Dong Zheng, Christopher N. Young, William F. Stickle
{"title":"Hard x-ray photoelectron spectroscopy reference spectra of Ti and TiO2 with Cr Kα excitation","authors":"Dong Zheng, Christopher N. Young, William F. Stickle","doi":"10.1116/6.0002991","DOIUrl":"https://doi.org/10.1116/6.0002991","url":null,"abstract":"Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on pure titanium and titanium dioxide samples. Survey data, extended range high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"2 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136262017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sergio A. Rincón-Ortiz, Jorge H. Quintero-Orozco, Rogelio Ospina
{"title":"Ammonium perrhenate characterized by XPS","authors":"Sergio A. Rincón-Ortiz, Jorge H. Quintero-Orozco, Rogelio Ospina","doi":"10.1116/6.0002929","DOIUrl":"https://doi.org/10.1116/6.0002929","url":null,"abstract":"Ammonium perrhenate was characterized using x-ray photoelectron spectroscopy. The specimen is a powder purchased from Sigma Aldrich. The sample was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra, Re 4f, O 1s, N 1s, C 1s, Re 4d, and Na 1s core levels spectra were acquired. Results showed how the elements in the structure of ammonium perrhenate are related.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"35 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136262686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Dong Zheng, Christopher N. Young, William F. Stickle
{"title":"Hard x-ray photoelectron spectroscopy reference spectra of Pb with Cr Kα excitation","authors":"Dong Zheng, Christopher N. Young, William F. Stickle","doi":"10.1116/6.0002990","DOIUrl":"https://doi.org/10.1116/6.0002990","url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a lead sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"65 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136262688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Dong Zheng, Christopher N. Young, William F. Stickle
{"title":"Hard x-ray photoelectron spectroscopy reference spectra of Bi with Cr <i>Kα</i> excitation","authors":"Dong Zheng, Christopher N. Young, William F. Stickle","doi":"10.1116/6.0002961","DOIUrl":"https://doi.org/10.1116/6.0002961","url":null,"abstract":"Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Bi sample. Survey data, high-resolution scans of observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"279 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136261707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mattia Benedet, Davide Barreca, Gian Andrea Rizzi, Chiara Maccato, Jan-Lucas Wree, Anjana Devi, Alberto Gasparotto
{"title":"Fe2O3-graphitic carbon nitride nanocomposites analyzed by XPS","authors":"Mattia Benedet, Davide Barreca, Gian Andrea Rizzi, Chiara Maccato, Jan-Lucas Wree, Anjana Devi, Alberto Gasparotto","doi":"10.1116/6.0002979","DOIUrl":"https://doi.org/10.1116/6.0002979","url":null,"abstract":"Nanocomposite systems based on iron(III) oxide (Fe2O3) and graphitic carbon nitride (gCN) possess a great potential as photo(electro)catalysts for environmental remediation and energy generation. In this field, a key issue is the fabrication of supported materials directly grown onto suitable substrates and possessing tailored features. In the present study, Fe2O3–gCN nanomaterials are prepared by an innovative two-step strategy, consisting of initial plasma assisted-chemical vapor deposition of iron(III) oxide on conducting glass substrates and subsequent functionalization with low amounts of gCN by a facile electrophoretic deposition process. Attention is dedicated to the use of two different forms of carbon nitride, obtained from melamine or melamine + cyanuric acid, in order to finely tune the resulting material composition. In this work, x-ray photoelectron spectroscopy was used to characterize the pristine Fe2O3 deposit as well as two Fe2O3–gCN composite materials prepared starting from different gCN powders. A detailed analysis of the obtained spectroscopic data reveals the occurrence of a direct electronic interplay between single constituents, dependent on material characteristics. The related results may act as useful guidelines for the design of photo(electro)catalysts endowed with specific properties, of importance for sustainable applications.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"2002 34","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135413207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sergio A. Rincón-Ortiz, Fernando Mesa, Rogelio Ospina
{"title":"Paracetamol tablet analyzed by XPS","authors":"Sergio A. Rincón-Ortiz, Fernando Mesa, Rogelio Ospina","doi":"10.1116/6.0002819","DOIUrl":"https://doi.org/10.1116/6.0002819","url":null,"abstract":"Paracetamol tablet was analyzed by x-ray photoelectron spectroscopy (XPS). Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. Survey spectra, C 1s, O 1s, N 1s, Si 2p, Mg 2s, Mg KLL, and Mg 1s core levels spectra were acquired. Results showed the presence of carbon, oxygen, and nitrogen, elements that constitute the chemical structure of paracetamol; however, these can also be part of the excipients. In addition, silicon and magnesium were detected, which are related to excipients.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135617199","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Brian Butkus, Alexandros Kostogiannes, A. Howe, Myungkoo Kang, Romain Gaume, K. A. Richardson, Parag Banerjee
