Tao Fu, Shanshan Wang, Nansheng Zhang, Qun Hao, Feng Shi
{"title":"Simulation of display thermal deformation and error analysis in high precision reverse Hartmann test","authors":"Tao Fu, Shanshan Wang, Nansheng Zhang, Qun Hao, Feng Shi","doi":"10.1117/12.3016124","DOIUrl":"https://doi.org/10.1117/12.3016124","url":null,"abstract":"In reverse Hartmann measurement, the display often undergoes thermal deformation due to self-heating, which can cause drift of pixels on the screen and cause errors in the measurement results. A multilayer LCD model was established based on a linear elastic material model, and the influence of thermal deformation of the display on measurement results was analyzed under different backlighting modes. The results show that when uniformly heated, the PV value increases by 40 nm for each degree of temperature increase in the display, and the main surface errors are tilt and astigmatism under different temperature fields.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"79 5‐6","pages":"129820L - 129820L-9"},"PeriodicalIF":0.0,"publicationDate":"2023-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139165930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Zhigang Yuan, Yaguo Li, Du Wang, Ting Tan, H. Jin, Qinghua Zhang, Jian Wang, Qiao Xu
{"title":"Study on IR laser smoothing of ground surface on fused silica (Erratum)","authors":"Zhigang Yuan, Yaguo Li, Du Wang, Ting Tan, H. Jin, Qinghua Zhang, Jian Wang, Qiao Xu","doi":"10.1117/12.2550474","DOIUrl":"https://doi.org/10.1117/12.2550474","url":null,"abstract":"Publisher’s Note: This paper, originally published on 8 July 2019, was replaced with a corrected/revised version on 13 August 2019. If you downloaded the original PDF but are unable to access the revision, please contact SPIE Digital Library Customer Service for assistance.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124342579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Zhengwei Wang, Kui Zhang, Guodong Chen, Yang Wang, Jingsong Wei
{"title":"A lift-off of pattern structures on the heat-mode resists","authors":"Zhengwei Wang, Kui Zhang, Guodong Chen, Yang Wang, Jingsong Wei","doi":"10.1117/12.2539074","DOIUrl":"https://doi.org/10.1117/12.2539074","url":null,"abstract":"Laser heat-mode lithography is very useful for the fabrication of micro/nanostructure-based optical elements. In laser heat-mode lithography, the pattern structures need to be transferred to the substrates by wet-etching or dry-etching method. In this work, a lift-off method for the pattern transfer in laser heat-mode lithography was proposed and studied. A desirable undercut profile was obtained by manipulating the thermal field profile of laser heat-mode exposure, and a lift-off of Cr layer with a thickness of 80 nm on a quartz glass substrate was achieved. The results indicated that laser heat-mode lithography with lift-off process is an effective method to transfer the pattern structures to Cr layer and generate a Cr-based hard mask, which is useful for the fabrication of micro/nanostructure-based optical elements.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133947435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yinchao Zhang, Ting Li, He Chen, Siying Chen, Pan Guo, Xunbao Rui, Baowei Li
{"title":"Assessment of high-purity quartz glass by laser induced fluorescence technique","authors":"Yinchao Zhang, Ting Li, He Chen, Siying Chen, Pan Guo, Xunbao Rui, Baowei Li","doi":"10.1117/12.2539916","DOIUrl":"https://doi.org/10.1117/12.2539916","url":null,"abstract":"In this paper, the laser-induced fluorescence (LIF) technology is utilized for rapid assessment of the purity of quartz glass, especially for the screening of high-purity quartz glass. A 355 nm laser was applied as excitation source to induce the fluorescence signal of the quartz glass samples. The fluorescence signal is then transmitted to the spectrometer through an optical fiber for spectral acquisition. Because only the impurities in quartz glass induce fluorescence, purity quartz glasses does not have a distinct fluorescence signals or fluorescence peaks. The purity evaluation of high-purity quartz glass can be achieved by analyzing the obtained signals. The standard deviation and the ratio of the maximum to minimum values of the signals were calculated to indicate the intensity of the fluorescent peak of the signal. The thresholds were then set to distinguish between high-purity and low-purity quartz glasses. The method has the advantages of high speed, high precision and high reliability, and is of great significance for the rapid screening of quartz glass with high purity requirements.