2018 IEEE 23rd European Test Symposium (ETS)最新文献

Design of fault-tolerant neuromorphic computing systems 容错神经形态计算系统的设计

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-12-04 DOI: 10.1109/ETS.2018.8400693

Mengyun Liu, Lixue Xia, Yu Wang, K. Chakrabarty

{"title":"Design of fault-tolerant neuromorphic computing systems","authors":"Mengyun Liu, Lixue Xia, Yu Wang, K. Chakrabarty","doi":"10.1109/ETS.2018.8400693","DOIUrl":"https://doi.org/10.1109/ETS.2018.8400693","url":null,"abstract":"Neuromorphic computing is rapidly becoming mainstream, and Resistive Random Access Memory (RRAM) and RRAM-based computing systems (RCS) provide a promising hardware implementation of neuromorphic computing. This emerging computing system helps us to realize vector-matrix multiplications in a time complexity of 0(1), and it improves energy efficiency dramatically. However, due to the immature fabrication process, RCS is susceptible to defects; the resulting errors lead to a significant accuracy drop in neuromorphic computing applications. In order to take advantage of RCS in practical applications, fault-tolerant design is necessary. We present a survey of fault-tolerant designs for RRAM-based neuromorphic computing systems. We first describe RRAM-based crossbars and their role in neuromorphic computing systems. Following this, we classify fault models into different categories, and review the test solutions. Subsequently, the framework of fault-tolerant design for RCS is presented, which contains an online testing phase and a fault-tolerant training phase. The techniques proposed for these two phases are classified and explained to highlight their similarities and differences. The methods reviewed in this survey represent recent trends in fault-tolerant designs of RCS, and are expected motivate further research in this field.","PeriodicalId":223459,"journal":{"name":"2018 IEEE 23rd European Test Symposium (ETS)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114213956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 12

Hardware Trojan detection using path delay order encoding with process variation tolerance 硬件木马检测使用路径延迟顺序编码与进程变化公差

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-06-29 DOI: 10.1109/ETS.2018.8400708

Xiaotong Cui, Kaijie Wu, R. Karri

引用次数: 5

Covering hard-to-detect defects by thermal quorum sensing 通过热群体感应覆盖难以检测的缺陷

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-06-29 DOI: 10.1109/ETS.2018.8400705

Po-Yao Chuang, Cheng-Wen Wu, Harry H. Chen

引用次数: 0

Locking of biochemical assays for digital microfluidic biochips 锁定数字微流控生物芯片的生化分析

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-06-29 DOI: 10.1109/ETS.2018.8400686

Sukanta Bhattacharjee, Jack Tang, Mohamed Ibrahim, K. Chakrabarty, R. Karri

引用次数: 23

Recycled IC detection through aging sensor 通过老化传感器回收IC检测

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-06-29 DOI: 10.1109/ETS.2018.8400713

Daniele Rossi, V. Tenentes, S. Khursheed, S. Reddy

引用次数: 4

IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers IEEE标准P1838的灵活并行端口及其规范与谷歌的协议缓冲区

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-05-29 DOI: 10.1109/ETS.2018.8400690

Yu LI, Ming Shao, Hailong Jiao, A. Cron, S. Bhatia, E. Marinissen

引用次数: 6

Automatic generation of in-circuit tests for board assembly defects 自动生成电路板组装缺陷的在线测试

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-05-29 DOI: 10.1109/ETS.2018.8400714

Harm van Schaaijk, M. Spierings, E. Marinissen

引用次数: 3

Machine learning applications in IC testing 机器学习在集成电路测试中的应用

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-05-28 DOI: 10.1109/ETS.2018.8400701

H. Stratigopoulos

引用次数: 46

Online prevention of security violations in reconfigurable scan networks 可重构扫描网络中安全违规的在线预防

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-05-01 DOI: 10.1109/ETS.2018.8400685

A. Atteya, M. Kochte, M. Sauer, Pascal Raiola, B. Becker, H. Wunderlich

{"title":"Online prevention of security violations in reconfigurable scan networks","authors":"A. Atteya, M. Kochte, M. Sauer, Pascal Raiola, B. Becker, H. Wunderlich","doi":"10.1109/ETS.2018.8400685","DOIUrl":"https://doi.org/10.1109/ETS.2018.8400685","url":null,"abstract":"Modern systems-on-chip (SoC) designs are requiring more and more infrastructure for validation, debug, volume test as well as in-field maintenance and repair. Reconfigurable scan networks (RSNs), as allowed by IEEE 1687 (IJTAG) standard, provide flexible access to the infrastructure with low access latency. However, they can also pose a security threat to the system, by leaking information about the system state. In this paper, we present a protection method that monitors access and checks for violations of security properties online. The method prevents unauthorized access to sensitive and secure instruments. In addition, the system integrator can specify more complex security requirements, including giving multiple users different access privileges. Simultaneous accesses to multiple instruments, that would expose sensitive data to an untrusted core (e.g. from 3rd party vendors) or instrument, can be prohibited. The method does not require any change to the RSN architecture and is easily integrable with IP core designs. The area overhead with respect to the size of the RSN is below 6% and scales well with larger networks.","PeriodicalId":223459,"journal":{"name":"2018 IEEE 23rd European Test Symposium (ETS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121560584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 9

Device aging: A reliability and security concern 设备老化:一个可靠性和安全问题

2018 IEEE 23rd European Test Symposium (ETS) Pub Date : 2018-05-01 DOI: 10.1109/ETS.2018.8400702

Daniel Kraak, M. Taouil, S. Hamdioui, P. Weckx, F. Catthoor, A. Chatterjee, A. Singh, H. Wunderlich, Naghmeh Karimi

{"title":"Device aging: A reliability and security concern","authors":"Daniel Kraak, M. Taouil, S. Hamdioui, P. Weckx, F. Catthoor, A. Chatterjee, A. Singh, H. Wunderlich, Naghmeh Karimi","doi":"10.1109/ETS.2018.8400702","DOIUrl":"https://doi.org/10.1109/ETS.2018.8400702","url":null,"abstract":"Device aging is an important concern in nanoscale designs. Due to aging the electrical behavior of transistors embedded in an integrated circuit deviates from original intended one. This leads to performance degradation in the underlying device, and the ultimate device failure. This effect is exacerbated in emerging technologies. To be able to tailor effective aging mitigation schemes and improve the reliability of devices realized in cutting edge technologies, there is a need to accurately study the effect of aging in high performance industrial applications. According, this paper targets a high performance SRAM memory realized in 14nm FinFET technology and depicts how aging degrades the individual components of this memory as well as the interaction between them. Aging mitigation is critical not only from device reliability point of view but also regarding device security perspectives. It is essential to assure the security of the sensitive tasks performed by the security-sensitive circuits and to guarantee the security of information stored within these devices in the presence of aging. Accordingly in this paper, we also focus on aging-related security concerns and present the cases in which aging need to considered to preserve security.","PeriodicalId":223459,"journal":{"name":"2018 IEEE 23rd European Test Symposium (ETS)","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116323587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10