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X-ray Optics and Instrumentation最新文献

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Fabrication and Performance Test of Fresnel Zone Plate with 35 nm Outermost Zone Width in Hard X-Ray Region 硬x射线区外宽35 nm菲涅耳带片的制备及性能测试
X-ray Optics and Instrumentation Pub Date : 2010-07-13 DOI: 10.1155/2010/824387
Yoshio Suzuki, A. Takeuchi, H. Takenaka, I. Okada
{"title":"Fabrication and Performance Test of Fresnel Zone Plate with 35 nm Outermost Zone Width in Hard X-Ray Region","authors":"Yoshio Suzuki, A. Takeuchi, H. Takenaka, I. Okada","doi":"10.1155/2010/824387","DOIUrl":"https://doi.org/10.1155/2010/824387","url":null,"abstract":"A Fresnel zone plate (FZP) with 35 nm outermost zone width has been fabricated and tested in the hard X-ray region. The FZP was made by electron beam lithography and reactive ion etching technique. The performance test of the FZP was carried out by measuring the focused beam profile for coherent hard X-ray beam at the beamline 20XU of SPring-8. The full width at half maximum of the focused beam profile measured by knife-edge scan method is 34.9±2.7 nm, that agrees well with the theoretical value of diffraction-limited resolution. Applications to scanning microscopy were also carried out.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"2010 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131020333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
High-Energy X-Ray Microprobe System with Submicron Resolution for X-Ray Fluorescence Analysis of Uranium in Biological Specimens 亚微米分辨率高能x射线微探针系统用于生物样品中铀的x射线荧光分析
X-ray Optics and Instrumentation Pub Date : 2010-07-05 DOI: 10.1155/2010/317909
Y. Terada, S. Homma-Takeda, A. Takeuchi, Yoshio Suzuki
{"title":"High-Energy X-Ray Microprobe System with Submicron Resolution for X-Ray Fluorescence Analysis of Uranium in Biological Specimens","authors":"Y. Terada, S. Homma-Takeda, A. Takeuchi, Yoshio Suzuki","doi":"10.1155/2010/317909","DOIUrl":"https://doi.org/10.1155/2010/317909","url":null,"abstract":"Total-external-reflection Kirkpatrick-Baez mirror optics for high-energy X-rays have been applied to the X-ray microprobe at beamline 37XU of SPring-8. A focused beam size of 1.0 μm (V)×0.83 μm (H) has been achieved at an X-ray energy of 30 keV, and a total photon flux of the focused beam was about 5×109 photons/s. Micro-X-ray fluorescence (μ-XRF) analysis of the uranium distribution in rat kidneys has been performed with the mirror-focused beam. The sensitivity of uranium was evaluated from the XRF intensity of thin standard samples, and the minimum detection limit was estimated at 10 μg/g. The high-spatial-resolution analysis revealed that uranium was concentrated in the epithelium of the proximal tubules in the inner cortex. The maximum concentration of uranium in the tubule was estimated to be 503 μg/g using a semiquantitative evaluation.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124665494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
A Tunable Energy Filter for Medical X-Ray Imaging 用于医用x射线成像的可调谐能量滤波器
X-ray Optics and Instrumentation Pub Date : 2008-10-13 DOI: 10.1155/2008/635024
E. Fredenberg, B. Cederström, M. Aslund, C. Ribbing, M. Danielsson
{"title":"A Tunable Energy Filter for Medical X-Ray Imaging","authors":"E. Fredenberg, B. Cederström, M. Aslund, C. Ribbing, M. Danielsson","doi":"10.1155/2008/635024","DOIUrl":"https://doi.org/10.1155/2008/635024","url":null,"abstract":"A multiprism lens (MPL) is a refractive X-ray lens, and its chromatic properties can be employed in an energy filtering setup to obtain a narrow tunable X-ray spectrum. We present the first evaluat ...","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"30 11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123156154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
High-Definition X-Ray Fluorescence: Applications 高清晰度x射线荧光:应用
X-ray Optics and Instrumentation Pub Date : 2008-09-30 DOI: 10.1155/2008/709692
W. Gibson, Zewu Chen, Danhong Li
{"title":"High-Definition X-Ray Fluorescence: Applications","authors":"W. Gibson, Zewu Chen, Danhong Li","doi":"10.1155/2008/709692","DOIUrl":"https://doi.org/10.1155/2008/709692","url":null,"abstract":"Energy dispersive X-ray fluorescence (EDXRF) is a well-established and powerful tool for nondestructive elemental analysis of virtually any material. It is widely used for environmental, industrial, pharmaceutical, forensic, and scientific research applications to measure the concentration of elemental constituents or contaminants. The fluorescing atoms can be excited by energetic electrons, ions, or photons. A particular EDXRF method, monochromatic microbeam X-ray fluorescence (M μ EDXRF), has proven to be