Proceedings of ISAF-ECAPD-PFM 2012最新文献_第4页

Impedance and pyroelectric measurements on charge imbalanced BLSF sol-gel ceramic 电荷不平衡BLSF溶胶-凝胶陶瓷的阻抗和热释电测量

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297848

N. Reddy, N. V. Prasad, G. Kumar, G. Prasad, E. Ramana

引用次数: 0

Application of bismuth copper tantalate in internal barrier layer capacitors 钽酸铋铜在内阻挡层电容器中的应用

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297756

D. Szwagierczak, J. Kulawik

引用次数: 0

Elaboration of cordierite ceramic starting from Algerian clays 从阿尔及利亚粘土开始加工堇青石陶瓷

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297857

B. Khaled, K. Mohamed, A. Azzedine

{"title":"Elaboration of cordierite ceramic starting from Algerian clays","authors":"B. Khaled, K. Mohamed, A. Azzedine","doi":"10.1109/ISAF.2012.6297857","DOIUrl":"https://doi.org/10.1109/ISAF.2012.6297857","url":null,"abstract":"Cordierite ceramic are elaborated by mixing a Algerian kaolin which is located in “Djebel Debbagh” region in the Algerian east, and hydroxide of magnesium. This kaolin named “DD3”, contains a large tenor of manganese oxide (MnO>;1.34 %) what gives a blackish colouring to this clay, which limit its utilization in luxury porcelain and sanitary ware where brightness and whiteness are required. However DD3 is composed mainly by kaolinite and gibbsite which is also bearer of alumina. Fusible compound such iron and alkalis are less than 1 %. Elaboration of cordierite is carried out by mixing magnesium hydroxide to DD3. Fumed Silica powder is added to respect the stoichiometric composition of cordierite. Magnesium hydroxide is prepared by precipitation from MgCl2 and NH4OH. The mixtures with various compositions of DD3 kaolin and magnesium hydroxide are pressed to give samples in form of pastilles, and sintered at temperatures ranging from 1200 °C to 1350 °C to determine the ceramics properties such apparent and specific density, linear shrinkage, water absorption. Formation of Cordierite phase and structural changes are investigated by X-ray diffraction (XRD), simultaneous thermal analysis (DTA-TG), and thermal dilatometry.","PeriodicalId":20497,"journal":{"name":"Proceedings of ISAF-ECAPD-PFM 2012","volume":"32 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2012-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81184925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Modeling of minor loops of a ferroïc single crystal ferroïc单晶小环的建模

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297824

C. Borderon, R. Renoud, M. Ragheb, H. Gundel

{"title":"Modeling of minor loops of a ferroïc single crystal","authors":"C. Borderon, R. Renoud, M. Ragheb, H. Gundel","doi":"10.1109/ISAF.2012.6297824","DOIUrl":"https://doi.org/10.1109/ISAF.2012.6297824","url":null,"abstract":"The characterizations of ferroïc materials are often realized by measuring the minor loops. The polarization P and/or the strain S are reported as a function of the ac electric field E and/or the ac mechanical stress σ. The slope of the loop depends on the real part of ε or d (respectively the dielectric constant and the piezoelectric coefficient) and its opening is related to the imaginary part of ε or d. To interpret the loop properties, we use a model describing the motion of the domain walls, model presented elsewhere in the congress. For a low value of the amplitude of E or s, the motion of the walls is vibration and jumps between pinning centers. For the vibration, ε and d do not depends on the amplitude of E or σ while they vary linearly with it for the contribution of the jumps. The variation of ε and d as a function of E or σ follows a hyperbolic law. The behavior is valid for the real part of these quantities but also for the imaginary part. For very low amplitudes, ε and d are constant because the jumps contribution is negligible and the vibration displacement is proportional to E or σ. In these conditions, the minor loop is an ellipse. The adding of the jumps at higher amplitude leads to a distortion of the loop.","PeriodicalId":20497,"journal":{"name":"Proceedings of ISAF-ECAPD-PFM 2012","volume":"59 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2012-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91444783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Textured lead-free KSr2Nb5O15 piezoelectric ceramics, fibers and piezocomposites — Processing and properties 纹理无铅KSr2Nb5O15压电陶瓷，纤维和压电复合材料。加工和性能

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297786

S. Alkoy, S. Dursun

引用次数: 1

Signal detection circuit of acoustic emission sensor using Pb-free (Na, K)NbO3 system ceramics 无铅(Na, K)NbO3体系陶瓷声发射传感器信号检测电路

