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2005 IEEE Pulsed Power Conference最新文献

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UV Pre-Ionized Rail-Gap Switch for Stacked Blumlein Pulse Generators 用于堆叠Blumlein脉冲发生器的UV预电离轨道间隙开关
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300743
M. Rhodes
{"title":"UV Pre-Ionized Rail-Gap Switch for Stacked Blumlein Pulse Generators","authors":"M. Rhodes","doi":"10.1109/PPC.2005.300743","DOIUrl":"https://doi.org/10.1109/PPC.2005.300743","url":null,"abstract":"Stacked blumlein pulse generators comprised of parallel-plate transmission lines are potentially a useful pulse-power architecture for high-gradient, compact, electron-beam accelerators and other applications. Such pulse generators require a low-inductance, fast (<5ns) switch per stage to erect the stack and produce the desired output pulse. We are developing a rail-gap switch tightly integrated with the stack for this application. We employ ultraviolet light (UV) to pre-ionize the switch, which facilitates prompt, low-jitter, and potentially multi channel operation. A novel aspect of our switch is that the source of the UV is a conventional Xenon flashlamp. This allows variation of the switch pressure and gas without affecting the flashlamp operation. We can operate our switch in either triggered or self-breaking mode. Here we present initial results of a two-stage, stacked blumlein operating in self-break mode. We compare the switch performance to gas-switch scaling laws with respect to resistive-phase risetime and trigger delay as a function of gas density, gap-length, and gap-voltage.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131999830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Nanosecond Pulsed Corona Discharge Radiation 纳秒脉冲电晕放电辐射
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300474
R. Baksht, Y. Yankelevich, A. Pokryvailo
{"title":"Nanosecond Pulsed Corona Discharge Radiation","authors":"R. Baksht, Y. Yankelevich, A. Pokryvailo","doi":"10.1109/PPC.2005.300474","DOIUrl":"https://doi.org/10.1109/PPC.2005.300474","url":null,"abstract":"Pulsed corona (PC) offers a real promise for degradation of pollutants in gas and water streams. Understanding of discharge physic is necessary for developing corona applications. This paper presents a study of pulse repetition frequency (PRF) effect on PC parameters: current, impedance and radiation. The study was carried out in a wire-to-wire geometry. A corona device with a central high-voltage electrode and two symmetrical grounded electrodes was used for model experiments. A nanosecond solid state power supply SM- 2N (100 kV, 5 ns, up to 300 Hz) was used for driving PC. We carried out also spectrum measurements by a SPEX monochromator. We registered the N2 second positive system and N2 + first negative system as a function of the discharge voltage and PRF.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130314384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Assembly Concerns for Flash X-Ray Accelerators 闪光x射线加速器的装配问题
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300700
E. Ormond, D. Henderson, J. Smith
{"title":"Assembly Concerns for Flash X-Ray Accelerators","authors":"E. Ormond, D. Henderson, J. Smith","doi":"10.1109/PPC.2005.300700","DOIUrl":"https://doi.org/10.1109/PPC.2005.300700","url":null,"abstract":"Proper accelerator assembly is critical in maximizing the return on investment of project funds. This critical task is most often accomplished by trained technicians. Pulsed Power-driven X-ray source assembly includes project planning, system design, drawing creation, and review as vital steps toward project success. The actual assembly procedures also are critical in ensuring the accelerator performs properly and will continue to perform efficiently and safely for years. This paper presents information on assembly concerns, including hardware selection, material selection, material treatments, documentation concerns and general assembly guidelines. This paper will mainly focus on oil and water containing sections including pulse forming lines and induction voltage adders.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114345609","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Research Directed for Development of Coating Electrothermal Technology 涂层电热技术发展方向研究
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300566
E. Shcolnikov, S. Maslennikov, D. Shatilov, L. A. Sukhanova
