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Uncertainties in the measurement of ac voltage using a programmable Josephson voltage standard and a phase sensitive null detector 使用可编程约瑟夫森电压标准和相敏零检测器测量交流电压的不确定度
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543436
D. Georgakopoulos
{"title":"Uncertainties in the measurement of ac voltage using a programmable Josephson voltage standard and a phase sensitive null detector","authors":"D. Georgakopoulos","doi":"10.1109/CPEM.2010.5543436","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543436","url":null,"abstract":"This paper investigates the required characteristics and the systematic errors of a lock-in amplifier (LIA) when it is used as a null detector for the measurement of AC voltage by comparison with a stepwise approximated sinewave (SASW) generated using a programmable Josephson voltage standard. It is shown that the uncertainties introduced by the LIA in the measurement are related to the number of samples per period of the SASW and can be reduced to levels below 0.5 µV/V.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"2013 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128701223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
High-value capacitance measurement based on inductive shunt 基于电感分流的高值电容测量
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5545299
Dai Dong-xue, He Xiaobing, Wang Wei
{"title":"High-value capacitance measurement based on inductive shunt","authors":"Dai Dong-xue, He Xiaobing, Wang Wei","doi":"10.1109/CPEM.2010.5545299","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5545299","url":null,"abstract":"This paper describes a new high-value capacitance measurement method based on the inductive shunt. The method is used to measure capacitance from 10µF to lmF, frequency from 100 Hz to 1 kHz.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124610225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Design, realization and characterization of a high current measurement system with Rogowski coil 基于Rogowski线圈的大电流测量系统的设计、实现和特性分析
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544161
R. Malych, O. Barczi, P. Vrabcek
{"title":"Design, realization and characterization of a high current measurement system with Rogowski coil","authors":"R. Malych, O. Barczi, P. Vrabcek","doi":"10.1109/CPEM.2010.5544161","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544161","url":null,"abstract":"This paper describes the design, realization and basic characterization of the high current measurement system based on Rogowski sensor using an electrooptical transfer of the measuring signal. We present the principal schemes of the system and results of linearity measurements at 50 Hz frequency. The system is aimed for the on-site measurements on the distribution grids.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125125554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Hybrid single-electron turnstile - Towards a quantum standard of electric current 混合单电子旋转门——迈向电流的量子标准
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544502
J. Pekola, D. Averin, S. Kafanov, A. Kemppinen, S. Lotkhov, V. Maisi, M. Meschke, M. Mottonen, Y. Pashkin, O. Saira, J. Tsai, A. Zorin
{"title":"Hybrid single-electron turnstile - Towards a quantum standard of electric current","authors":"J. Pekola, D. Averin, S. Kafanov, A. Kemppinen, S. Lotkhov, V. Maisi, M. Meschke, M. Mottonen, Y. Pashkin, O. Saira, J. Tsai, A. Zorin","doi":"10.1109/CPEM.2010.5544502","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544502","url":null,"abstract":"First I discuss various candidates of single-electron current pumps for quantum metrology. Then I focus on the hybrid normal-metal-superconductor turnstile in the form of a one-island single-electron transistor with one gate [1-3]. The device demonstrates robust current plateaus at multiple levels of ef at frequency f. I discuss the various error mechanisms, based on our experiments and theoretical considerations. Ultimately the quantization accuracy is expected to be limited by either two-electron tunneling or by Cooper-pair-electron co-tunneling [4]. We predict that it should be possible to achieve the metrological accuracy of 10−8, while maintaining the quantized current on the level of more than 10 pA, just by one turnstile with realistic parameters using aluminium as a superconductor. Recently we have managed to run ten turnstiles in parallel increasing the current level to above 100 pA [5]. Work on suppressing the harmful sub-gap leakage current is in progress with encouraging experimental results.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"129 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129903911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Stability study of precision high voltage resistive divider by automation 自动化精密高压电阻分压器的稳定性研究
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544513
Kanishk Ravat, K. B. Ravat, A. K. Saxena
