Cr Kα激发下Ti和TiO2的硬x射线光电子能谱参考谱

IF 1.6 Q3 PHYSICS, CONDENSED MATTER
Dong Zheng, Christopher N. Young, William F. Stickle
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引用次数: 0

摘要

采用单色Cr Kα辐射(5414.8 eV)的硬x射线光电子能谱,对纯钛和二氧化钛样品进行了XPS和俄歇数据采集。本文介绍了调查数据,所有观测到的光电子峰的扩展范围高分辨率扫描,以及俄歇线的高分辨率扫描。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Hard x-ray photoelectron spectroscopy reference spectra of Ti and TiO2 with Cr Kα excitation
Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on pure titanium and titanium dioxide samples. Survey data, extended range high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
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来源期刊
Surface Science Spectra
Surface Science Spectra PHYSICS, CONDENSED MATTER-
CiteScore
1.90
自引率
7.70%
发文量
36
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