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2021 96th ARFTG Microwave Measurement Conference (ARFTG)最新文献

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Automatic probing system with machine learning algorithm 带有机器学习算法的自动探测系统
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425064
R. Sakamaki, M. Horibe
{"title":"Automatic probing system with machine learning algorithm","authors":"R. Sakamaki, M. Horibe","doi":"10.1109/ARFTG49670.2021.9425064","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425064","url":null,"abstract":"This paper presents a novel probe alignment system that implements machine learning methods. The developed measurement system is demonstrated at frequencies ranging from 100 MHz to 125 GHz. The measurement system measures the S-parameter with slightly shifting the probe. The S-parameter is expressed by ten trigonometric function orders using the linear least mean square method. The coefficient of each function order is used to calculate the local outlier factor (LOF). Then, the calculated LOFs are used to detect the probe touchdown, and the LOF threshold is preliminarily determined using training data. The accuracy of probe positioning was compared with that of a conventional automatic probing technique, and the difference in the probe position between the two techniques was determined to be approximately 1 $mu$ m.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127163803","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Numerically stable Digital Predistortion Model for Over-the-Air MIMO transmission 无线MIMO传输的数字预失真模型
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425049
Shipra, M. Rawat
{"title":"Numerically stable Digital Predistortion Model for Over-the-Air MIMO transmission","authors":"Shipra, M. Rawat","doi":"10.1109/ARFTG49670.2021.9425049","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425049","url":null,"abstract":"Digital Predistortion technique is the most economical and reliable technique among all the linearization techniques available. This paper adduces the idea of linearization based on piecewise polynomial or essential spline functions as an integral solution to the MIMO nonlinearity and compares with the Crossover Memory polynomial model. MIMO nonlinearity is strongly coupled together due to the combined effect of PA nonlinearity and crosstalk. For the proof of concept, the method is implemented over the air on 2X2 MIMO, and simulation is performed for 4X4, 8X8, 16X16 MIMO System. Numerical evaluation of the technique is exhibited in terms of NMSE, BER, and EVM., while numerical stability is presented in terms of Condition number and Dispersion coefficient.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125665396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Surrogate Modeling-Based Acceleration of Multi-Harmonic Near-Field Measurements 基于代理模型的多谐波近场测量加速
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425147
Jonas Urbonas, H. Votsi, A. Shakouri, P. Aaen
{"title":"Surrogate Modeling-Based Acceleration of Multi-Harmonic Near-Field Measurements","authors":"Jonas Urbonas, H. Votsi, A. Shakouri, P. Aaen","doi":"10.1109/ARFTG49670.2021.9425147","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425147","url":null,"abstract":"In this paper, a surrogate modeling-based acceleration technique for multi-harmonic phase-coherent electrooptic near-field measurements is presented. The implementation uses an adaptive sampling and modeling algorithm instead of the conventional raster scanning approach, which reduces the measurement time by a factor of 9, from 7 hours to 45 minutes, and the number of samples by a factor of 23, from 10556 to 464, while maintaining the average measurement error under 5%. The reduction in measurement time helps to preserve the accuracy of the multi-harmonic near-field measurements, asthe electro-optic measurement system response can drift over time, due to thermal fluctuations in the measurement environment.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123556962","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Linearity Measurement of 6G Receiver with One Transmission Frequency Extender Operating at 330 GHz 330ghz下6G接收机的线性度测量
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425334
M. Leinonen, Klaus Nevala, N. Tervo, A. Pärssinen
