2023 IEEE European Test Symposium (ETS)最新文献_第4页

A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors RISC-V处理器的可测试性、安全性和保密性研究进展综述

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ETS56758.2023.10174099

J. Anders, Pablo Andreu, B. Becker, S. Becker, R. Cantoro, N. I. Deligiannis, N. Elhamawy, Tobias Faller, Carles Hernández, N. Mentens, Mahnaz Namazi Rizi, I. Polian, Abolfazl Sajadi, Mathias Sauer, Denis Schwachhofer, M. Reorda, T. Stefanov, I. Tuzov, S. Wagner, N. Zidarič

{"title":"A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors","authors":"J. Anders, Pablo Andreu, B. Becker, S. Becker, R. Cantoro, N. I. Deligiannis, N. Elhamawy, Tobias Faller, Carles Hernández, N. Mentens, Mahnaz Namazi Rizi, I. Polian, Abolfazl Sajadi, Mathias Sauer, Denis Schwachhofer, M. Reorda, T. Stefanov, I. Tuzov, S. Wagner, N. Zidarič","doi":"10.1109/ETS56758.2023.10174099","DOIUrl":"https://doi.org/10.1109/ETS56758.2023.10174099","url":null,"abstract":"With the continued success of the open RISC-V architecture, practical deployment of RISC-V processors necessitates an in-depth consideration of their testability, safety and security aspects. This survey provides an overview of recent developments in this quickly-evolving field. We start with discussing the application of state-of-the-art functional and system-level test solutions to RISC-V processors. Then, we discuss the use of RISC-V processors for safety-related applications; to this end, we outline the essential techniques necessary to obtain safety both in the functional and in the timing domain and review recent processor designs with safety features. Finally, we survey the different aspects of security with respect to RISC-V implementations and discuss the relationship between cryptographic protocols and primitives on the one hand and the RISC-V processor architecture and hardware implementation on the other. We also comment on the role of a RISC-V processor for system security and its resilience against side-channel attacks.","PeriodicalId":211522,"journal":{"name":"2023 IEEE European Test Symposium (ETS)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130547611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Silicon Lifecycle Redefines Design for Test 硅生命周期重新定义了为测试而设计

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ets56758.2023.10174027

引用次数: 0

SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks 科幻:用于深度神经网络的智能、准确和非侵入式故障注入器

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ETS56758.2023.10173957

G. Gavarini, A. Ruospo, Ernesto Sánchez

{"title":"SCI-FI: a Smart, aCcurate and unIntrusive Fault-Injector for Deep Neural Networks","authors":"G. Gavarini, A. Ruospo, Ernesto Sánchez","doi":"10.1109/ETS56758.2023.10173957","DOIUrl":"https://doi.org/10.1109/ETS56758.2023.10173957","url":null,"abstract":"In recent years, the reliability of Deep Neural Networks (DNN) has become the focus of an increasing number of research activities. In particular, researchers have focused on understanding how a DNN behaves when the underlying hardware is affected by a fault. This is a challenging task: slight changes in a network architecture can significantly impact how the network reacts to faults. There are several approaches to simulate the behaviour of a faulty network: the most accurate one is to perform low-level fault simulations. Nonetheless, this task is very time-consuming and costly to be implemented. Even though the injection time can be reduced by injecting faults at the application level, for sufficiently large networks, this time is still very high, requiring weeks to complete a single simulation. This work aims at providing a fast and accurate solution for injecting software-level faults in a DNN that is independent of its architecture and does not require any modification to its structure. For this reason, this paper introduces SCI-FI, a Smart, aCcurate and unIntrusive Fault-Injector. SCI-FI smartly reduces the fault injection time required for a complete fault simulation of the network by taking advantage of two fundamental mechanisms: Fault Dropping and Delayed Start. Experimental results from various ResNet, DenseNet and EfficientNet architectures targeting the CIFAR-10 and ImageNet datasets show that combining these techniques drastically reduces the simulation time, which can last up to 70% less.","PeriodicalId":211522,"journal":{"name":"2023 IEEE European Test Symposium (ETS)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130381126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

ETS 2023 Distinguished Service Award ETS 2023杰出服务奖

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ets56758.2023.10174184

引用次数: 0

Mismatch Measurement for MIMO mm-Wave Radars via Simple Power Monitors 基于简单功率监视器的MIMO毫米波雷达失配测量

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ETS56758.2023.10173976

Ferhat Can Ataman, Mohammad Aladsani, G. Trichopoulos, Chethan Kumar Y.B., S. Ozev

引用次数: 0

Stimuli Generation for IC Design Verification using Reinforcement Learning with an Actor-Critic Model 基于Actor-Critic模型的强化学习的IC设计验证刺激生成

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ETS56758.2023.10174129

S. L. Tweehuysen, G. Adriaans, M. Gomony

引用次数: 0

ETS 2023 Blank Page ETS 2023空白页

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ets56758.2023.10174019

引用次数: 0

ETS 2023 Steering and Program Committees ETS 2023指导和项目委员会

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ets56758.2023.10174193

引用次数: 0

A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks RRAM脉冲神经网络中突触权重误差和触发阈值扰动的弹性框架

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ETS56758.2023.10174229

Anurup Saha, C. Amarnath, A. Chatterjee

{"title":"A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks","authors":"Anurup Saha, C. Amarnath, A. Chatterjee","doi":"10.1109/ETS56758.2023.10174229","DOIUrl":"https://doi.org/10.1109/ETS56758.2023.10174229","url":null,"abstract":"Spiking Neural Networks (SNNs) can be implemented with power-efficient digital as well as analog circuitry. However, in Resistive RAM (RRAM) based SNN accelerators, synapse weights programmed into the crossbar can differ from their ideal values due to defects and programming errors, degrading inference accuracy. In addition, circuit nonidealities within analog spiking neurons that alter the neuron spiking rate (modeled by variations in neuron firing threshold) can degrade SNN inference accuracy when the value of inference time steps (ITSteps) of SNN is set to a critical minimum that maximizes network throughput. We first develop a recursive linearized check to detect synapse weight errors with high sensitivity. This triggers a correction methodology which sets out-of-range synapse values to zero. For correcting the effects of firing threshold variations, we develop a test methodology that calibrates the extent of such variations. This is then used to proportionally increase inference time steps during inference for chips with higher variation. Experiments on a variety of SNNs prove the viability of the proposed resilience methods.","PeriodicalId":211522,"journal":{"name":"2023 IEEE European Test Symposium (ETS)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115231886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

PULP Fiction No More—Dependable PULP Systems for Space 没有更可靠的太空纸浆系统了

2023 IEEE European Test Symposium (ETS) Pub Date : 2023-05-22 DOI: 10.1109/ETS56758.2023.10174164

Markus Ulbricht, Yvan Tortorella, Michael Rogenmoser, Li Lu, Junchao Chen, Francesco Conti, M. Krstic, L. Benini

引用次数: 0