remarkably powerful in measurement of trace element concentrations and distributions in a large variety of important medical, environmental, and industrial applications. When used with state-of-the-art doubly curved crystal (DCC) X-ray optics, this technique enables high-sensitivity, compact, low-power, safe, reliable, and rugged analyzers for insitu, online measurements in industrial process, clinical, and field settings. This new optic-enabled M μ EDXRF technique is known as high-definition X-Ray fluorescence (HD XRF). Selected applications of HD XRF are described in this paper including air particulate analysis, analysis of body fluid contamination at ppb levels, elemental mapping of brain tissue and bone samples, as well as analysis of toxins in toys and other consumer products.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114180207","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction 单层和双层多层光学在粉末x射线衍射中的应用
X-ray Optics and Instrumentation Pub Date : 2008-07-16 DOI: 10.1155/2008/408702
S. Misture
{"title":"Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction","authors":"S. Misture","doi":"10.1155/2008/408702","DOIUrl":"https://doi.org/10.1155/2008/408702","url":null,"abstract":"The performance of parallel beam multilayer optics, including a parabolic multilayer Osmic MaxFlux GO-13N and a flat custom multilayer, was evaluated experimentally and compared to Bragg-Brentano and traditional \u0000‘‘parallel beam’’ or ‘‘thin film’’ optical geometries. A novel arrangement of a parabolic multilayer in the incident beam with a flat multilayer in the diffracted beam functioning as an analyzer crystal was proven effective for powder diffraction applications. The dual-optic configuration improves resolution while eliminating sample displacement and transparency errors as expected for a configuration with equatorial divergence below 100 arcseconds. Fundamental parameters fitting showed that the parabolic multilayer can be accurately modeled using a constant Gaussian function, while a long parallel-plate soller collimator requires a constant hat function. No additional convolutions are necessary for the diffracted-beam flat multilayer because of the lower acceptance angle.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124644482","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Direct Fan-Beam Reconstruction Algorithm via Filtered Backprojection for Differential Phase-Contrast Computed Tomography 差分相衬计算机断层扫描滤波反投影直接扇束重建算法
X-ray Optics and Instrumentation Pub Date : 2008-06-22 DOI: 10.1155/2008/835172
Z. Qi, Guang-Hong Chen
{"title":"Direct Fan-Beam Reconstruction Algorithm via Filtered Backprojection for Differential Phase-Contrast Computed Tomography","authors":"Z. Qi, Guang-Hong Chen","doi":"10.1155/2008/835172","DOIUrl":"https://doi.org/10.1155/2008/835172","url":null,"abstract":"Recently, a novel data acquisition method has been proposed and experimentally implemented for differential phase-contrast computed tomography (DPC-CT), in which a conventional X-ray tube and a Talbot-Lau-type interferometer were utilized in data acquisition. The divergent nature of the data acquisition system requires a divergent-beam image reconstruction algorithm for DPC-CT. This paper focuses on addressing this image reconstruction issue. We have developed a filtered backprojection algorithm to directly reconstruct the DPC-CT images from acquired fan-beam data. The developed algorithm allows one to directly reconstruct the decrement of the real part of the refractive index from the measured data. In order to accurately reconstruct an image, the data need to be acquired over an angular range of at least 180 ∘ plus the fan angle. As opposed to the parallel beam data acquisition and reconstruction methods, a 180 ∘ -rotation angle for the data acquisition system does not provide sufficient data for an accurate reconstruction of the entire field of view. Numerical simulations have been conducted to validate the image reconstruction algorithm.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"58 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116885404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Collimated Magnetron Sputter Deposition for Mirror Coatings 准直磁控溅射沉积用于镜面涂层
X-ray Optics and Instrumentation Pub Date : 2008-06-15 DOI: 10.1155/2008/792540
A. Vickery, C. Jensen, F. Christensen, M. P. Steenstrup, Troels Schonfeldt
