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Cluster Mo2C deposited on graphene nanowalls by x-ray photoelectron spectroscopy 通过 X 射线光电子能谱研究沉积在石墨烯纳米壁上的簇状 Mo2C
IF 1.3
Surface Science Spectra Pub Date : 2024-01-08 DOI: 10.1116/6.0003125
S. Chaitoglou, Rogelio Ospina, E. Bertran-Serra
{"title":"Cluster Mo2C deposited on graphene nanowalls by x-ray photoelectron spectroscopy","authors":"S. Chaitoglou, Rogelio Ospina, E. Bertran-Serra","doi":"10.1116/6.0003125","DOIUrl":"https://doi.org/10.1116/6.0003125","url":null,"abstract":"Molybdenum deposited on carbon graphene nanowalls was characterized by x-ray photoelectron spectroscopy with an Al Kα (1486.6 eV) excitation source. The sample was fixed to a stainless-steel sample holder with copper double-sided adhesive tape. Survey spectrum, C 1s, O 1s, Si 2p, and Mo 3d core levels spectra were acquired.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"13 1","pages":""},"PeriodicalIF":1.3,"publicationDate":"2024-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139445789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES Cr Kα measurement of bulk germanium 块状锗的 HAXPES Cr Kα 测量
IF 1.3
Surface Science Spectra Pub Date : 2023-12-01 DOI: 10.1116/6.0003154
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
{"title":"HAXPES Cr Kα measurement of bulk germanium","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0003154","DOIUrl":"https://doi.org/10.1116/6.0003154","url":null,"abstract":"Bulk germanium was analyzed using high-resolution high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of germanium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Ge 2s, Ge 2p3/2, Ge 3s, Ge 3p, and Ge 3d.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"776 ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139022736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES Cr Kα measurement of bulk indium 块状铟的 HAXPES Cr Kα 测量
IF 1.3
Surface Science Spectra Pub Date : 2023-12-01 DOI: 10.1116/6.0003161
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
{"title":"HAXPES Cr Kα measurement of bulk indium","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0003161","DOIUrl":"https://doi.org/10.1116/6.0003161","url":null,"abstract":"Indium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of indium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of In 2s, In 2p3/2, In 3s, In 3p3/2, In 3d, In 4s, and In 4d.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"41 2","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138992826","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk gadolinium 高能 X 射线光电子能谱 Cr Kα 测量块状钆
IF 1.3
Surface Science Spectra Pub Date : 2023-12-01 DOI: 10.1116/6.0003116
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
{"title":"High energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk gadolinium","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0003116","DOIUrl":"https://doi.org/10.1116/6.0003116","url":null,"abstract":"Gadolinium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of gadolinium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Gd 3s, Gd 3p, Gd 3d, Gd 4s, Gd 4p, and Gd 4d.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"42 3","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138988823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES Cr Kα measurement of bulk hafnium 块状铪的 HAXPES Cr Kα 测量
IF 1.3
Surface Science Spectra Pub Date : 2023-12-01 DOI: 10.1116/6.0003155
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
{"title":"HAXPES Cr Kα measurement of bulk hafnium","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0003155","DOIUrl":"https://doi.org/10.1116/6.0003155","url":null,"abstract":"Hafnium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Hafnium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Hf 3s, Hf 3p3/2, Hf 3d5/2, Hf 4p3/2, Hf 4d, and Hf 4f.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" 12","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138616833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of copper metal with a K-Alpha instrument from Thermo Scientific by XPS at 60 and 200 eV pass energy 使用 Thermo Scientific 公司的 K-Alpha 仪器，在 60 和 200 eV 的通过能量下通过 XPS 分析金属铜
IF 1.3
Surface Science Spectra Pub Date : 2023-12-01 DOI: 10.1116/6.0002958
Annika M. Dean, Samira Jafari, M. Linford
