2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)最新文献_第6页

Reliability analysis of MTJ-based functional module for neuromorphic computing 基于mtj的神经形态计算功能模块可靠性分析

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2017-07-01 DOI: 10.1109/IOLTS.2017.8046207

E. Vatajelu, L. Anghel

引用次数: 6

Energy-efficient and error-resilient iterative solvers for approximate computing 近似计算的节能和抗错迭代求解方法

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2017-07-01 DOI: 10.1109/IOLTS.2017.8046244

A. Schöll, Claus Braun, H. Wunderlich

引用次数: 3

On comparison of robust configurable FPGA encoders for dependable industrial communication systems 可靠工业通信系统中鲁棒可配置FPGA编码器的比较

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2017-07-01 DOI: 10.1109/IOLTS.2017.8046217

P. Pfeifer, F. Hosseinzadeh, H. Vierhaus

引用次数: 1

EDA support for functional safety — How static and dynamic failure analysis can improve productivity in the assessment of functional safety EDA对功能安全的支持——静态和动态失效分析如何提高功能安全评估的生产率

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2017-07-01 DOI: 10.1109/IOLTS.2017.8046210

D. Alexandrescu, A. Evans, M. Glorieux, I. Nofal

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引用次数: 9

An effective functional safety infrastructure for system-on-chips 片上系统的有效功能安全基础设施

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2017-07-01 DOI: 10.1109/IOLTS.2017.8046235

C. Eychenne, Y. Zorian

引用次数: 8

Advanced ECC solution for automotive SoCs 用于汽车soc的先进ECC解决方案

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2017-07-01 DOI: 10.1109/IOLTS.2017.8046237

Hanna Shaheen, Gabriele Boschi, Gurgen Harutunyan, Y. Zorian

引用次数: 21

Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT 时序电路暂态故障脆弱性的SMT综合分析

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2017-07-01 DOI: 10.1109/IOLTS.2017.8046195

Ghaith Bany Hamad, Ghaith Kazma, O. Mohamed, Y. Savaria

引用次数: 1

6T CMOS SRAMs reliability monitoring through stability measurements 通过稳定性测量监测6T CMOS sram的可靠性

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) Pub Date : 2017-07-01 DOI: 10.1109/IOLTS.2017.8046239

B. Alorda, G. Torrens, S. Bota

引用次数: 0