Quality Engineering最新文献

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Verifying a dominant cause of output variation 验证输出变化的主要原因
4区 工程技术
Quality Engineering Pub Date : 2023-09-11 DOI: 10.1080/08982112.2023.2253303
Mahsa Panahi, Stefan H. Steiner, Jeroen De Mast
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引用次数: 0
Statistical process control (SPC) for double-bounded information: Choosing wisely the parametric family for unit data 双界信息的统计过程控制(SPC):明智地选择单位数据的参数族
4区 工程技术
Quality Engineering Pub Date : 2023-09-11 DOI: 10.1080/08982112.2023.2254843
Diego C. Nascimento, Oilson A. Gonzatto Junior, David Elal-Olivero, Estefania Bonnail, Paulo H. Ferreira
{"title":"Statistical process control (SPC) for double-bounded information: Choosing wisely the parametric family for unit data","authors":"Diego C. Nascimento, Oilson A. Gonzatto Junior, David Elal-Olivero, Estefania Bonnail, Paulo H. Ferreira","doi":"10.1080/08982112.2023.2254843","DOIUrl":"https://doi.org/10.1080/08982112.2023.2254843","url":null,"abstract":"This article presents a Statistical Process Control (SPC) framework considering the response process as a unit variable, which demands special treatment. This study designed a Shiny app related to data visualization and inferential estimation adopting SPC charts and Extreme Value Theory. We also proposed a new flexible unit probabilistic model (named FlexShape), which is simple yet overcomes skew information and bimodality in historical data, as part of the complex learning task. Results showed that the proposed framework enables it to handle unit data sets. As an example, we presented data storytelling from the water particle monitoring (relative humidity) from one Atacama Desert station, known to be one of the driest areas on Earth, across hidden patterns such as inundation and microweather. Finally, the developed framework makes possible any research on the univariate unit data decision-making, enabling the database import and adjusting some parametric models, and enabling the comparison of different units’ distribution goodness-of-fit.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135938868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Robust control chart based on mixed-effects modeling framework: A case study in NAND flash memory industry 基于混合效应建模框架的鲁棒控制图:以NAND闪存行业为例
IF 2 4区 工程技术
Quality Engineering Pub Date : 2023-09-08 DOI: 10.1080/08982112.2023.2251570
Daewon Yang, Jinsu Park, Hayang Park, Sungki Hong, Jongmin Kim, Seonghui Huh, Eunkyung Kim, Jaeyong Jeong, Yeonseung Chung
{"title":"Robust control chart based on mixed-effects modeling framework: A case study in NAND flash memory industry","authors":"Daewon Yang, Jinsu Park, Hayang Park, Sungki Hong, Jongmin Kim, Seonghui Huh, Eunkyung Kim, Jaeyong Jeong, Yeonseung Chung","doi":"10.1080/08982112.2023.2251570","DOIUrl":"https://doi.org/10.1080/08982112.2023.2251570","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43109618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Designing a variables two-plan sampling system with adjustable acceptance criteria for lot disposition 批量处理验收标准可调的变量双方案抽样系统的设计
IF 2 4区 工程技术
Quality Engineering Pub Date : 2023-09-05 DOI: 10.1080/08982112.2023.2251571
Chien-Wei Wu, Ming-Hung Shu, To‐Cheng Wang
{"title":"Designing a variables two-plan sampling system with adjustable acceptance criteria for lot disposition","authors":"Chien-Wei Wu, Ming-Hung Shu, To‐Cheng Wang","doi":"10.1080/08982112.2023.2251571","DOIUrl":"https://doi.org/10.1080/08982112.2023.2251571","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45113783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sequential Bayesian assurance tests for degradation data 退化数据的顺序贝叶斯保证测试
IF 2 4区 工程技术
Quality Engineering Pub Date : 2023-08-24 DOI: 10.1080/08982112.2023.2244588
K. J. Ryan, M. Hamada, John R. Twist
{"title":"Sequential Bayesian assurance tests for degradation data","authors":"K. J. Ryan, M. Hamada, John R. Twist","doi":"10.1080/08982112.2023.2244588","DOIUrl":"https://doi.org/10.1080/08982112.2023.2244588","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-08-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43246778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
