2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)最新文献

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Image Preprocessing of Iris Recognition 虹膜识别的图像预处理
Yangqing Sun, Y. Hua
{"title":"Image Preprocessing of Iris Recognition","authors":"Yangqing Sun, Y. Hua","doi":"10.1109/ICAM.2018.8596533","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596533","url":null,"abstract":"The aim of this paper is to propose the methods for image preprocessing of iris recognition including image enhancement and boundary detection. Iris recognition has been widely considered as one of the most dependable identification method. However, the iris systems are still not widespread due to many factors, for example, the production cost, the processing time and the recognition rate. The problems of production cost and the processing time will be resolved with the development of integrate circuit technology. The problem of recognition rate mentioned here is not about the iris itself, but the acquisition of the effective image of the iris. The quality of the iris image has become the key point of the current iris system. The preprocessing of iris recognition involves hardware and software design of the system and in this paper both of the designs are discussed.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127426595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Probabilistic Ampacity Rating of 500kV Overhead Transmission Lines in Zhejiang Province 浙江省500kV架空输电线路概率容量额定值
Xiangxian Zhou, Shaohua Wang, Te Li, Junping Cao, Yang Zou, Xinyu Xiang
{"title":"Probabilistic Ampacity Rating of 500kV Overhead Transmission Lines in Zhejiang Province","authors":"Xiangxian Zhou, Shaohua Wang, Te Li, Junping Cao, Yang Zou, Xinyu Xiang","doi":"10.1109/ICAM.2018.8596438","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596438","url":null,"abstract":"Due to the limitation of power transmission capability, the renewable energy generation may be curtailed in summer season. Since the corridors are too crowd to build new transmission lines in Zhejiang province, it is an urgent demand to enhance the ampacity of existing transmission lines. This work applied the probabilistic ampacity rating method to 20 circuits of 500kV transmission lines in Zhejiang province. The weather conditions in the transmission lines corridors are first analyzed and typical meteorological year (TMY) is generated. Secondly, the hourly ampacity distributions of the transmission line are calculated. Finally, the ampacity of transmission lines are determined at different acceptable risk levels. Significant ampacity enhancement was achieved by the application of probabilistic ampacity rating method.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124591475","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Radio Frequency System-On-Chip Design for Digital Receiver 数字接收机的射频片上系统设计
Haoming Du, Lintao Liu, Yuhan Gao, Qiao Gong
{"title":"Radio Frequency System-On-Chip Design for Digital Receiver","authors":"Haoming Du, Lintao Liu, Yuhan Gao, Qiao Gong","doi":"10.1109/ICAM.2018.8596652","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596652","url":null,"abstract":"The design, processing and testing of a single RF system on chip (SoC) system is completed on the basis of wideband radio frequency receiving circuit, low power and highspeed high precision analog to digital converter(ADC), digital down converter(DDC), central processing unit (CPU) and other complex functional circuits. The research of a radio frequency(RF) SoC integration technology with wideband radio frequency signal receiving, analog digital conversion, digital signal processing and control is carried out, which lays a technical foundation for the realization of the digital radio frequency receiver SoC.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131605127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
RDV: A New Method for Memory Phase Detection and Simulation Points Selection RDV:一种新的记忆相位检测和仿真点选择方法
Shan Shen, Ming Ling, Yongtao Zhang, Longxing Shi
{"title":"RDV: A New Method for Memory Phase Detection and Simulation Points Selection","authors":"Shan Shen, Ming Ling, Yongtao Zhang, Longxing Shi","doi":"10.1109/ICAM.2018.8596499","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596499","url":null,"abstract":"Previous studies proposed several code signatures, with large vector dimensions and time-consuming profiling processes, to detect phase transitions of the overall processor performance. However, there still lacks an effective and efficient method to detect and leverage the phase characteristics of memory access. This paper proposes the Reuse Distance Vector (RDV), a new metric that tightly coupled with the cache performance, to summarize the phase behavior in the memory hierarchy. Different from the commonly seen huge dimensionality of other code signatures, RDVs are collected at very low dimensions. Meanwhile, the profiling overhead can be further reduced by our sampling technique. Based on RDVs, the simulation points can be found via a clustering method to reduce the time consumption of cycle-accurate simulations. Using the simulation points found by RDVs, the average relative error of cache miss rate estimation is as low as 1.08%, which outperforms the accuracies coming from BBVs and EIPVs by 79% and 22% (all compared methods use the same number of simulation points that take 0.4% of the whole program). The average errors of MLP and the cache miss service time are only 0.9% and 1.8%, respectively.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114912789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Design of High Linear Bootstrapped S/H Switch 高线性自适应S/H开关设计
Dagang Li, Yuanjun Cen, Ping-Ling Yang, Yongkai Li, Xu Qi, Bo Wang
{"title":"The Design of High Linear Bootstrapped S/H Switch","authors":"Dagang Li, Yuanjun Cen, Ping-Ling Yang, Yongkai Li, Xu Qi, Bo Wang","doi":"10.1109/ICAM.2018.8596374","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596374","url":null,"abstract":"Sometimes, the input-port of A/D converter always needs a S/H switch. In Sample state, the S/H switch should always be opening, now voltages between input-port and output-port in S/H switch are always the same. In Hold state, the S/H switch should always be closing, now the voltage of output-port in S/H switch will keep a fixed value, and it will not be changed with the voltage of input-port in S/H switch. For A/D converter, the conversion linearity is the most important parameter. For getting the best performance of conversion linearity, it is very important to design a high linear S/H switch. In sample stage, the voltage of output-port in S/H switch should be always changed with the voltage of input-port at any time. It is very easy to S/H switch design under the normal condition. Next for getting the higher linear performance in A/D converter, the fixed value in Hold state should be keeping linear performance of input voltage at the most, it is very hard in high resolution A/D converter. Through this paper's design, it makes the distortion leading by Sample switch become linear distortion. So it can get a high performance S/H bootstrapped switch, which can apply to 16-bit or much higher resolution ADC.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128969111","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Application of the Genetic Algorithm in MOSFET Modeling and Parameter Extraction 遗传算法在MOSFET建模和参数提取中的应用