{"title":"Linearity Measurement of 6G Receiver with One Transmission Frequency Extender Operating at 330 GHz","authors":"M. Leinonen, Klaus Nevala, N. Tervo, A. Pärssinen","doi":"10.1109/ARFTG49670.2021.9425334","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425334","url":null,"abstract":"The future sixth-generation (6G) is envisioned to support data rates up to 1 Tbps. The operational frequencies of the 6G system will be expanded towards the sub-mmW and THz regions. The 6G systems will utilize directive beams, as well, to compensate increased signal attenuation between link ends. The linearity of a receiver (Rx) is one of the most significant parameters for any radio system. Traditional Rx linearity measurement relies on a two-tone measurement technique, which requires two dedicated RF signals and combining them to the test signal. The generation of two independent RF signals at a 300 GHz frequency band leads to a costly and bulky solution. This paper proposes a linearity measurement method for 6G Rx, which uses only one continuous wave transmission frequency extender. A method is proposed where the RF input signal of frequency extender is narrowband amplitude modulated (AM), generating side tones around continuous wave carrier. The carrier frequency and first side tones are used as test signals, and the linearity test is like a traditional two-tone test with unequal signals. It is shown that the carrier level can be modified by back-offing the RF input power in the frequency extender input. By varying the AM modulation index, the side tones’ levels can be varied, enabling the sweep of the tone input power to perform Rx linearity measurements.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130340617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Anomalies in multiline-TRL-corrected measurements of short CPW lines 短CPW线多线trl校正测量的异常
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425345
G. Phung, U. Arz
{"title":"Anomalies in multiline-TRL-corrected measurements of short CPW lines","authors":"G. Phung, U. Arz","doi":"10.1109/ARFTG49670.2021.9425345","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425345","url":null,"abstract":"Microwave probes in on-wafer measurements contribute to a number of parasitic effects deteriorating the accuracy of multiline Thru Reflect Line (mTRL) calibrations. The accuracy of mTRL calibration is especially sensitive in Devices under Test (DUTs) of shorter line length. It has been demonstrated in previous experimental studies that the calibrated results are often only reliable as long as the length of the line is at least 2 mm. However, the reasons behind this phenomenon have not yet been clarified. Therefore, this paper reports on a systematic analysis of the dependency of the mTRL calibration accuracy on probe effects with a focus on coplanar waveguides (CPW) of shorter line length. For the first time, investigations with regard to the probe effects in shorter CPWs are presented.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"88 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128389947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
RF-dc Converter Optimization using MIMO Antennas and OTA Multi-Sine Calibration Method 基于MIMO天线和OTA多正弦校准方法的RF-dc变换器优化
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425097
Marina Jordão, D. Belo, R. Caldeirinha, Arnaldo S. R. Oliveira, N. Carvalho
{"title":"RF-dc Converter Optimization using MIMO Antennas and OTA Multi-Sine Calibration Method","authors":"Marina Jordão, D. Belo, R. Caldeirinha, Arnaldo S. R. Oliveira, N. Carvalho","doi":"10.1109/ARFTG49670.2021.9425097","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425097","url":null,"abstract":"In this paper, the optimization of the power transmitted from several non-collocated antennas to an RF-dc converter circuit is performed using an Over-The-Air (OTA) multi-sine feedback method. An experimental system is tested in an indoor environment and the OTA multi-sine calibration method is applied to produce constructive interference at the RF-dc converter location. It is shown that its overall performance is improved for different indoor positions. Experimental results demonstrate the effectiveness of using the proposed method for Wireless Power Transfer (WPT) applications since the RF-dc converter presents higher efficiency when the method is applied even in worst scenarios, such as low input power or larger distance.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122129223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Improvement of Measurement Uncertainty of THz Waveguide Vector Network Analyzers 太赫兹波导矢量网络分析仪测量不确定度的改进
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425171
M. Horibe
{"title":"Improvement of Measurement Uncertainty of THz Waveguide Vector Network Analyzers","authors":"M. Horibe","doi":"10.1109/ARFTG49670.2021.9425171","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425171","url":null,"abstract":"Even if systematic error terms, i.e. directivity, matching and tracking, in vector network Analyzer (VNA) can be corrected by a calibration process, but it is difficult to ignore the other random error effects, i.e. connection repeatability and flexure effects of cables attached to test ports, etc.. In the THz waveguide VNA using frequency extension modules, LO and RF cables making connection from frequency extension modules to microwave VNA produce a large impact on the uncertainty in the transmission phase measurements. This paper proposes minimization of cable flexure effects of RF and LO cables in the THz VNA using frequency extension modules. Then, VNA error model including the LO and RF cable flexure effects are discussed.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"273 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123421330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Estimation of the Coverage Probability of S-Parameters for Safety-Critical Systems with Hotelling’s T2 Distribution Hotelling T2分布下安全关键系统s参数覆盖概率的估计
