发布求助
文献互助 智能选刊 最新文献

Surface Science Spectra最新文献

筛选
英文 中文
Platinum thin film by Ag Lα, hard x-ray photoelectron spectroscopy 用Ag Lα，硬x射线光电子能谱研究铂薄膜
IF 1.3
Surface Science Spectra Pub Date : 2023-08-10 DOI: 10.1116/6.0002800
Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina
{"title":"Platinum thin film by Ag Lα, hard x-ray photoelectron spectroscopy","authors":"Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina","doi":"10.1116/6.0002800","DOIUrl":"https://doi.org/10.1116/6.0002800","url":null,"abstract":"Pt thin film was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.3 eV) excitation source. Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. The survey spectrum, Pt 3d, Pt 4f, Pt 4d, C 1s, and valence band core levels spectra were acquired.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48884323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk aluminum 高能x射线光电子能谱(HAXPES)测量大块铝的Cr Kα
IF 1.3
Surface Science Spectra Pub Date : 2023-08-09 DOI: 10.1116/6.0002696
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
{"title":"High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk aluminum","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002696","DOIUrl":"https://doi.org/10.1116/6.0002696","url":null,"abstract":"Aluminum was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Al obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Al 1s, Al 2s and Al 2p.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43076492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk Ag 高能x射线光电子能谱(HAXPES) Cr Kα测量大块银
IF 1.3
Surface Science Spectra Pub Date : 2023-08-09 DOI: 10.1116/6.0002672
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
{"title":"High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk Ag","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002672","DOIUrl":"https://doi.org/10.1116/6.0002672","url":null,"abstract":"Silver was analyzed using high-resolution high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Ag obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Ag 3d, Ag 3p3/2, Ag 3s; Ag 2p3/2, Ag 2s.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47208133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES reference spectra of Au and Pt with Cr Kα excitation Cr Kα激发下Au和Pt的HAXPES参考光谱
IF 1.3
Surface Science Spectra Pub Date : 2023-08-02 DOI: 10.1116/6.0002592
Dong Zheng, C. N. Young, W. Stickle
{"title":"HAXPES reference spectra of Au and Pt with Cr Kα excitation","authors":"Dong Zheng, C. N. Young, W. Stickle","doi":"10.1116/6.0002592","DOIUrl":"https://doi.org/10.1116/6.0002592","url":null,"abstract":"Hard X-ray Photoelectron Spectroscopy (HAXPES) with monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered Au and Pt samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of the observed Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46759373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
XPS characterization of cobalt nitrate 硝酸钴的XPS表征
IF 1.3
Surface Science Spectra Pub Date : 2023-07-14 DOI: 10.1116/6.0002667
Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina
{"title":"XPS characterization of cobalt nitrate","authors":"Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina","doi":"10.1116/6.0002667","DOIUrl":"https://doi.org/10.1116/6.0002667","url":null,"abstract":"X-ray photoelectron spectroscopy was used to characterize cobalt nitrate. The specimen is a powder purchased from Sigma Aldrich and was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra and Co 2p, N 1s, O 1s, C 1s, and Co 3p core level spectra were acquired. Results evidenced the chemical surface state and interactions of elements that constitute the cobalt nitrate.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45798483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES reference spectra of Si, SiO2, SiN, SiC, and poly(dimethyl siloxane) with Cr Kα excitation Cr Kα激发下Si, SiO2, SiN, SiC和聚二甲基硅氧烷的HAXPES参考光谱
IF 1.3
Surface Science Spectra Pub Date : 2023-07-06 DOI: 10.1116/6.0002660
Dong Zheng, C. N. Young, W. Stickle