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132788714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Preparation and physical properties of germanium thin films","authors":"Mengting Guo, Hongbo He, Kui Yi, S. Shao, J. Shao","doi":"10.1117/12.2539294","DOIUrl":"https://doi.org/10.1117/12.2539294","url":null,"abstract":"Prepared by electron beam evaporation with argon plasma assistance, ultrathin Ge films on JGS1, CaF2 and Si substrates at different deposition temperatures has been investigated by grazing incidence X-ray reflectivity (GIXRR), spectrophotometer, atomic force microscopy. By investigation of the influence of deposition temperature ranging from 100 to 300degC and annealing treatment on transmittance, morphologies of Ge thin films. It can be seen that both deposition temperature exchange and annealing treatment can significantly affect the thickness of Ge thin films. And there is an enhancement of attenuation on films transmittance with the increasing of deposition temperature on JGS1 and CaF2 substrates, while it’s not significant on Si substrate. In addition, it can be seen that the roughness of Ge films on JGS1 and CaF2 substrates has similar variation, which is different from the roughness of Ge films on Si substrate.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"11064 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131095568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparison of mechanical properties evolution of polyimide films in space radiation environment","authors":"Zicai Shen, Xiao Li, Shijie Liu","doi":"10.1117/12.2535463","DOIUrl":"https://doi.org/10.1117/12.2535463","url":null,"abstract":"Polyimide films are widely used in spacecraft, but their mechanical properties would degrade in space environments, such as electron, proton, near ultraviolet or far ultraviolet, etc. The mechanical property and mechanism of polyimide film in electron, proton, near ultraviolet and far ultraviolet was studied by Φ800 combined space radiation test facility of Beijing Institute of Space Environment Engineering (BISSE), and the degradation of mechanical property of polyimide film was tested by Electronic tensile testing machine. The tensile strength and the rupture elongation of PI film decrease with the increase of electron and proton radiation, while tensile strength and the rupture elongation of PI film decrease firstly and then increase with near ultraviolet and far ultraviolet.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130851791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ping Huang, Shunjian Xu, Meng Zhang, W. Zhong, Zonghu Xiao, Yongping Luo
{"title":"Green vegetables derived simultaneously carbon dots as sensitizer and carbon particles as counter electrode for dye-sensitized solar cells","authors":"Ping Huang, Shunjian Xu, Meng Zhang, W. Zhong, Zonghu Xiao, Yongping Luo","doi":"10.1117/12.2539530","DOIUrl":"https://doi.org/10.1117/12.2539530","url":null,"abstract":"Carbon materials for dye-sensitized solar cells (DSSC) have aroused much attention recently due to their low cost, wonderful chemical stability and outstanding catalytic activity, etc. As China is a large agricultural country, in consideration of environmental protection and low cost, two common green vegetables, including cucumber and green pepper, are employed to prepare carbon quantum dots (CQD) by hydrothermal method, and simultaneously the residues are carbonized to obtain carbon particles (CP) in this study. The optical performances of the as-prepared CQD were acquired through UV-Vis and PL tests, showing that the CQD were suitable as sensitizers for DSSC. Thereby CQDbased DSSC with Pt counter electrode (CE) were experimentally fabricated, yielding the power conversion efficiency (PCE) of 0.21% and 0.28% respectively under AM 1.5 one sun illumination. Meanwhile, the CP were coated on FTO as CE for DSSC, and the favorable electrochemical properties of the CP-based CE were measured by EIS and Tafel. Therefore the CP-based DSSC with N719 sensitizer were constructed, and achieved the PCE of 1.45% and 1.40% respectively. The above results distinctly present the photovoltaic applications of CQD and CP concurrently derived from green vegetables as sensitizer and counter electrode for DSSC, which indicate the prospect for the realization of high-performance photovoltaic cells from low cost and environmentally friendly natural products","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133535605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yuchen Shao, Yuanan Zhao, Haodong Ma, C. Li, Da-wei Li, J. Shao