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425152
Franz G. Aletsee
{"title":"Estimation of the Coverage Probability of S-Parameters for Safety-Critical Systems with Hotelling’s T2 Distribution","authors":"Franz G. Aletsee","doi":"10.1109/ARFTG49670.2021.9425152","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425152","url":null,"abstract":"Safety-critical systems, such as medical products, industrial safety functions, or autonomous driving systems, rely not only on the knowledge of the actual system parameters, but it is imperative to also take statistic properties into account. Besides measurement uncertainties, sample variation can play an extraordinary role in the evaluation of the overall variation of a certain parameter. S-parameters are used to describe the linear behavior of high-frequency devices, such as cables. This paper focuses on the quantification of sample variation to satisfy predefined safety margins. First, statistic relations are deduced and presented. Afterwards, these results are verified by means of Monte Carlo simulations. It can be shown, that even for moderate sample sizes of about 50 observations, the Hotelling’s T2 distribution needs to be used to account for the uncertainty of the sample covariance matrix estimation. These general findings are adapted to S-parameter measurements and an application based on 9 cable measurements is presented.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127650964","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Emulation of a Multi-Stage Differential Amplifier Using one Single-Ended Device-Under-Test 用单端被测器件仿真多级差分放大器
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425107
K. Buisman, J. Perez-Cisneros, W. Hallberg, Dhecha Nopchinda, P. Zampardi
{"title":"Emulation of a Multi-Stage Differential Amplifier Using one Single-Ended Device-Under-Test","authors":"K. Buisman, J. Perez-Cisneros, W. Hallberg, Dhecha Nopchinda, P. Zampardi","doi":"10.1109/ARFTG49670.2021.9425107","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425107","url":null,"abstract":"A method to emulate multi-stage power amplifier (PA) architectures is presented. The technique predicts multistage PA performance. The method is based on an iterative procedure using transistor/branch PA active load-pull measurements to include inter-stage interaction. As a benefit, real-world performance of a multi-stage PA can be evaluated early in the design process. Compared to previous published work, the method requires only a single representative device-undertest to embody multi-stage architectures. Thus, a compelling measurement method for PA designers is presented. The method is demonstrated by emulating a two-stage differential amplifier at 2.14 GHz using single-tone signals.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126408993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Electromagnetic Field Measurements Above On-Wafer Calibration Standards 片上校正标准以上的电磁场测量
2021 96th ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2021-01-18 DOI: 10.1109/ARFTG49670.2021.9425326
H. Votsi, Jonas Urbonas, S. Iezekiel, P. Aaen
{"title":"Electromagnetic Field Measurements Above On-Wafer Calibration Standards","authors":"H. Votsi, Jonas Urbonas, S. Iezekiel, P. Aaen","doi":"10.1109/ARFTG49670.2021.9425326","DOIUrl":"https://doi.org/10.1109/ARFTG49670.2021.9425326","url":null,"abstract":"This paper presents electromagnetic field measurements obtained above on-wafer calibration standards. The results show the complexity of calibrating in an on-wafer environment, especially at high frequencies as the fields couple to adjacent devices, resulting in the standards behaving different than expected. A vector network analyzer and an electro-optic measurement system are integrated to enable the measurement of the electric-field components above a calibration wafer between 2-26GHz. The measured tangential electric-field component is compared to electromagnetic simulations, verifying the validity of the measurements. Both the tangential and normal electric-field components capture the electromagnetic fields present within an on-wafer environment, when an coplanar-waveguide offset short structure is excited.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"C-22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126792269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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