{"title":"Research Directed for Development of Coating Electrothermal Technology","authors":"E. Shcolnikov, S. Maslennikov, D. Shatilov, L. A. Sukhanova","doi":"10.1109/PPC.2005.300566","DOIUrl":"https://doi.org/10.1109/PPC.2005.300566","url":null,"abstract":"The optimization of the discharge gap electrodes of electrothermal launcher operating in repetitive regime as well as the use of erosion-proof materials resulted in diminishing their erosion wear by more than an order. The analysis based on the developed physical models and performed experiments made it possible to determine the ablating layers dynamics as well as the ablation wear of corundum ceramic insulators which appeared to be equal to 1 mg/pulse. Resource tests of the discharge gap and accelerating channel elements revealed existence of self breakdowns in the discharge gap after 2000 operational pulses. They were caused by the modification of the ceramic bush surface and accumulation of electrode erosion products on the surface. The inclusion of a controlled vacuum switch in the electric supply circuit of the gap made it possible to maintain its electric strength over long period of time. The optimization of geometric dimensions of the discharge gap capillary part resulted in decreasing of the discharge current by more than one third and diminishing the equipment energy consumption.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"112 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114380543","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High Voltage Impulse Generator Using HV-IGBTs 使用hv - igbt的高压脉冲发生器
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300773
M. Giesselmann, B. Palmer, A. Neuber, J. Donlon
{"title":"High Voltage Impulse Generator Using HV-IGBTs","authors":"M. Giesselmann, B. Palmer, A. Neuber, J. Donlon","doi":"10.1109/PPC.2005.300773","DOIUrl":"https://doi.org/10.1109/PPC.2005.300773","url":null,"abstract":"We are reporting on a High-Voltage Impulse Generator, which consists of a step-up transformer, which is driven by new HV-IGBTs (High-Voltage Isolated Gate Bipolar Transistors). The new HV-IGBTs are individually packaged silicon-dies intended for Pulsed-Power Applications. The silicon dies are normally packaged in large modules for locomotive motor drives and similar traction applications. In our work we used the Powerex QIS4506001 discrete IGBT and the QRS4506001 discrete diode, both with a nominal rating of 4500V/60A, derived from continuous- duty applications. Our experiments have shown that the devices are capable of handling currents in excess of 1 kA during pulsed operation.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114502489","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
A High Pressure Flowing Oil Switch for Gigawatt, Repetitive Applications 一种用于千兆瓦重复应用的高压流动油开关
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300548
P. Norgard, R. Curry, R. Burdt, R. Cravey, G. Anderson, S. Heidger
{"title":"A High Pressure Flowing Oil Switch for Gigawatt, Repetitive Applications","authors":"P. Norgard, R. Curry, R. Burdt, R. Cravey, G. Anderson, S. Heidger","doi":"10.1109/PPC.2005.300548","DOIUrl":"https://doi.org/10.1109/PPC.2005.300548","url":null,"abstract":"A repetitive oil switch for directed energy applications has been developed in a joint effort between teams at the University of Missouri - Columbia, Alpha Omega Power Technologies and the Boeing Company. The switch is operated at test pressures to 17.24 MPa (2500 psi), flow rates to 0.72 L-s-1 (11.4 gpm), charge voltages to -300 kV and discharge energies to 275 J per pulse at 20 pps. An examination of the electrodes after 250,000 shots with the original design led to the design of an insert device which resulted in higher performance fluid flow within the switch. The flow shaper-enhanced switch was tested for 150,000 shots, the results of which are presented in the following paper. Electrode lifetime has been evaluated for stainless steel under the original and enhanced fluid flow conditions and is reported.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114816207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Developments of 500 kV Multi-Channel Multi-Gap Self Breakdown 500kv多通道多间隙自击穿的研制
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300738
S. Park, S.H. Kim, H. Heo, Y.J. Park, S. Nam, B.H. Son
{"title":"Developments of 500 kV Multi-Channel Multi-Gap Self Breakdown","authors":"S. Park, S.H. Kim, H. Heo, Y.J. Park, S. Nam, B.H. Son","doi":"10.1109/PPC.2005.300738","DOIUrl":"https://doi.org/10.1109/PPC.2005.300738","url":null,"abstract":"A multi-gap multi-channel (MGMC) switch of 500 kV has been developed at Pohang Accelerator Laboratory (PAL). It consists of ten of gaps to increase self-discharge voltage by filling up the gas. A structure of a multi-gap switch can increase its inductances. Thus, in order to solve those problems its structure made by multi-channels had been designed to decrease the inductance effects. The fabricated switch tested using marx generator of 500 kV. The design concept and its characteristics will be discussed.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115247391","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Studies into the Time Resolved Source Diameter of a Self Magnetic Pinch Radiographic Diode 自磁夹点式射线照相二极管时间分辨源径的研究
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300536
J. Threadgold, A. Critchley, A. Jones, I. Crotch, D. Rose, S. Portillo