{"title":"Collimated Magnetron Sputter Deposition for Mirror Coatings","authors":"A. Vickery, C. Jensen, F. Christensen, M. P. Steenstrup, Troels Schonfeldt","doi":"10.1155/2008/792540","DOIUrl":"https://doi.org/10.1155/2008/792540","url":null,"abstract":"At the Danish National Space Center (DNSC), a planar magnetron sputtering chamber has been established as a research and production coating facility for curved X-ray mirrors for hard X-ray optics for astronomical X-ray telescopes. In the following, we present experimental evidence that a collimation of the sputtered particles is an efficient way to suppress the interfacial roughness of the produced multilayer. We present two different types of collimation optimized for the production of low roughness curved mirrors and flat mirrors, respectively.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134318167","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
High Definition X-Ray Fluorescence: Principles and Techniques 高清晰度x射线荧光:原理和技术
X-ray Optics and Instrumentation Pub Date : 2008-05-26 DOI: 10.1155/2008/318171
Zewu Chen, W. Gibson, Huapeng Huang
{"title":"High Definition X-Ray Fluorescence: Principles and Techniques","authors":"Zewu Chen, W. Gibson, Huapeng Huang","doi":"10.1155/2008/318171","DOIUrl":"https://doi.org/10.1155/2008/318171","url":null,"abstract":"Energy dispersive X-ray fluorescence (EDXRF) is a well-established and powerful tool for nondestructive elemental analysis of virtually any material. It is widely used for environmental, industrial, pharmaceutical, forensic, and scientific research applications to measure the concentration of elemental constituents or contaminants. The fluorescing atoms can be excited by energetic electrons, ions, or photons. A particular EDXRF method, monochromatic microfocus X-ray fluorescence (M μ EDXRF), has proven to be remarkably powerful in measurement of trace element concentrations and distributions in a large variety of important medical, environmental, and industrial applications. When used with state-of-the-art doubly curved crystal (DCC) X-ray optics, this technique enables high-sensitivity, compact, low-power, safe, reliable, and rugged analyzers for insitu, online measurements in industrial process, clinical, and field settings. This new optic-enabled M μ EDXRF technique, called high definition X-ray fluorescence (HD XRF), is described in this paper.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"186 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116448437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 42
Custom Hardware Processor to Compute a Figure of Merit for the Fit of X-Ray Diffraction Peaks 自定义硬件处理器计算x射线衍射峰拟合的优值图
X-ray Optics and Instrumentation Pub Date : 2008-04-30 DOI: 10.1155/2008/168237
J. Gómez-Pulido, F. Sánchez-Bajo, S. P. Santos, M. A. Vega-Rodríguez, J. M. Sánchez-Pérez
{"title":"Custom Hardware Processor to Compute a Figure of Merit for the Fit of X-Ray Diffraction Peaks","authors":"J. Gómez-Pulido, F. Sánchez-Bajo, S. P. Santos, M. A. Vega-Rodríguez, J. M. Sánchez-Pérez","doi":"10.1155/2008/168237","DOIUrl":"https://doi.org/10.1155/2008/168237","url":null,"abstract":"A custom processor based on reconfigurable hardware technology is proposed in order to compute the figure of merit used to measure the quality of the fit of X-ray diffraction peaks. As the experimental X-ray profiles can present many peaks severely overlapped, it is necessary to select the best model among a large set of reasonably good solutions. Determining the best solution is computationally intensive, because this is a hard combinatorial optimization problem. The proposed processors, working in parallel, increase the performance relative to a software implementation.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2008-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115182160","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Focusing Polycapillary Optics and Their Applications 聚焦多毛细光学及其应用
X-ray Optics and Instrumentation Pub Date : 1900-01-01 DOI: 10.1155/2010/867049
C. MacDonald
{"title":"Focusing Polycapillary Optics and Their Applications","authors":"C. MacDonald","doi":"10.1155/2010/867049","DOIUrl":"https://doi.org/10.1155/2010/867049","url":null,"abstract":"A summary of focusing X ray polycapillary optics is presented including history, theory, modeling, and applications development. The focusing effects of polycapillary optics come from the overlap of the beams from thousands of small hollow glass tubes. Modeling efforts accurately describe optics performance to allow for system development in a wide variety of geometries. The focusing of X ray beams with polycapillary optics yields high gains in intensity and increased spatial resolution for a variety of clinical, lab-based, synchrotron or in situ analysis applications.","PeriodicalId":193128,"journal":{"name":"X-ray Optics and Instrumentation","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114349160","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 90
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