Platinum thin film by Ag Lα, hard x-ray photoelectron spectroscopy

IF 1.6 Q3 PHYSICS, CONDENSED MATTER

Surface Science Spectra Pub Date : 2023-08-10 DOI:10.1116/6.0002800

Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina

引用次数: 0

Abstract

Pt thin film was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.3 eV) excitation source. Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. The survey spectrum, Pt 3d, Pt 4f, Pt 4d, C 1s, and valence band core levels spectra were acquired.

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用Ag Lα，硬x射线光电子能谱研究铂薄膜

用硬x射线光电子能谱（HAXPES）对Pt薄膜进行了表征 eV）激发源。用铜双面胶带将样品固定在不锈钢样品支架上。获得了探测光谱、Pt3d、Pt4f、Pt4d、C1s和价带核能级谱。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Surface Science Spectra PHYSICS, CONDENSED MATTER-

CiteScore

1.90

自引率

7.70%

发文量