First to signal criterion for comparing control chart performance 用于比较控制图性能的先到信号标准
IF 2 4区 工程技术
Quality Engineering Pub Date : 2023-08-14 DOI: 10.1080/08982112.2023.2223690
S. Rigdon, Nathaniel T. Stevens, James D. Wilson, W. Woodall
{"title":"First to signal criterion for comparing control chart performance","authors":"S. Rigdon, Nathaniel T. Stevens, James D. Wilson, W. Woodall","doi":"10.1080/08982112.2023.2223690","DOIUrl":"https://doi.org/10.1080/08982112.2023.2223690","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45878744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Redefining software reliability modeling: embracing fault-dependency, imperfect removal, and maximum fault considerations 重新定义软件可靠性建模:包含故障依赖、不完美移除和最大故障考虑
IF 2 4区 工程技术
Quality Engineering Pub Date : 2023-08-08 DOI: 10.1080/08982112.2023.2241067
Umashankar Samal, Ajay Mahaputra Kumar
{"title":"Redefining software reliability modeling: embracing fault-dependency, imperfect removal, and maximum fault considerations","authors":"Umashankar Samal, Ajay Mahaputra Kumar","doi":"10.1080/08982112.2023.2241067","DOIUrl":"https://doi.org/10.1080/08982112.2023.2241067","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46621178","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Hidden dimensions of the data: PCA vs autoencoders 隐藏的数据维度:PCA与自动编码器
IF 2 4区 工程技术
Quality Engineering Pub Date : 2023-07-31 DOI: 10.1080/08982112.2023.2231064
Davide Cacciarelli, M. Kulahci
{"title":"Hidden dimensions of the data: PCA vs autoencoders","authors":"Davide Cacciarelli, M. Kulahci","doi":"10.1080/08982112.2023.2231064","DOIUrl":"https://doi.org/10.1080/08982112.2023.2231064","url":null,"abstract":"Abstract Principal component analysis (PCA) has been a commonly used unsupervised learning method with broad applications in both descriptive and inferential analytics. It is widely used for representation learning to extract key features from a dataset and visualize them in a lower dimensional space. With more applications of neural network-based methods, autoencoders (AEs) have gained popularity for dimensionality reduction tasks. In this paper, we explore the intriguing relationship between PCA and AEs and demonstrate, through some examples, how these two approaches yield similar results in the case of the so-called linear AEs (LAEs). This study provides insights into the evolving landscape of unsupervised learning and highlights the relevance of both PCA and AEs in modern data analysis.","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"35 1","pages":"741 - 750"},"PeriodicalIF":2.0,"publicationDate":"2023-07-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46271328","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Monitoring univariate processes using control charts: Some practical issues and advice 使用控制图监测单变量过程:一些实际问题和建议
IF 2 4区 工程技术
Quality Engineering Pub Date : 2023-07-26 DOI: 10.1080/08982112.2023.2238049
I. Zwetsloot, L. A. Jones‐Farmer, W. Woodall
{"title":"Monitoring univariate processes using control charts: Some practical issues and advice","authors":"I. Zwetsloot, L. A. Jones‐Farmer, W. Woodall","doi":"10.1080/08982112.2023.2238049","DOIUrl":"https://doi.org/10.1080/08982112.2023.2238049","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"1 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"59458907","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Toward a concept of digital twin for monitoring assembly and disassembly processes 提出了一种用于监控装配和拆卸过程的数字孪生概念
IF 2 4区 工程技术
Quality Engineering Pub Date : 2023-07-26 DOI: 10.1080/08982112.2023.2234017
E. Verna, Stefano Puttero, G. Genta, M. Galetto
{"title":"Toward a concept of digital twin for monitoring assembly and disassembly processes","authors":"E. Verna, Stefano Puttero, G. Genta, M. Galetto","doi":"10.1080/08982112.2023.2234017","DOIUrl":"https://doi.org/10.1080/08982112.2023.2234017","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":" ","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41597887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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