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-19 DOI: 10.1016/j.ultramic.2024.114056

Jonathan J.P. Peters , Tiarnan Mullarkey , Julie Marie Bekkevold , Matthew Geever , Ryo Ishikawa , Naoya Shibata , Lewys Jones

引用次数: 0

Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy 用于原子力显微镜精确测力的强耦合石英音叉传感器的特性分析

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-18 DOI: 10.1016/j.ultramic.2024.114052

Cedric Shaskey , Amun Jarzembski , Andrew Jue , Keunhan Park

{"title":"Characterization of strongly coupled quartz tuning fork sensors for precision force measurement in atomic force microscopy","authors":"Cedric Shaskey , Amun Jarzembski , Andrew Jue , Keunhan Park","doi":"10.1016/j.ultramic.2024.114052","DOIUrl":"10.1016/j.ultramic.2024.114052","url":null,"abstract":"<div><p>Miniaturized quartz tuning forks (QTFs) have been adopted as force sensors for non-contact atomic force microscopy (AFM). However, the coupled oscillation behaviors of the QTF prongs are not well understood, preventing quantitative measurement of the nanoscale tip-sample interaction forces. This article presents a lumped model that accurately delineates the coupled mechanical oscillations of QTF prongs, establishing rigorous relationships between experimental observables and tip-sample interaction forces. The first-order resonance spectra of a commercial QTF were fully characterized by correlating its piezoelectric response with the actual mechanical oscillation measured with a Fabry-Pérot interferometer. In order to uniquely determine the modeling parameters (i.e., the effective masses, spring constants, and damping constants), the experimental results were compared with the lumped model predictions while masses were added to one prong. The results reveal that the QTF’s center of mass is highly damped, preventing the observation of a symmetric resonance mode. In addition, the mass loading experiment demonstrates that the mechanical oscillations of the QTF prongs are strongly coupled, accounting for 59% (84%) of the effective stiffness at the in-plane (out-of-plane), antisymmetric resonance mode. We believe that the obtained QTF characterization results will pave the way for quantitative measurements of non-contact interaction forces in QTF-based AFM platforms, significantly improving the precision and reliability of nanoscale force measurements.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"267 ","pages":"Article 114052"},"PeriodicalIF":2.1,"publicationDate":"2024-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142271112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Effective removal of global tilt from atomically-resolved topography images of vicinal surfaces with narrow terraces 从具有窄梯田的邻接表面的原子分辨地形图像中有效去除全局倾斜

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-18 DOI: 10.1016/j.ultramic.2024.114053

A.Yu. Aladyshkin , A.N. Chaika , V.N. Semenov , A.M. Ionov , S.I. Bozhko

引用次数: 0

Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy 在透射电子显微镜中利用热漫散射自动检测和绘制晶体倾斜图

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-18 DOI: 10.1016/j.ultramic.2024.114050

Mauricio Cattaneo , Knut Müller-Caspary , Juri Barthel , Katherine E. MacArthur , Nicolas Gauquelin , Marta Lipinska-Chwalek , Johan Verbeeck , Leslie J. Allen , Rafal E. Dunin-Borkowski

{"title":"Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy","authors":"Mauricio Cattaneo , Knut Müller-Caspary , Juri Barthel , Katherine E. MacArthur , Nicolas Gauquelin , Marta Lipinska-Chwalek , Johan Verbeeck , Leslie J. Allen , Rafal E. Dunin-Borkowski","doi":"10.1016/j.ultramic.2024.114050","DOIUrl":"10.1016/j.ultramic.2024.114050","url":null,"abstract":"<div><p>Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM (STEM) data to determine the local mistilt from a major zone axis. It is based on a geometric analysis of Kikuchi bands within a single diffraction pattern, yielding the center of the Laue circle. Whereas the approach is not limited to convergent illumination, it is here developed using unit-cell averaged diffraction patterns corresponding to high-resolution STEM settings. In simulation studies, an accuracy of approximately 0.1 mrad is found. The method is implemented in automated software and applied to crystallographic tilt and in-plane rotation mapping in two experimental cases. In particular, orientation maps of high-Mn steel and an epitaxially grown La<span><math><msub><mrow></mrow><mrow><mtext>0.7</mtext></mrow></msub></math></span>Sr<span><math><msub><mrow></mrow><mrow><mtext>0.3</mtext></mrow></msub></math></span>MnO<span><math><msub><mrow></mrow><mrow><mtext>3</mtext></mrow></msub></math></span>-SrTiO<span><math><msub><mrow></mrow><mrow><mtext>3</mtext></mrow></msub></math></span> interface are presented. The results confirm the estimates of the simulation study and indicate that tilt mapping can be performed consistently over a wide field of view with diameters well above 100 nm at unit cell real space sampling.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"267 ","pages":"Article 114050"},"PeriodicalIF":2.1,"publicationDate":"2024-09-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142271111","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images 从一组弱对比 SEM 图像中估算纳米粒子沉积覆盖率的新方法

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-14 DOI: 10.1016/j.ultramic.2024.114048

