Quality Engineering最新文献

{"title":"Probabilistic modeling of hardware and software interactions for system reliability assessment","authors":"Alex Davila-Frias, Nita Yodo, Om P. Yadav, Phattara Khumprom","doi":"10.1080/08982112.2023.2274563","DOIUrl":"https://doi.org/10.1080/08982112.2023.2274563","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"82 2","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139146697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Utilizing jackknife and bootstrap to understand tensile stress to failure of an epoxy resin","authors":"R. Caro-Carretero, A. Carnicero, J. Jiménez-Octavio, D. Cousineau","doi":"10.1080/08982112.2023.2286500","DOIUrl":"https://doi.org/10.1080/08982112.2023.2286500","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"58 9","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138979177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Mixed-type defect pattern recognition in noisy labeled wafer bin maps","authors":"Sumin Kim, Heeyoung Kim","doi":"10.1080/08982112.2023.2286502","DOIUrl":"https://doi.org/10.1080/08982112.2023.2286502","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"64 28","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-12-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138594909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Simultaneous classification and out-of-distribution detection for wafer bin maps","authors":"Jeongman Choi, Eun-Yeol Ma, Heeyoung Kim","doi":"10.1080/08982112.2023.2286497","DOIUrl":"https://doi.org/10.1080/08982112.2023.2286497","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"103 7","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138599759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Reliability evaluation of a novel metal oxide-aluminum glycerol film capacitor using nonlinear degradation modeling with dependency considerations","authors":"E. Okafor, Xin Wang, Bahktiyar Mohammed Nafis, Andrew Leda, David R. Huitink, Xiangbo Meng","doi":"10.1080/08982112.2023.2285298","DOIUrl":"https://doi.org/10.1080/08982112.2023.2285298","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"3 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139208541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A note on compositional data gauge R&R studies","authors":"M. Hamada","doi":"10.1080/08982112.2023.2276779","DOIUrl":"https://doi.org/10.1080/08982112.2023.2276779","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"29 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139270452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Joint component-system maintenance planning over entire system task profile","authors":"Yaning Sun, Xiaohong Wang, Lizhi Wang, Rong Pan","doi":"10.1080/08982112.2023.2279598","DOIUrl":"https://doi.org/10.1080/08982112.2023.2279598","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"PC-26 2","pages":""},"PeriodicalIF":2.0,"publicationDate":"2023-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139267832","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Statistical inference in Burr type XII lifetime model based on progressive randomly censored data","authors":"Rajni Goel, Kapil Kumar, Hon Keung Tony Ng, Indrajeet Kumar","doi":"10.1080/08982112.2023.2276771","DOIUrl":"https://doi.org/10.1080/08982112.2023.2276771","url":null,"abstract":"AbstractCensoring commonly occurs in real-world scenarios, either intentionally or unintentionally. Unintentional (or accidental) censoring usually happens randomly, i.e., it is out of the experimenters’ control, such as broken equipment, lack of follow-up, etc. Experimenters typically use intentional censoring to save experimental time and cost. In this article, we develop frequentist and Bayesian statistical inferential procedures for the parameters and reliability characteristics of the Burr type XII lifetime model under the Koziol-Green model based on progressive randomly censored data. For the frequentist approach, maximum likelihood methods for point and interval estimation are developed. For the Bayesian approach, the Bayes estimates under the squared error loss function (SELF) are evaluated using the Markov Chain Monte Carlo (MCMC) and Tierney-Kadane (T-K) approximation techniques. A Monte Carlo simulation study is used to assess the performance of the proposed estimation procedures. A real data analysis is performed to illustrate the proposed methods. Moreover, obtaining progressive censoring schemes for experimental planning purposes is also discussed.Keywords: Bayesian estimationKoziol-Green modelMarkov chain Monte Carlo methodmaximum likelihood estimationprogressively Type-II censoring AcknowledgementsThe authors would like to thank the guest editor and two anonymous reviewers for their positive remarks and useful comments.Disclosure statementNo potential conflict of interest was reported by the author(s).Additional informationNotes on contributorsRajni GoelDr. Rajni Goel is an assistant professor in the Department of Mathematics, Chandigarh University, Mohali, Punjab, India. She is M.Sc., M.Phil., and Ph. D. in Statistics. She has published Seven research papers in international journals. She