{"title":"Stability study of precision high voltage resistive divider by automation","authors":"Kanishk Ravat, K. B. Ravat, A. K. Saxena","doi":"10.1109/CPEM.2010.5544513","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544513","url":null,"abstract":"The stability of High Voltage Dividers plays a vital role in its calibration. Time to stabilize the divider at High voltage gradually increases with voltage applied. A software is developed to study through graphical representation, the time taken by divider to stabilize against change of voltage. The combined uncertainty in ratio determination has improved from 60 ppm to 15 ppm through this study.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123223455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Josephson arbitrary Waveform Synthesizer for analysis of AC components 约瑟夫森任意波形合成器分析交流元件
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544751
O. Kieler, D. Schleussner, J. Kohlmann, R. Behr
{"title":"Josephson arbitrary Waveform Synthesizer for analysis of AC components","authors":"O. Kieler, D. Schleussner, J. Kohlmann, R. Behr","doi":"10.1109/CPEM.2010.5544751","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544751","url":null,"abstract":"The Josephson Arbitrary Waveform Synthesizer (JAWS) has been further developed towards a less complex and more easy-to-use system. Distortion free frequency spectra were realized showing a signal-to-noise ratio of more than −120 dBc and providing a high long-time stability. Arbitrary, bipolar waveforms in a wide frequency range from 156 Hz to 100 kHz were synthesized. The application of the JAWS for AC metrology analysis is discussed.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123366888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Sampling based RLC bridge 基于采样的RLC桥
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544367
F. Overney, B. Jeanneret
{"title":"Sampling based RLC bridge","authors":"F. Overney, B. Jeanneret","doi":"10.1109/CPEM.2010.5544367","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544367","url":null,"abstract":"This paper describes a measuring set up based on a synchronous sampling system which allows the calibration of any kind of impedance (resistance, inductance or capacitance) in terms of a reference resistance standard. The impedance range covered starts below 1 Ω and reaches 100 kΩ for frequencies ranging between 50 Hz and 20 kHz.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123680952","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A novel full 2-port calibration method for antenna measurements using sol standards without through procedure 一种新颖的全2端口校准方法天线测量使用溶胶标准没有通过程序
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5543887
M. Hirose, K. Komiyama
{"title":"A novel full 2-port calibration method for antenna measurements using sol standards without through procedure","authors":"M. Hirose, K. Komiyama","doi":"10.1109/CPEM.2010.5543887","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5543887","url":null,"abstract":"We have proposed a novel method to calibrate a vector network analyzer (VNA) using only Short-Open-Load (SOL) standards without Thru (T) procedure in a full 2-port calibration, which is especially suitable for reciprocal antenna measurements because of the easiness of its procedure, and have shown that the systematic uncertainty is almost the same as that of the SOLT calibration method. In this paper, we show that there is the similar condition on the signal to noise ratio (SNR) for the calibration methods. Therefore, it is proved that the method is simpler than the SOLT calibration method with equivalent effectiveness.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114721563","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulator for amplifier and transistor noise-parameter measurements 用于放大器和晶体管噪声参数测量的模拟器
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544823
J. Randa
{"title":"Simulator for amplifier and transistor noise-parameter measurements","authors":"J. Randa","doi":"10.1109/CPEM.2010.5544823","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544823","url":null,"abstract":"This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both type A and type B uncertainties are included. An illustrative example is given.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114849570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A compensation method to measure the mutual inductance at low frequency 一种测量低频互感的补偿方法
CPEM 2010 Pub Date : 2010-06-13 DOI: 10.1109/CPEM.2010.5544808
Z. Li, Z. Zhang, Q. He, Y. Fu, J. Zhao, B. Han, S. Li, Y. Lu, C. Li
{"title":"A compensation method to measure the mutual inductance at low frequency","authors":"Z. Li, Z. Zhang, Q. He, Y. Fu, J. Zhao, B. Han, S. Li, Y. Lu, C. Li","doi":"10.1109/CPEM.2010.5544808","DOIUrl":"https://doi.org/10.1109/CPEM.2010.5544808","url":null,"abstract":"Traditionally, the most precise way to get the mutual inductance value is by a calculable mutual inductor. Here a new approach of measuring the mutual inductance at low frequency with compensation method is described. The mutual inductance is traced to the value of the frequency and resistance directly. The measurement uncertainty is 0.1ppm and could be improved further.","PeriodicalId":222495,"journal":{"name":"CPEM 2010","volume":"125 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124265734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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