Yang Cao, Wei Zhang, Jun Fu, Nianhong Liu, Quan Wang, Linlin Liu
{"title":"Application of the Genetic Algorithm in MOSFET Modeling and Parameter Extraction","authors":"Yang Cao, Wei Zhang, Jun Fu, Nianhong Liu, Quan Wang, Linlin Liu","doi":"10.1109/ICAM.2018.8596549","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596549","url":null,"abstract":"In this paper, the genetic algorithm is introduced into parameter optimization for MOSFET small-signal model parameter extraction for up to 60 GHz millimeter-wave operations. Initial parameters of the model are extracted by curve fitting and direct parameter extraction method in saturation region approximately, and then fourteen independent parameters of the equivalent circuit model are optimized together. The real and imaginary part of S-parameter are set as the fitting targets simultaneously in this study. With the more convenient genetic algorithm, the model with the optimized parameters gives a better fitting accuracy than the initial parameters without optimization.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"63 10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116444098","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Thermal Management for Future Wrist Wearable Devices 未来手腕可穿戴设备的热管理
Koudai Matsuhashi, A. Kurokawa
{"title":"Thermal Management for Future Wrist Wearable Devices","authors":"Koudai Matsuhashi, A. Kurokawa","doi":"10.1109/ICAM.2018.8596457","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596457","url":null,"abstract":"Wearable devices are evolving at a rapid pace. Many researchers are studying wireless power transfer technologies. Functions beyond current smartphone capabilities must be realized in wearable devices that are smaller than smartphones. Heat due to power consumption causes both circuit malfunctions and low-temperature burns to users. In this paper, we propose thermal management methods for future wrist wearable devices with higher performance. The methods include the reconstruction of a 3D IC, the heatspreader within a device, and the built-in heatspreader and surface fin heatsink of a belt. Our experiments with a FEM-based 3D thermal solver demonstrate that the new proposed methods can achieve 44.9% reduction in the gradient coefficients of °C /W.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126480699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Wireless Power Transfer System with Long Wired Repeater 带长有线中继器的无线电力传输系统
Motoki Ishizaki, A. Kurokawa
{"title":"Wireless Power Transfer System with Long Wired Repeater","authors":"Motoki Ishizaki, A. Kurokawa","doi":"10.1109/ICAM.2018.8596575","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596575","url":null,"abstract":"The magnetic resonant coupling wireless power transfer system (MRC- WPT) is a key technology for charging batteries anytime and anywhere. In this paper, we propose a novel power transfer system for enabling long distance transmission. It consists of a repeater connecting two coils by wiring, transmitter, and receiver. The system can not only send power far but enables free movement of the position of the receiver. Experiments demonstrate that the system can transmit power at further distances while maintaining high power transfer efficiency (PTE). Even with a length of 10 m between the two coils of the repeater, the system is as efficient as it is at a distance less than 1 m.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127290282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Modeling of Monolithic Spiral Inductors with Patterned Ground Shield for Si-Based RF IC's 硅基射频集成电路中带图像化接地屏蔽的单片螺旋电感的建模
Xiangliang Jin, Yongfeng Sun, Xiao Xiao
{"title":"Modeling of Monolithic Spiral Inductors with Patterned Ground Shield for Si-Based RF IC's","authors":"Xiangliang Jin, Yongfeng Sun, Xiao Xiao","doi":"10.1109/ICAM.2018.8596564","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596564","url":null,"abstract":"An improved single-π equivalent circuit model with patterned ground shield is presented in this paper. The monolithic spiral inductor uses metal 1 and metal 2 as a ground shield which forms a good isolation between substrate and passive device at the high frequency. To accurate model for spiral inductor under the high frequency, a parallel L-R network is adopted to represent the high-order effects. A C-L-R network to model the ground loop in the lower metal strips. Within the wide bandwidth, the modeling and parameter extraction methods have been validated by the excellent agreement between the circuit model and EM-simulation up to 40GHz.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129318755","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Calibration Mechanism for Input/Output Termination Resistance in 28nm CMOS 28nm CMOS输入/输出端电阻校准机制
Zhanke Yan, Chunming Zhang, Menghai Wang, Yuan Cao
{"title":"Calibration Mechanism for Input/Output Termination Resistance in 28nm CMOS","authors":"Zhanke Yan, Chunming Zhang, Menghai Wang, Yuan Cao","doi":"10.1109/ICAM.2018.8596450","DOIUrl":"https://doi.org/10.1109/ICAM.2018.8596450","url":null,"abstract":"This paper presents a method of receiver and transmitter input/output resistance calibration in UMC 28nm CMOS process. Designed and verified in Cadence IC615, the actual calibration resistance of the simulation (approximately 200Ω, which is four times the impedance of the transmission line) with high robustness under all PVT conditions, and the maximum deviation is 0.85%. The proposed calibration mechanism can be applied to high-speed interface circuits such as LVDS, LVPECL, CML, etc.","PeriodicalId":220324,"journal":{"name":"2018 IEEE 3rd International Conference on Integrated Circuits and Microsystems (ICICM)","volume":"175 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133122448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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