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297804

Jichul Park, L. Hwang, Sunmin Byeon, J. Yoo, Yeongho Jeong

引用次数: 0

Epitaxial growth and properties of lead-free ferroelectric Na0.5Bi0.5TiO3 thin films grown by pulsed laser deposition on various single crystal substrates 脉冲激光在不同单晶衬底上生长无铅铁电Na0.5Bi0.5TiO3薄膜的外延生长和性能

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297851

F. Jean, M. Bousquet, J. Duclère, A. Boulle, F. Rémondière, S. Députier, J. Orlianges, P. Marchet, M. Guilloux-Viry

{"title":"Epitaxial growth and properties of lead-free ferroelectric Na0.5Bi0.5TiO3 thin films grown by pulsed laser deposition on various single crystal substrates","authors":"F. Jean, M. Bousquet, J. Duclère, A. Boulle, F. Rémondière, S. Députier, J. Orlianges, P. Marchet, M. Guilloux-Viry","doi":"10.1109/ISAF.2012.6297851","DOIUrl":"https://doi.org/10.1109/ISAF.2012.6297851","url":null,"abstract":"The epitaxial growth of lead-free ferroelectric Na0.5Bi0.5TiO3 (NBT) thin films on various single crystal substrates was successfully achieved, using the pulsed laser deposition technique (PLD). The present work is divided in two parts, focused on: (i) the growth of NBT layers on c- and r-sapphire (Al2O3) substrates, with and without introducing a CeO2 buffer layer, and (ii) the growth of NBT layers on bare (001)SrTiO3 substrates, with and without introducing a LaNiO3 layer, that could be used as a bottom electrode. In the first part, it was shown that the introduction of a CeO2 buffer layer completely modifies the out-of-plane growth orientation of the NBT films, as well as their microstructure. Indeed, (001)NBT films epitaxially grow only on r-Al2O3 substrates buffered with epitaxial (001)CeO2 layers, while, growing simply NBT on top of bare c or r-Al2O3 substrates, or on top of CeO2/c-Al2O3 heterostructures leads to polycrystalline or textured films. In the second part, we demonstrate that (001)-oriented NBT layers deposited on either bare (001)SrTiO3 or (001)SrTiO3 substrates (STO) covered with (001)LaNiO3 (LNO) are systematically epitaxially grown. Furthermore, the microstructure of the samples is strongly affected by the introduction of the LaNiO3 layer.","PeriodicalId":20497,"journal":{"name":"Proceedings of ISAF-ECAPD-PFM 2012","volume":"188 1","pages":"1-3"},"PeriodicalIF":0.0,"publicationDate":"2012-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78108648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Atomic vapor deposition of bismuth titanate thin films 钛酸铋薄膜的原子气相沉积

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1063/1.4801985

Nitin Deepak, Panfeng F. Zhang, L. Keeney, M. Pemble, R. Whatmore

引用次数: 18

Tailor-made domain structures on the x-face and y-face of LiNbO3 crystals 在LiNbO3晶体的x面和y面上定制域结构

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297715

A. Boes, T. Crasto, V. Sivan, E. Soergel, H. Steigerwald, A. Mitchell

引用次数: 0

Thickness optimization of AlN thin films deposited by RF Magnetron Sputtering 射频磁控溅射制备AlN薄膜厚度优化

Proceedings of ISAF-ECAPD-PFM 2012 Pub Date : 2012-07-09 DOI: 10.1109/ISAF.2012.6297867

S. Uzgur, D. Hutson, K. Kirk

{"title":"Thickness optimization of AlN thin films deposited by RF Magnetron Sputtering","authors":"S. Uzgur, D. Hutson, K. Kirk","doi":"10.1109/ISAF.2012.6297867","DOIUrl":"https://doi.org/10.1109/ISAF.2012.6297867","url":null,"abstract":"Aluminium nitride (AlN) which has a wurtzite crystal structure is highly suitable material for applications in a wide range field of ultrasonic transducers, non-destructive testing and MEMS-Micro-Electro-Mechanical Systems because of AlN's good piezoelectric properties. We are interested in investigation of the suitability of piezoelectric AlN for thin film based devices for MEMS applications. Since the good functionality of piezoelectric devices is highly dependent on the quality of the thin film, our first aim is to improve the quality of the deposited film and eventually to build an optimised deposition parameters by using design of experiments method (DoE). Thin films produced by RF Magnetron Sputtering were characterized to analyze its crystallographic structure by using X-ray diffraction, Scanning Electron Microscope (SEM), and Spectrophotometer. The structural and mechanical characterization results showed that AlN thin film has highly (002) c-axis orientation. The optical characterization supported the thickness of the films were in the range of micron. The optimization process pointed out that the input parameters did not have a significant effect on the output parameters.","PeriodicalId":20497,"journal":{"name":"Proceedings of ISAF-ECAPD-PFM 2012","volume":"7 1","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2012-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78626675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1