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Using physical parameters in predicting energy gain of CIGS PV modules 利用物理参数预测CIGS光伏组件的能量增益
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164152
B. Werner, W. Kolodenny, Mariusz Prorok
{"title":"Using physical parameters in predicting energy gain of CIGS PV modules","authors":"B. Werner, W. Kolodenny, Mariusz Prorok","doi":"10.1109/STYSW.2008.5164152","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164152","url":null,"abstract":"In previous works [1, 2] it was researched that the equivalent double diode model - DEM is appropriate to model Cu(InxGa1-x)Se2 (CIGS) photovoltaic (PV) modules. It was investigated with large amount of data (including current - voltage curves) collected during long-term monitoring of PV systems. Current work concentrates on applying physical parameters to model 2 of 5 DEM parameters: diffusion IS1 and recombination IS2 related components of dark diode saturation current. Modeled ISI and IS2 values replace previously approximated DEM parameters and are used to predict measured I-V curves in order to determine electrical parameters of the PV modules. The parameters are used to predict energy gain in natural working conditions. Results of modeling are presented and compared with measured data.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127820300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High resolution spectroscopy on optical signals in fiber communication systems 光纤通信系统中光信号的高分辨率光谱学
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164138
K. Lauterbach, R. Henker, M. Junker, A. Wiatrek, A.T. Schwarzbacher, M. Ammann, T. Schneider
{"title":"High resolution spectroscopy on optical signals in fiber communication systems","authors":"K. Lauterbach, R. Henker, M. Junker, A. Wiatrek, A.T. Schwarzbacher, M. Ammann, T. Schneider","doi":"10.1109/STYSW.2008.5164138","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164138","url":null,"abstract":"In this paper, we present Brillouin based optical spectrum analysis with 10 ms sweep time and 23 MHz resolution bandwidth in the optical C-Band. The proposed measurement method has the potential to reduce the sweep time and the resolution bandwidth.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123137860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Characterization of thin films based on TiO2 by XRD, AFM and XPS measurements TiO2薄膜的XRD, AFM和XPS表征
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164154
D. Wojcieszak, J. Domaradzki, D. Kaczmarek, B. Michalec
{"title":"Characterization of thin films based on TiO2 by XRD, AFM and XPS measurements","authors":"D. Wojcieszak, J. Domaradzki, D. Kaczmarek, B. Michalec","doi":"10.1109/STYSW.2008.5164154","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164154","url":null,"abstract":"In this paper nanocrystalline thin films of TiO2 doped with Tb have been investigated. Thin films were deposited on different (silicon and glass) substrates using modified magnetron sputtering method named High Energy. Structural properties were examined by X-Ray Diffraction (XRD) method. The results have shown, that phase and average crystallites size of prepared thin films were determined by the process parameters and the amount of Tb-dopant. Atomic Force Microscopy results confirmed XRD results and shown that examined thin films were nanocrystalline. Investigations performed by X-Ray Photoelectron Spectroscopy (XPS) method have shown that stoichiometric TiO2- matrix was obtained. The results also have revealed diversification of OH- absorption on sample surface depending on the structure and composition of the thin films.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116904881","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Properties of GaN layers deposited on (0001) sapphire templates 蓝宝石模板上沉积GaN层的性质
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164145
J. Prażmowska, R. Korbutowicz, R. Paszkiewicz, J. Serafińczuk, A. Podhorodecki, J. Misiewicz, J. Kovác, R. Srnánek, M. Tlaczala
{"title":"Properties of GaN layers deposited on (0001) sapphire templates","authors":"J. Prażmowska, R. Korbutowicz, R. Paszkiewicz, J. Serafińczuk, A. Podhorodecki, J. Misiewicz, J. Kovác, R. Srnánek, M. Tlaczala","doi":"10.1109/STYSW.2008.5164145","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164145","url":null,"abstract":"High temperature gallium nitride (HT-GaN) layers were grown by HVPE (hydride vapor phase epitaxy) on low temperature GaN (LT-GaN) nucleation layers deposited by HVPE. The (0001) sapphire substrates were used. The LT-GaN process parameters were as follows: HCl flow rate was 10 sccm/min, temperature 450degC and deposition time intervals 7 and 9 minutes for sample #1 and #2, respectively. The values were chosen after previous optimization of this stage of technology. Before nucleation layer deposition sapphire substrates were pre-heated for 10 min in the N2:NH3 ambient. The nucleation layer epitaxy was followed by recrystallization and migration process for 10 minutes. Morphologies of LT- and HT-GaN layers were examined by scanning electron microscopy. Properties of HT-GaN layers were investigated by photoluminescence spectra and micro-Raman measurements.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114986800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Characterization of two dimensional photonics structures using optical sccaterometry 用光学散射法表征二维光子结构
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164139
S. Lis, J. Myśliwiec, A. Miniewicz, S. Patela
{"title":"Characterization of two dimensional photonics structures using optical sccaterometry","authors":"S. Lis, J. Myśliwiec, A. Miniewicz, S. Patela","doi":"10.1109/STYSW.2008.5164139","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164139","url":null,"abstract":"The technology of photonics structures has being still developed. The main problem, which this technology copy with, is characterization of geometrical parameters in a nano regime. The best method should be quick, easy to use, cheep and precise. Two popular methods such as microscopy AFM or SEM are expansive to maintain and use. Moreover the time of a measurement is long and the inspected area are relatively small. Majority photonic structures are periodic due to optical methods look quite promising. One of them is optical scatterometry which is the angle-resolved measurement and characterization of light scattered from a structure. This technique is able to precisely measure geometrical parameters of structures in the sub-micron size. Additionally scatterometry is quick and non-invasive method. In previous paper has been presented results of using this method to obtain profile one dimensional photonic crystal. In this paper is described the method to measure two dimensional nano-structures and results characterization of two dimensional photonic crystal PhC in photoresist obtained by holographic lithography.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122624081","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The evaluation of thin electroless plated metal layers by means of Surface Plasmon Resonance 用表面等离子体共振评价化学镀金属薄层