{"title":"Analysis of copper metal with a K-Alpha instrument from Thermo Scientific by XPS at 60 and 200 eV pass energy","authors":"Annika M. Dean, Samira Jafari, M. Linford","doi":"10.1116/6.0002958","DOIUrl":"https://doi.org/10.1116/6.0002958","url":null,"abstract":"Copper metal was analyzed by x-ray photoelectron spectroscopy (XPS) using a K-Alpha instrument from Thermo Scientific that employed an Al K-alpha x-ray source (1486.6 eV). The sample was the copper standard on the instrument sample stage that was sputtered with Ar+ to remove its oxide layer and hydrocarbon contamination. Shown in this work are the survey spectrum and high-resolution Cu 2p, Cu L3M45M45, Cu 3s, Cu 3p, O 1s, C 1s, and Ar 2p narrow scans. Narrow and survey scans were collected at 60 and 200 eV pass energy, respectively.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"90 1","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139192694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES reference spectra of bulk W and WSe2 with Cr Kα excitation 使用 Cr Kα 激发的块状 W 和 WSe2 的 HAXPES 参考光谱
IF 1.3
Surface Science Spectra Pub Date : 2023-11-27 DOI: 10.1116/6.0003124
Pierre-Marie Deleuze, N. Gauthier, K. Artyushkova, E. Martinez, Olivier Renault
{"title":"HAXPES reference spectra of bulk W and WSe2 with Cr Kα excitation","authors":"Pierre-Marie Deleuze, N. Gauthier, K. Artyushkova, E. Martinez, Olivier Renault","doi":"10.1116/6.0003124","DOIUrl":"https://doi.org/10.1116/6.0003124","url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) was used to acquire high-energy photoelectron spectroscopy data on pure W and bulk WSe2 compound. The reported spectra include a survey scan and high-resolution W 3p1/2, W 3p3/2, W 3d3/2, W 3d5/2, W 4s, W 4p1/2, W 4p3/2, W 4d, W 4f, Se 2s, Se 2p1/2, Se 2p3/2, Se 3s, and Se 3p core-levels. The data will be useful as reference core-level spectra for HAXPES studies on tungsten and its compounds.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"26 1","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139230301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
XPS study of NiO thin films obtained by chemical vapor deposition 化学气相沉积法获得的氧化镍薄膜的 XPS 研究
IF 1.3
Surface Science Spectra Pub Date : 2023-11-16 DOI: 10.1116/6.0003008
Gioele Pagot, M. Benedet, C. Maccato, D. Barreca, V. Di Noto
{"title":"XPS study of NiO thin films obtained by chemical vapor deposition","authors":"Gioele Pagot, M. Benedet, C. Maccato, D. Barreca, V. Di Noto","doi":"10.1116/6.0003008","DOIUrl":"https://doi.org/10.1116/6.0003008","url":null,"abstract":"Nickel oxide (NiO) thin films are of great importance for a variety of technological applications, especially in (photo)electrocatalysis for clean energy production and pollutant degradation. In this field, various research efforts are devoted to the preparation of thin films with controllable chemicophysical properties. In the framework of our research activities, we have recently fabricated NiO thin films by means of chemical vapor deposition (CVD) using a series of closely related Ni(II) β-diketonate-diamine molecular precursors. In the present work, the attention is focused on the x-ray photoelectron spectroscopy (XPS) analysis of a representative NiO film grown at 400 °C in an O2 + H2O reaction atmosphere. Besides the wide scan spectrum, high resolution spectra for C 1s, O 1s, and, in particular, Ni 2p are reported and discussed in detail.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"23 2","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139267152","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
HAXPES reference spectra of KI with Cr Kα excitation KI 在 Cr Kα 激发下的 HAXPES 参考光谱
IF 1.3
Surface Science Spectra Pub Date : 2023-11-15 DOI: 10.1116/6.0003110
Dong Zheng, Christopher N. Young, W. Stickle
{"title":"HAXPES reference spectra of KI with Cr Kα excitation","authors":"Dong Zheng, Christopher N. Young, W. Stickle","doi":"10.1116/6.0003110","DOIUrl":"https://doi.org/10.1116/6.0003110","url":null,"abstract":"Hard X-ray Photoelectron Spectroscopy (HAXPES) using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered potassium iodide (KI) sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"12 3","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139273517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ZnO by Ag Lα, hard x-ray photoelectron spectroscopy 氧化锌与 Ag Lα、硬 X 射线光电子能谱的关系
IF 1.3
Surface Science Spectra Pub Date : 2023-11-15 DOI: 10.1116/6.0003126
Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, Rogelio Ospina
{"title":"ZnO by Ag Lα, hard x-ray photoelectron spectroscopy","authors":"Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, Rogelio Ospina","doi":"10.1116/6.0003126","DOIUrl":"https://doi.org/10.1116/6.0003126","url":null,"abstract":"Zinc oxide powder was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.2 eV) excitation source. The sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. Survey spectrum, C 1s, O 1s, Zn 2p, and Zn LMM core levels’ spectra were acquired.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"33 3","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139271883","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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