is working in the field of Censoring in Survival analysis, Classical & Bayesian inference, and Computational Statistics.Kapil KumarDr. Kapil Kumar is an Associate Professor and Head of the Department of Statistics, Central University of Haryana, Mahendergarh, India. He received his Ph.D. in Statistics from Ch. Charan Singh University, Meerut, India in 2011. He has ab out 12 years of teaching experience. His areas of research are Reliability and Life Testing, Classical Estimation, Bayesian Estimation, Survival analysis and Censored data. He has published 30 research papers and has reviewed more than a hundred research papers for different journals.Hon Keung Tony NgHon Keung Tony Ng is a Professor at the Department of Mathematical Sciences, Bentley University, Waltham, MA, USA. He received a Ph.D. degree in mathematics from McMaster University, Hamilton, ON, Canada, in 2002. His research interests include reliability, censoring methodology, ordered data analysis, nonparametric methods, and statistical inference. Dr. Ng is an Associate Editor for Communications in Statistics, Computational Statistics, IEEE Transactions on Reliability, Journal of St","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"12 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135139458","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Cause-and-effect diagram-based supersaturated designs","authors":"Chang-Yun Lin","doi":"10.1080/08982112.2023.2269437","DOIUrl":"https://doi.org/10.1080/08982112.2023.2269437","url":null,"abstract":"","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"32 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134909310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A reliability prediction method considering degradation self-acceleration effect in DC-link electrolytic capacitor","authors":"Xuerong Ye, Qisen Sun, Ruishi Lin, Cen Chen, Min Xie, Guofu Zhai, Rui Kang","doi":"10.1080/08982112.2023.2268703","DOIUrl":"https://doi.org/10.1080/08982112.2023.2268703","url":null,"abstract":"AbstractThe reliability of DC-link electrolytic capacitors is crucial to ensure the quality of power supply systems. The degradation of capacitor parameters may lead to a higher temperature and thus accelerate degradation as a self-accelerating effect. In this article, an improved reliability prediction method for DC-link electrolytic capacitors is proposed, as existing methods have not adequately accounted for the self-acceleration effect. The degradation under dynamic stress is obtained by cumulative computations and the stress is updated according to the degraded parameters. The degradation models are converted into degradation rate models to overcome the computational challenges associated with small-step iterations that may make traditional methods unaffordable. The proposed method for developing the degradation rate model is widely applicable and achieves satisfactory accuracy. To demonstrate the practicality of the proposed method, a case study of a boost motor drive system is presented. The appropriate iteration step can be determined by comparing the results of the lifetime distributions obtained using different iteration steps. Degradation paths considering self-acceleration effects can be obtained, enabling more precise system quality analysis and reliability prediction.Keywords: degradation analysiselectrolytic capacitorreliability predictionself-acceleration effect Additional informationNotes on contributorsXuerong YeXuerong Ye is currently a Professor at the Department of Electrical Engineering, Harbin Institute of Technology. He received B.S., M.S., and Ph.D. degrees in electrical engineering from the Harbin Institute of Technology, China. His research interests include robust parameter design and reliability prediction.Qisen SunQisen Sun is a Ph.D. student in the Department of Systems Engineering at the City University of Hong Kong, Hong Kong, China. He received an M.S. degree in electrical engineering from the Harbin Institute of Technology, Harbin, China. His research interests include statistical engineering and reliability prediction.Ruishi LinRuishi Lin is the Deputy Chief Engineer of the Beijing Institute of Aerospace Automation, Beijing, China.Cen ChenCen Chen is currently an Associate Professor at the Department of Electrical Engineering, Harbin Institute of Technology. He received his B.S. and Ph.D. degrees in electrical engineering from the Harbin Institute of Technology, Harbin, China. His research interests include electronic system reliability prediction, fault diagnosis, and health management.Min XieMin Xie is a Chair Professor at the City University of Hong Kong. Before that, he was a Professor at the National University of Singapore. He received his undergraduate and postgraduate education in Sweden with a Ph.D. from Linkoping University in 1987. Prof Xie has published over 300 journal articles and eight books. Prof Xie has been an elected fellow of IEEE since 2006 and has been elected to the European Academy of Sc","PeriodicalId":20846,"journal":{"name":"Quality Engineering","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135729452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}