{"title":"基于代理模型的多谐波近场测量加速","authors":"Jonas Urbonas, H. Votsi, A. Shakouri, P. Aaen","doi":"10.1109/ARFTG49670.2021.9425147","DOIUrl":null,"url":null,"abstract":"In this paper, a surrogate modeling-based acceleration technique for multi-harmonic phase-coherent electrooptic near-field measurements is presented. The implementation uses an adaptive sampling and modeling algorithm instead of the conventional raster scanning approach, which reduces the measurement time by a factor of 9, from 7 hours to 45 minutes, and the number of samples by a factor of 23, from 10556 to 464, while maintaining the average measurement error under 5%. The reduction in measurement time helps to preserve the accuracy of the multi-harmonic near-field measurements, asthe electro-optic measurement system response can drift over time, due to thermal fluctuations in the measurement environment.","PeriodicalId":196456,"journal":{"name":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-01-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Surrogate Modeling-Based Acceleration of Multi-Harmonic Near-Field Measurements\",\"authors\":\"Jonas Urbonas, H. Votsi, A. Shakouri, P. Aaen\",\"doi\":\"10.1109/ARFTG49670.2021.9425147\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a surrogate modeling-based acceleration technique for multi-harmonic phase-coherent electrooptic near-field measurements is presented. The implementation uses an adaptive sampling and modeling algorithm instead of the conventional raster scanning approach, which reduces the measurement time by a factor of 9, from 7 hours to 45 minutes, and the number of samples by a factor of 23, from 10556 to 464, while maintaining the average measurement error under 5%. The reduction in measurement time helps to preserve the accuracy of the multi-harmonic near-field measurements, asthe electro-optic measurement system response can drift over time, due to thermal fluctuations in the measurement environment.\",\"PeriodicalId\":196456,\"journal\":{\"name\":\"2021 96th ARFTG Microwave Measurement Conference (ARFTG)\",\"volume\":\"54 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-01-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 96th ARFTG Microwave Measurement Conference (ARFTG)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG49670.2021.9425147\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 96th ARFTG Microwave Measurement Conference (ARFTG)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG49670.2021.9425147","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Surrogate Modeling-Based Acceleration of Multi-Harmonic Near-Field Measurements
In this paper, a surrogate modeling-based acceleration technique for multi-harmonic phase-coherent electrooptic near-field measurements is presented. The implementation uses an adaptive sampling and modeling algorithm instead of the conventional raster scanning approach, which reduces the measurement time by a factor of 9, from 7 hours to 45 minutes, and the number of samples by a factor of 23, from 10556 to 464, while maintaining the average measurement error under 5%. The reduction in measurement time helps to preserve the accuracy of the multi-harmonic near-field measurements, asthe electro-optic measurement system response can drift over time, due to thermal fluctuations in the measurement environment.