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164135
R. Herschel, T. Schuster, C. Schaffer
{"title":"The evaluation of thin electroless plated metal layers by means of Surface Plasmon Resonance","authors":"R. Herschel, T. Schuster, C. Schaffer","doi":"10.1109/STYSW.2008.5164135","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164135","url":null,"abstract":"The object of the presented work is the excitation and propagation of plasmons along thin metal layers. The main focus is on plasmon excitation along electroless plated metal layers by utilizing a Kretschmann-Rather coupler, whose concept is shown in detail. Therefore an impedance model is presented for calculating the reflectivity of multilayer systems. With the Kretschmann-Rather coupler experimental results for the reflectivity of the analysed metal layers were obtained. Comparing the theoretically calculated reflectivity values with the experimental results the samples are characterised in terms of thickness, complex permittivity and scattering on both sides of the metal layer. The information gained from the extrapolation of the layer parameters provides a basis for the further development of a fibre optic biosensor.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128763661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Actuating methods of quasistatic micromirrors for active focus variation 准静态微镜主动变焦的驱动方法
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164131
H. Conrad, T. Klose, T. Sander, H. Schenk, H. Lakner
{"title":"Actuating methods of quasistatic micromirrors for active focus variation","authors":"H. Conrad, T. Klose, T. Sander, H. Schenk, H. Lakner","doi":"10.1109/STYSW.2008.5164131","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164131","url":null,"abstract":"For zoom and focus applications in the UV and IR spectral range mirrors with actively deformable surfaces are promising for reflective adaptive optics as an alternative to refractive optics. To realise an adjustable focus length interval from infinity to the centimetre range the needed surface deformation can be described by a hemisphere. For shorter focus lengths and optical on-axis applications the parabolic shape has to be used. The actuation principle of a quasistatic micromirror with actively deformable surface can be realised using electrostatic, thermo-mechanic, piezoelectric or electromagnetic effects. This paper compares electrostatic, thermo-mechanic and piezoelectric actuation methods for deformable micromirrors. Thereby models of curved thin plates and estimations on power consumption for low frequency or quasistatic operation are discussed. Due to the low power consumption and the low driving voltage, the piezoelectric effect is determined as most promising driving principle for devices used in mobile applications.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127235508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Electrophoretic deposition of solid electrolytes for non-nernstian electrochemical gas sensors 非能量电化学气体传感器用固体电解质的电泳沉积
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164133
P. Halek, S. Kulczyk, H. Teterycz
{"title":"Electrophoretic deposition of solid electrolytes for non-nernstian electrochemical gas sensors","authors":"P. Halek, S. Kulczyk, H. Teterycz","doi":"10.1109/STYSW.2008.5164133","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164133","url":null,"abstract":"The study of electrophoretic deposition (EPD) of CeO2 powder as a solid electrolyte for mixed-potential gas sensors will be presented in this paper. Cerium (IV) dioxide was deposited from colloidal suspensions. The grow process of layers and the influence of the process conditions on the sensing layers parameters will be described. The solid electrolyte layers obtained with this method, reveal good repeatability and adhesion. The achieved results suggest that EPD process is a promising method for the solid electrolyte deposition.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130501131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Management of waste electrical and electronic equipment in Poland - Ecological, organizing and economical aspects 波兰废弃电气和电子设备的管理-生态，组织和经济方面
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164142
P. Matkowski, K. Friedel
{"title":"Management of waste electrical and electronic equipment in Poland - Ecological, organizing and economical aspects","authors":"P. Matkowski, K. Friedel","doi":"10.1109/STYSW.2008.5164142","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164142","url":null,"abstract":"According to regulations of Directive 2002/96/EC of the European Parliament and of the Council of the 27 January 2003 on waste electrical and electronic equipment, UE Member States are obligated to ensure high level of separate collection, specified rate collection and levels of recovery including recycling of waste electrical and electronic equipment. Rational working WEEE (waste electrical and electronic) management system as well as high pro-ecological attitude of society are required to fulfill imposed obligations. Within the framework of the paper WEEE management system existing in Poland will be described. Imposed obligations, treatment processes, aims and advantages of WEEE management will also be shortly described.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"90 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126115894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Behavior of semiconductor gas sensors with sol-gel sensing layer 具有溶胶-凝胶传感层的半导体气体传感器的性能
2008 International Students and Young Scientists Workshop - Photonics and Microsystems Pub Date : 2008-06-20 DOI: 10.1109/STYSW.2008.5164132
G. Halek, D. Stoga, H. Teterycz
{"title":"Behavior of semiconductor gas sensors with sol-gel sensing layer","authors":"G. Halek, D. Stoga, H. Teterycz","doi":"10.1109/STYSW.2008.5164132","DOIUrl":"https://doi.org/10.1109/STYSW.2008.5164132","url":null,"abstract":"In this paper a sol-gel technique and SnO2 sensing layers prepared with this technique are presented. The tin dioxide sol was prepared of SnCl4 and deposited with spin coating method. The developed sensing layers have nanocrystalline structure and show excellent substrates adhesion. The gas sensor sensitivity strongly depends on thickness of deposited material. Probably, the large sensitivity of the semiconductor gas sensors is the result of conduction model of flat bands.","PeriodicalId":206334,"journal":{"name":"2008 International Students and Young Scientists Workshop - Photonics and Microsystems","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124383964","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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