{"title":"HAXPES reference spectra of Si, SiO2, SiN, SiC, and poly(dimethyl siloxane) with Cr Kα excitation","authors":"Dong Zheng, C. N. Young, W. Stickle","doi":"10.1116/6.0002660","DOIUrl":"https://doi.org/10.1116/6.0002660","url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on silicon, silicon dioxide, silicon nitride, silicon carbide, and poly(dimethyl siloxane) samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47855331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES reference spectra of Ta and Ta2O5 with Cr Kα excitation Cr Kα激发下Ta和Ta2O5的HAXPES参考光谱
IF 1.3
Surface Science Spectra Pub Date : 2023-07-06 DOI: 10.1116/6.0002551
Dong Zheng, C. N. Young, W. Stickle
{"title":"HAXPES reference spectra of Ta and Ta2O5 with Cr Kα excitation","authors":"Dong Zheng, C. N. Young, W. Stickle","doi":"10.1116/6.0002551","DOIUrl":"https://doi.org/10.1116/6.0002551","url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered Ta and Ta2O5 samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"71 4","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41288750","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES reference spectra of Pd with Cr Kα excitation Cr Kα激发下Pd的HAXPES参考光谱
Surface Science Spectra Pub Date : 2023-06-01 DOI: 10.1116/6.0002527
Dong Zheng, Christopher N. Young, William F. Stickle
{"title":"HAXPES reference spectra of Pd with Cr Kα excitation","authors":"Dong Zheng, Christopher N. Young, William F. Stickle","doi":"10.1116/6.0002527","DOIUrl":"https://doi.org/10.1116/6.0002527","url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Pd sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136170504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Indium acetate analyzed by XPS 用XPS分析乙酸铟
IF 1.3
Surface Science Spectra Pub Date : 2023-06-01 DOI: 10.1116/6.0002596
J. Rodríguez-Pereira, David Alejandro Miranda Mercado, R. Ospina
{"title":"Indium acetate analyzed by XPS","authors":"J. Rodríguez-Pereira, David Alejandro Miranda Mercado, R. Ospina","doi":"10.1116/6.0002596","DOIUrl":"https://doi.org/10.1116/6.0002596","url":null,"abstract":"Indium acetate was analyzed using x-ray photoelectron spectroscopy. The specimen is a powder purchased from Sigma Aldrich. The sample was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra, In 3d, O 1s, C 1s, In 3p, In MNN, and Cl 2p core levels spectra were acquired. Results showed how the elements in the structure of indium acetate are related.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47371112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Optical properties of pulsed dc magnetron sputtered thin film tantalum nitride by spectroscopic ellipsometry 脉冲直流磁控溅射氮化钽薄膜的光学特性
IF 1.3
Surface Science Spectra Pub Date : 2023-06-01 DOI: 10.1116/6.0002441
Bishal Shrestha, S. Jaszewski, J. Ihlefeld, S. Wolfley, M. David Henry, N. Podraza
{"title":"Optical properties of pulsed dc magnetron sputtered thin film tantalum nitride by spectroscopic ellipsometry","authors":"Bishal Shrestha, S. Jaszewski, J. Ihlefeld, S. Wolfley, M. David Henry, N. Podraza","doi":"10.1116/6.0002441","DOIUrl":"https://doi.org/10.1116/6.0002441","url":null,"abstract":"Ellipsometric spectra of polycrystalline thin film tantalum nitride (TaN) have been collected and analyzed to obtain the complex dielectric function (ɛ = ɛ1 + iɛ2) and complex refractive index (N = n + ik) spectra over the photon energy range of 0.059–8.500 eV. Complex optical properties are obtained for TaN in the as-deposited state and rapid thermal annealed at 750 °C for 30 s post deposition. A parametric expression including the contribution from intraband and interband transitions along with a structural model is used and fitted to experimental ellipsometric spectra using iterative least-square regression, which minimizes the unweighted error function or mean square error to extract complex optical properties. The parametric expression developed in this work is successful in describing and differentiating the optical response of measured as-deposited and annealed TaN films and can potentially be used to analyze the optical properties of similar TaN films regardless of their deposition techniques.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48076473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信