Hard x-ray photoelectron spectroscopy reference spectra of Bi with Cr Kα excitation

Abstract

Hard x-ray photoelectron spectroscopy using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Bi sample. Survey data, high-resolution scans of observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.