{"title":"Efficient method for determination of laser conditions adopted in laser-induced micro-lithology based on laser polymerization size analysis","authors":"Yuchen Shao, Yuanan Zhao, Haodong Ma, C. Li, Da-wei Li, J. Shao","doi":"10.1117/12.2539750","DOIUrl":"https://doi.org/10.1117/12.2539750","url":null,"abstract":"Since negative photoresist SU-8 has become a common material for multi-photon micro-lithology, it is necessary to study laser conditions adopted in lithology process. Optical transmittance of SU-8 was tested. According to Urbach optical-absorption theory and Gaussian laser lateral spatial intensity envelope, relationship between theory and actual polymerization size of SU-8 was shown. Experimentally, we investigated multi-photon polymerization threshold and laser-induced damage of SU-8 under femtosecond laser irradiation with the pulse width of 45 fs at 800 nm by 1-on-1 tests. The polymerization and damage threshold at 45 fs are 2.7 and 8.9 TW/cm2, respectively. Polymerization and damage morphologies are shown with high contrast and polymerization sizes are measured under SEM. Theoretical polymerization sizes versus laser fluence are calculated by laser-induce multi-photon polymerization size analysis (LMPSA), including Urbach optical-absorption theory and Gaussian laser lateral spatial intensity distribution. The calculated results show that diffusion exists in the femtosecond laser-induced polymerization.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"127 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133425848","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xiuqing Jiang, Lailin Ji, Mingying Sun, Chong Liu, Yajing Guo, Shunxing Tang, Dong Liu, B. Zhu, Jianqiang Zhu
{"title":"Laser damage on large aperture triple frequency crystal optics in high power laser system","authors":"Xiuqing Jiang, Lailin Ji, Mingying Sun, Chong Liu, Yajing Guo, Shunxing Tang, Dong Liu, B. Zhu, Jianqiang Zhu","doi":"10.1117/12.2540116","DOIUrl":"https://doi.org/10.1117/12.2540116","url":null,"abstract":"In high power laser system, the 3ω laser fluence can up to 6J/cm2 with triple frequency conversion efficiency up to 75%. Two high fluence laser experiments have been done for proving high efficiency output and damage resistance of KDP crystal. The KDP crystals have different performance in these two experiments due to their characteristics nuances. For the third harmonic crystal in first experiments, centimeter damage occurred on this crystal after about 50 number laser shots, and more than ten thousands micrometer damage points occurred on this crystal. For the second KDP crystal after about 60 number laser shots, most damage size are micrometer, including bulk damage and damage on back surface, micrometer damage doesn’t exist because of its good quality. We classify these damages of crystals to different kinds, observe characteristics of these damages. Observation of laser damage on third-harmonic converter crystals have been done in this paper.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115817523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Mingxiao Zhang, Zhongwen Lu, Yunti Pu, Liang Lv, Z. Qiao, P. Ma
{"title":"Investigation of the high repetition rate picosecond laser induced damage properties of dielectric reflective optical coatings","authors":"Mingxiao Zhang, Zhongwen Lu, Yunti Pu, Liang Lv, Z. Qiao, P. Ma","doi":"10.1117/12.2539915","DOIUrl":"https://doi.org/10.1117/12.2539915","url":null,"abstract":"High repetition rate picosecond laser induced damage properties of Ta2O5/SiO2 dielectric reflective optical coatings were investigated. The laser induced damage was attributed to the increase of the free electron density and temperature enhancement during the irradiation of high repetition rate picosecond laser. The correlation of laser induced damage threshold with pulse numbers was researched. At higher repetition rate, the laser induced damage threshold was reduced more with the increasing of pulsed number. We found that the defects absorption played an important role to the laser induced damage properties of dielectric reflective optical coatings. The damage morphology showed that the evolution of damage site was significantly influenced by the accumulation of laser energy. In order to enhance the resistance capacity, the dielectric reflective optical coatings were annealed with temperature of 260°C. The defect absorption was reduced after the annealing process. For the annealed coating, the laser induced damage threshold under high repetition rate picosecond laser was enhanced as a result of the suppression of defects in the coating.","PeriodicalId":197837,"journal":{"name":"SPIE/SIOM Pacific Rim Laser Damage","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115940184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}