{"title":"Studies into the Time Resolved Source Diameter of a Self Magnetic Pinch Radiographic Diode","authors":"J. Threadgold, A. Critchley, A. Jones, I. Crotch, D. Rose, S. Portillo","doi":"10.1109/PPC.2005.300536","DOIUrl":"https://doi.org/10.1109/PPC.2005.300536","url":null,"abstract":"The self magnetic pinch diode is being considered as a possible source for future high voltage (10MV) flash radiographic systems being developed. Previous studies at both the Atomic Weapons Establishment (AWE) Aldermaston in the UK and Sandia National Labs (SNL) in the US have investigated the time integrated dose and source diameter produced by the diode. Presented here are results from investigations into the dynamic time history of the source diameter. Experimental investigations have been carried out at both AWE and SNL with the image of the source projected onto fast decay scintilators viewed by nanosecond gating and streak cameras. Experimental measurements are compared with results from 2D and 3D electromagnetic particle in cell codes.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115418136","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Laser Gated and Pumped Thyristor (LGPT) Scale-Up for the Advanced Electra Pulsed Power Technology Demonstrator 激光门控和泵浦晶闸管(LGPT)放大的先进电脉冲功率技术演示器
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300790
D. Weidenheimer, G. James, D. Morton, D. Giorgi, T. Navapanich, D. Knudsen, R. Knight
{"title":"Laser Gated and Pumped Thyristor (LGPT) Scale-Up for the Advanced Electra Pulsed Power Technology Demonstrator","authors":"D. Weidenheimer, G. James, D. Morton, D. Giorgi, T. Navapanich, D. Knudsen, R. Knight","doi":"10.1109/PPC.2005.300790","DOIUrl":"https://doi.org/10.1109/PPC.2005.300790","url":null,"abstract":"LGPT [1] development in support of the Electra Advanced Pulsed Power Program has progressed to the point where we have scaled up the developmental devices to larger area, rail aspect ratio devices of 5 cm2 (1times5 cm). These devices represent minimum-sized building-block units for use in near and far term KrF IFE [2] laser drivers. Testing and iteration continues on the program's limited-area developmental devices in parallel with the scale-up. This allows us to continually evolve some of the more challenging features such as the optical interface and details of the photon sources/drives, while other more mature features are finalized. The scaled-up devices are based on the on-board integrated LGPT, in that the laser diode arrays and their drive electronics are integrated directly into the switch electrode structures. At this time, the on-board approach is still preferred over the fiber- coupled off-board approach, for its ability to produce more photons per unit area active silicon.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115513333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Special Features of Emissive Characteristics of Cold Graphite Cathode with an Increase in the Repetition Rate of Nanosecond Accelerating Pulses 随着纳秒级加速脉冲重复率的增加，冷石墨阴极发射特性的特殊特征
2005 IEEE Pulsed Power Conference Pub Date : 2005-06-13 DOI: 10.1109/PPC.2005.300505
E. Litvinov, M. Yalandin, V. Shpak, S. Rukin, G. Mesyats, S. Korovin, V. Rostov
{"title":"Special Features of Emissive Characteristics of Cold Graphite Cathode with an Increase in the Repetition Rate of Nanosecond Accelerating Pulses","authors":"E. Litvinov, M. Yalandin, V. Shpak, S. Rukin, G. Mesyats, S. Korovin, V. Rostov","doi":"10.1109/PPC.2005.300505","DOIUrl":"https://doi.org/10.1109/PPC.2005.300505","url":null,"abstract":"A study has been performed on the behavior of the emissive characteristics of a cold graphite cathode in a magnetically insulated coaxial diode under the action of nanosecond accelerating pulses at a pulse repetition frequency (PRF) of up to 3.5 kHz. Emission was observed to degrade at PRF < 1 kHz and recover at PRF ~ 3.5 kHz. Estimates of the temperature conditions in the region of an explosive electron emission (EEE) center have shown that the pulse interval t ~1 ms suffices for this region to cool down to 300 K. The cooling occurs predominantly by heat conduction. For t ~ 0.3 ms, the residual heat is substantial. It has been proposed that there exists a frequency limit for the cathode microrelief polishing effect. The results of an experiment on studying the mechanism of cathode emission recovery with increasing PRF are presented. Micrographs of the cathode taken after aging, photographs of the cathode in operation, and analyses of the fractional composition of the material removed from the cathode suggest that an important role in the recovery of emission is played by the heating of some regions of the cathode emitting edge to the melting point of graphite. This counts in favor of the hypothesized dominant contribution of thermoelectron emission to the initiation of EEE due to the residual heat remaining in regions that have not cooled off during the pulse interval.","PeriodicalId":200159,"journal":{"name":"2005 IEEE Pulsed Power Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125051889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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