75th ARFTG Microwave Measurement Conference最新文献_第3页

A simplified extension of X-parameters to describe memory effects for wideband modulated signals 描述宽带调制信号记忆效应的x参数的简化扩展

75th ARFTG Microwave Measurement Conference Pub Date : 2010-05-28 DOI: 10.1109/ARFTG.2010.5496334

J. Verspecht, J. Horn, D. Root

引用次数: 21

Multimode TRL technique for de-embedding of differential devices 差分器件去嵌入的多模TRL技术

75th ARFTG Microwave Measurement Conference Pub Date : 2010-05-28 DOI: 10.1109/ARFTG.2010.5496326

M. Wojnowski, V. Issakov, G. Sommer, R. Weigel

{"title":"Multimode TRL technique for de-embedding of differential devices","authors":"M. Wojnowski, V. Issakov, G. Sommer, R. Weigel","doi":"10.1109/ARFTG.2010.5496326","DOIUrl":"https://doi.org/10.1109/ARFTG.2010.5496326","url":null,"abstract":"The thru-reflect-line (TRL) is one of the most fundamental and accurate vector network analyzer (VNA) calibration techniques. The multimode TRL calibration method generalizes the standard TRL technique to multimode waveguides. In this paper, the practical use of the multimode TRL calibration technique for de-embedding purposes is discussed. The focus is on the four-port case, since this covers the majority of the practical applications. However, the formulation can be easily extended for networks with higher number of ports. The common de-embedding assumptions such as reciprocity and symmetry are analyzed and their consequences on the multimode TRL algorithm are discussed. It is shown that the reciprocity assumption applied to the embedding networks reduces the requirements on the reflect standard. It is demonstrated that additional assumptions of either identical or symmetrical error networks make it possible to completely resolve the problem related to the reflect standard. Based on the derived formulation, it is shown that the multimode TRL calibration reduces to the traditional TRL de-embedding under reciprocity and symmetry assumptions. The problems of interpretation and re-normalization of the obtained scattering parameters (S-parameters) are also discussed. Finally, the measurement results are presented that verify the multimode TRL approach for de-embedding of four-port differential devices.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128772065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 15

A new 75–110 GHz primary power standard with reduced thermal mass 减少热质量的新75-110 GHz主功率标准

75th ARFTG Microwave Measurement Conference Pub Date : 2010-05-28 DOI: 10.1109/ARFTG.2010.5496337

D. Adamson, J. Miall, J. Howes, M. Harper, R. Thompson

引用次数: 4

An intelligence driven active loadpull system 一种智能驱动的主动负载牵引系统

75th ARFTG Microwave Measurement Conference Pub Date : 2010-05-28 DOI: 10.1109/ARFTG.2010.5496327

R. Saini, S. Woodington, J. Lees, J. Benedikt, P. Tasker

引用次数: 15

A novel method for direct impedance measurement in microwave and mm-wave bands 微波和毫米波波段直接阻抗测量的新方法

75th ARFTG Microwave Measurement Conference Pub Date : 2010-05-28 DOI: 10.1109/ARFTG.2010.5496331

M. Randus, K. Hoffmann

引用次数: 3

A VNA based broadband load-pull for non-parametric 2-port Best Linear Approximation modeling 一种基于VNA的非参数二端口最佳线性逼近建模的宽带负载拉

75th ARFTG Microwave Measurement Conference Pub Date : 2010-05-28 DOI: 10.1109/ARFTG.2010.5496335

Y. Rolain, J. Schoukens, R. Pintelon, L. Delocht, G. Vandersteen

引用次数: 1