Bchara Sidnawi , Liang Zhao , Bo Li , Qianhong Wu

{"title":"A new method for estimating nanoparticle deposition coverage from a set of weak-contrast SEM images","authors":"Bchara Sidnawi , Liang Zhao , Bo Li , Qianhong Wu","doi":"10.1016/j.ultramic.2024.114048","DOIUrl":"10.1016/j.ultramic.2024.114048","url":null,"abstract":"<div><p>Imaging nanomaterials in hybrid systems is critical to understanding the structure and functionality of these systems. However, current technologies such as scanning electron microscopy (SEM) may obtain high resolution/contrast images at the cost of damaging or contaminating the sample. For example, to prevent the charging of organic substrate/matrix, a very thin layer of metal is coated on the surface, which will permanently contaminate the sample and eliminate the possibility of reusing it for following processes. Conversely, examining the sample without any modifications, in pursuit of high-fidelity digital images of its unperturbed state, can come at the cost of low-quality images that are challenging to process. Here, a solution is proposed for the case where no brightness threshold is available to reliably judge whether a region is covered with nanomaterials. The method examines local brightness variability to detect nanomaterial deposits. Very good agreement with manually obtained values of the coverage is observed, and a strong case is made for the method's automatability. Although the developed methodology is showcased in the context of SEM images of Polydimethylsiloxane (PDMS) substrates on which silicone dioxide (SiO<sub>2</sub>) nanoparticles are assembled, the underlying concepts may be extended to situations where straightforward brightness thresholding is not viable.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"267 ","pages":"Article 114048"},"PeriodicalIF":2.1,"publicationDate":"2024-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142271110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy 关于温度梯度对扫描离子电导显微镜非接触扫描影响的理论研究

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-14 DOI: 10.1016/j.ultramic.2024.114054

Zhiwu Wang , Jian Zhuang , Lidong Zhou , Hongjuan Li , Shaohui Ning , Xiaobo Liao

{"title":"Theoretical study on the effect of temperature gradient on contact-free scanning for scanning ion conductance microscopy","authors":"Zhiwu Wang , Jian Zhuang , Lidong Zhou , Hongjuan Li , Shaohui Ning , Xiaobo Liao","doi":"10.1016/j.ultramic.2024.114054","DOIUrl":"10.1016/j.ultramic.2024.114054","url":null,"abstract":"<div><p>Scanning ion-conductance microscopy (SICM) is a non-contact, high-resolution, and <em>in-situ</em> scanning probe microscope technique, it can be operated in probing the physical and chemical properties of biological samples such as living cells. Recently, using SICM to study the effects of microenvironment changes such as temperature changes on response of the biological samples has attracted significant attention. However, in this temperature gradient condition, one of the crucial but still unclear issues is the scanning feedback types and safe threshold. In this paper, a theoretical study of effect of the temperature gradient in electrolyte or sample surface on the SICM safe ion-current threshold is conducted using three-dimensional Poisson-Nernst-Planck, Navier-Stokes and energy equations. Two temperature gradient types, sample surface and two types of pipettes with different ratio of inner and outer radii are included, respectively. The results demonstrate that the local temperature of the electrolyte and then sample surface significantly affect the ion flow, shape of the approach curves and thus safe threshold in SICM pipette probe for contact-free scanning. There is a current-increased and decreased phases for approaching the surface with higher temperature and two current-decreased phases for surface with lower temperature. Based on this shape feature of approach curves, the change rate of current is analysis to illustrate the possibility for contact-free scanning of slope object. The results indicate that with the decrease of the normalized tip-surface distance, the coupling effect of large slope angle and local high temperature makes the increase in change rate of ion current not significant and then it challenging to realize contact-free scanning especially for higher surface temperature.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"267 ","pages":"Article 114054"},"PeriodicalIF":2.1,"publicationDate":"2024-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142238089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Maximizing the notional area in single tip field emitters 最大化单尖端场发射器的名义面积

IF 2.1 3区工程技术

Ultramicroscopy Pub Date : 2024-09-13 DOI: 10.1016/j.ultramic.2024.114049

Sergey V. Filippov , Fernando F. Dall’Agnol , Eugeni O. Popov , Anatoly G. Kolosko , Thiago A. de Assis

{"title":"Maximizing the notional area in single tip field emitters","authors":"Sergey V. Filippov , Fernando F. Dall’Agnol , Eugeni O. Popov , Anatoly G. Kolosko , Thiago A. de Assis","doi":"10.1016/j.ultramic.2024.114049","DOIUrl":"10.1016/j.ultramic.2024.114049","url":null,"abstract":"<div><p>One of the critical aspects in advancing high-brightness field emitter devices is determining the conditions under which single-tip emitters should be constructed to optimize their emission area. Recent experiments have explored varying the axis ratio <span><math><mi>ξ</mi></math></span> of the cap of a single-tip emitter, ranging from an oblate semi-spheroid to a prolate shape, mounted on a nearly cylindrical conducting body. In this work, we present a strategy, based on high-accuracy computer simulations using the finite element technique, to maximize the emission area of those single-tip emitters. Importantly, our findings indicate that the notional emission area achieves its maximum when the emitter’s cap is adjusted to an oblate semi-spheroid with a characteristic axis ratio <span><math><mrow><msub><mrow><mi>ξ</mi></mrow><mrow><mi>C</mi></mrow></msub><mo>≈</mo><mn>0</mn><mo>.</mo><mn>85</mn></mrow></math></span>. We do a comparison of notional emission area as a function of <span><math><mi>ξ</mi></math></span> for an ellipsoidal emitter on a post and compare these results from other emitter configurations, which are feasible to fabricate.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":"267 ","pages":"Article 114049"},"PeriodicalIF":2.1,"publicationDate":"2024-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142238088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0