{"title":"Zinc sulfide chemical vapor deposition optical ceramic analyzed by XPS","authors":"Brian Butkus, Alexandros Kostogiannes, A. Howe, Myungkoo Kang, Romain Gaume, K. A. Richardson, Parag Banerjee","doi":"10.1116/6.0002777","DOIUrl":"https://doi.org/10.1116/6.0002777","url":null,"abstract":"Commercially available zinc sulfide (ZnS) ceramics, synthesized using chemical vapor deposition and subsequently hot isostatically pressed, are optically transparent as compared to other zinc sulfide chemical vapor deposited films and ceramics. The unique optical transparency along with the hardness and chemical resistance of ZnS makes it an important material for infrared transmission applications. X-ray photoelectron spectroscopy and x-ray induced Auger electron spectroscopy were performed on an optically transparent ZnS ceramic. This report includes charge corrected scans for the survey along with S 2s, S 2p, S LMM, Zn 2p, Zn 2s, Zn 3d, Zn 3p, Zn 3s, Zn LMM, O 1s, and C 1s surface photoelectron signals. The scans provide photoelectron spectroscopy investigation data to help with the identification of metal sulfide compounds.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48919560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Benedet, A. Gasparotto, G. Rizzi, C. Maccato, D. Mariotti, R. McGlynn, D. Barreca
{"title":"XPS investigation of MnO2 deposits functionalized with graphitic carbon nitride","authors":"M. Benedet, A. Gasparotto, G. Rizzi, C. Maccato, D. Mariotti, R. McGlynn, D. Barreca","doi":"10.1116/6.0002827","DOIUrl":"https://doi.org/10.1116/6.0002827","url":null,"abstract":"Composite materials based on MnO2 deposits functionalized with graphitic carbon nitride (gCN) nanostructures are promising (photo)electrocatalysts for oxygen evolution reaction (OER). Besides the individual properties of the two electrode components, mutual interactions at their interface can also exert a significant influence on functional performances. In this work, MnO2 deposits are synthesized by plasma enhanced-chemical vapor deposition on Ni foam supports and subsequently decorated with two different forms of carbon nitride via electrophoretic deposition. Structural and morphological analyses revealed the formation of β-MnO2 2D structures hierarchically assembled into flowerlike architectures, whose surface appeared decorated by 3D particles built up from gCN nanoflakes. Based on the intimate contact between the two semiconductors, an effective electronic and chemical coupling was established at their interface. In the following, we report on a comparative XPS characterization of a bare MnO2 electrode material and of two MnO2-gCN composite systems prepared from different carbon nitride powders. Survey spectra as well as detailed scans for C 1s, N 1s, O 1s, and Mn 2p regions are presented and critically discussed.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47420827","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Bismuth, by high-sensitivity low energy ion scattering","authors":"E. Vaníčková, S. Průša, T. Šikola","doi":"10.1116/6.0002669","DOIUrl":"https://doi.org/10.1116/6.0002669","url":null,"abstract":"Low energy ion scattering is an analytical technique with extreme surface sensitivity. It enables qualitative and quantitative elemental analysis of the outermost atomic layer. Straightforward quantification is possible by using well-defined reference samples, as the measured signal is related to known surface atomic concentration. Bi, like Pb, exhibits strong oscillatory behavior of backscattered ion yield when primary ion beam energy is varied. Here, we present the spectra of bismuth obtained by scattering of 4He+ ions in a wide range of energies (0.5–6.0 keV). These should cover a regularly used range of energies for He analysis and serve as standards or reference spectra for analysis of bismuth if the scattering angle is 145° or similar. For this purpose, high-purity foil cleaned by ion sputtering was used. The sensitivity of the instrument in use (high-sensitivity low energy ion scattering spectrometer) is defined by the 3 keV 4He+ spectrum of copper. The related atomic sensitivity and relative sensitivity factors are determined.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45027716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optical functions of uniaxial zinc oxide (ZnO) revisited","authors":"G. Jellison","doi":"10.1116/6.0002859","DOIUrl":"https://doi.org/10.1116/6.0002859","url":null,"abstract":"The optical functions of uniaxial ZnO are determined from 200 to 850 nm (6.2–1.46 eV) using three different ellipsometric techniques: (1) standard spectroscopic two-modulator generalized ellipsometry (2-MGE), (2) transmission two-modulator generalized ellipsometry, and (3) near-normal incidence two modulator generalized ellipsometry microscopy (2-MGEM). The 2-MGE results in very accurate values of the dielectric functions and error estimates from 1.46 to 6.2 eV, while the transmission 2-MGE results in more accurate values of the birefringence and associated errors below the band edge where ZnO is transparent. The 2-MGEM also measures the diattenuation (which is related to the birefringence) and other parameters, but at near-normal incidence at a single wavelength (577 nm). The 2-MGEM is designed as a scanning instrument resulting in these parameters being measured over a surface.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":" ","pages":""},"PeriodicalIF":1.3,"publicationDate":"2023-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46977257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}