微波和毫米波波段直接阻抗测量的新方法

75th ARFTG Microwave Measurement Conference Pub Date : 2010-05-28 DOI:10.1109/ARFTG.2010.5496331

M. Randus, K. Hoffmann

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引用次数: 3

摘要

介绍了一种利用通用矢量网络分析仪(VNA)直接测量阻抗的新方法。在常用的方法中，被测器件(DUT)的阻抗或导纳是由其反射系数的测量值推导出来的，对于非常高或非常低的阻抗，这会导致严重的精度问题。所提出的方法使测量量与被测物的阻抗或导纳值成正比成为可能。这使我们能够准确地测量甚至与50Ω参考阻抗值截然不同的阻抗。该方法还能显著降低VNA不确定度的影响。提出了一种合适的校准技术，并进行了完整的数学描述。通过软件仿真验证了该方法的有效性。

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A novel method for direct impedance measurement in microwave and mm-wave bands

A novel method for direct impedance measurement using a common vector network analyzer (VNA) is introduced. In commonly used methods impedance or admitance of a device under test (DUT) is derived from measured value of its reflection coefficient causing serious accuracy problems for very high or very low impedances. The proposed method makes possible to measure quantity directly proportional to the value of the impedance or admittance of the DUT. This enables us to accurately measure even impedances that are extremely different from value of the 50Ω reference impedance. The method can also significantly reduce effect of uncertainties of the VNA. A suitable calibration technique is suggested and fully mathematically described. The concept of the new method was verified by software simulation.

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75th ARFTG Microwave Measurement Conference

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