{"title":"描述宽带调制信号记忆效应的x参数的简化扩展","authors":"J. Verspecht, J. Horn, D. Root","doi":"10.1109/ARFTG.2010.5496334","DOIUrl":null,"url":null,"abstract":"An original way is presented to model memory effects of microwave amplifiers in the case of wideband modulated signals. The model is derived as a limiting case of the more general dynamic X-parameter theory. For a given component, the model is identified from pulsed envelope X-parameter measurements performed with an NVNA. The resulting nonlinear X-parameter model is quantitatively described by a 2-variate kernel function that enables the derivation of an optimal static AM-AM AM-PM characteristic for every possible input envelope probability density function. The model is validated by performing a set of 2-tone experiments. The model can be implemented in the ADS circuit envelope simulator.","PeriodicalId":221794,"journal":{"name":"75th ARFTG Microwave Measurement Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"A simplified extension of X-parameters to describe memory effects for wideband modulated signals\",\"authors\":\"J. Verspecht, J. Horn, D. Root\",\"doi\":\"10.1109/ARFTG.2010.5496334\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An original way is presented to model memory effects of microwave amplifiers in the case of wideband modulated signals. The model is derived as a limiting case of the more general dynamic X-parameter theory. For a given component, the model is identified from pulsed envelope X-parameter measurements performed with an NVNA. The resulting nonlinear X-parameter model is quantitatively described by a 2-variate kernel function that enables the derivation of an optimal static AM-AM AM-PM characteristic for every possible input envelope probability density function. The model is validated by performing a set of 2-tone experiments. The model can be implemented in the ADS circuit envelope simulator.\",\"PeriodicalId\":221794,\"journal\":{\"name\":\"75th ARFTG Microwave Measurement Conference\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"75th ARFTG Microwave Measurement Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2010.5496334\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"75th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2010.5496334","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A simplified extension of X-parameters to describe memory effects for wideband modulated signals
An original way is presented to model memory effects of microwave amplifiers in the case of wideband modulated signals. The model is derived as a limiting case of the more general dynamic X-parameter theory. For a given component, the model is identified from pulsed envelope X-parameter measurements performed with an NVNA. The resulting nonlinear X-parameter model is quantitatively described by a 2-variate kernel function that enables the derivation of an optimal static AM-AM AM-PM characteristic for every possible input envelope probability density function. The model is validated by performing a set of 2-tone experiments. The model can be implemented in the ADS circuit envelope simulator.
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