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2009 IEEE AUTOTESTCON最新文献

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FPGA implementation of a configurable viterbi decoder for software radio receiver 用于软件无线电接收机的可配置viterbi解码器的FPGA实现
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314063
S. Shaker, S. Elramly, K. Shehata
{"title":"FPGA implementation of a configurable viterbi decoder for software radio receiver","authors":"S. Shaker, S. Elramly, K. Shehata","doi":"10.1109/AUTEST.2009.5314063","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314063","url":null,"abstract":"Convolutional codes are one of the Forward Error Correction (FEC) codes that are used in every robust digital communication system. Viterbi algorithm is employed in wireless communications to decode the convolutional codes. Such decoders are complex and dissipate large amount of power. Software Defined Radio (SDR) is realized using highly configurable hardware platforms. Field Programmable Gate Array technology (FPGA) is a highly configurable option for implementing many sophisticated signal processing tasks in SDR. In this paper, a generic, configurable and low power Viterbi decoder for software defined radio is described using a VHDL code for FPGA implementation. The proposed design of the Viterbi decoder is considered to be generic so that it facilitates the prototyping of the decoder with different specifications. The proposed design is implemented on Xilinx Virtex-II Pro, XC2vp30 FPGA using the FPGA Advantage Pro package provided by Mentor Graphics and ISE 10.1 by Xilinx.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121118518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Test program set (TPS) migration 测试程序集(TPS)迁移
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314083
R. Peet
{"title":"Test program set (TPS) migration","authors":"R. Peet","doi":"10.1109/AUTEST.2009.5314083","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314083","url":null,"abstract":"TPS migration solutions address the problem of legacy ATE systems, which support the validation of Military/Aerospace systems, experiencing “end of life” issues. A cross section of ATE systems will be reviewed from both a hardware and software perspective, with specific emphasis on the challenges and solutions on TPS's using LASAR™ simulation. Solutions will be presented on how to migrate the existing test program sets to current technology at considerably reduced time and cost. These TPS software migration tools allow for the easy conversion and migration of functional test programs, with minimal debug to a new state-of-the-art test system. By retaining features, such as guided probe, fault dictionary, and many others, test programs developed in the 70's to the current 90's are easily ported and therefore supported for many more years to come. Special attention will also be given to discussing enhancements to legacy programs after migration with new software tools. The tools available today, combined with hardware advances can show improved test coverage and diagnostic capabilities over the original TPS on the Legacy system. Legacy test platforms include: GenRad, Teradyne, Computer Automation, Schlumberger, Factron and others.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121315137","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Consolidating test resources for avionics production test - requirements and applications 整合航空电子产品试验资源。试验要求和应用
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314058
W. Sonnenberg, Alex Sharpio, M. Dewey
{"title":"Consolidating test resources for avionics production test - requirements and applications","authors":"W. Sonnenberg, Alex Sharpio, M. Dewey","doi":"10.1109/AUTEST.2009.5314058","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314058","url":null,"abstract":"The manufacturing and test of avionics products for military and commercial aircraft presents a unique set of requirements and challenges. Historically, the development and deployment of production test systems for avionics products such as aircraft data acquisition and recording systems, navigation and communication products, and aircraft network systems have been addressed on a product specific basis - resulting in a variety of test platforms and solutions with little test system commonality and technology. Additionally, this lack of test system commonality and the requirement to maintain legacy products with long product life cycles results in increased maintenance and logistics costs for manufacturing and support test. Consequently, the adoption of a common test platform can offer producers of avionics products lower test costs, improved test resource utilization, and the flexibility to support both new and legacy products. This paper reviews the requirements and the implementation of a common test platform and environment that offers a high level of efficiency, supports the implementation of routine test processes, offers reusability, and allows the consolidation of test resources to facilitate the collection of reliability data and test results.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126690997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Doomsday ATE to distributed measurement blocks 末日ATE分布式测量块
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314036
D. Lowenstein
{"title":"Doomsday ATE to distributed measurement blocks","authors":"D. Lowenstein","doi":"10.1109/AUTEST.2009.5314036","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314036","url":null,"abstract":"Cost of Test, ATE utilization, floor space, flexibility⋯the list goes on and on of the issues the DoD and their primes are continually trying solve in the realm of Test. Tools like 6-Sigma and Lean have moved this effort forward dramatically over the past decade but has been primarily focused at taking inefficiencies out of the current strategy of test. It's now time to look at an entirely different approach, one outside the industry but with all the complexities that are inherent to the Aerospace and Defense world. This paper will walk through the process of moving from a doomsday ATE test model to that of a distributed measurement model, similar to those that are used in commercial applications. It will show how Cost of Test, utilization, floor space, flexibility and more can be achieved.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"293 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131978975","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
New direction for the Dod ATS Framework 国防部ATS框架的新方向
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314013
M. Malesich
{"title":"New direction for the Dod ATS Framework","authors":"M. Malesich","doi":"10.1109/AUTEST.2009.5314013","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314013","url":null,"abstract":"The Automatic Test System (ATS) Executive Directorate is charged with developing objectives for ATS modernization within the Department of Defense (DoD). The DoD ATS Framework Working Group (FWG) was established by the ATS Executive Directorate to create a Framework addressing these objectives. In addition to creating and updating key element definitions within the Framework, the FWG focuses on identifying commercial specifications and standards that might satisfy requirements for these elements. The Framework is being specified in DoD ATS policy so that its standards are incorporated in future DoD ATS acquisitions.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"88 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134314349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Development of fast test platform for microsatellite 微卫星快速测试平台的研制
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314040
Pengpeng Yu, Datong Liu, Xiyuan Peng, Shao Yunfeng
{"title":"Development of fast test platform for microsatellite","authors":"Pengpeng Yu, Datong Liu, Xiyuan Peng, Shao Yunfeng","doi":"10.1109/AUTEST.2009.5314040","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314040","url":null,"abstract":"Microsatellite is a kind of platform in space for various scientific researches. So, during its design, simulation and test process, the status and signals should be monitored and analyzed are complicated. According to those kinds of practical requirement, an open test platform suitable for fast test aimed in different research purpose should be considered. Thus, a brand-new solution based on SOPC (System on Programmable Chip) technology and synthetic instruments is presented in this paper. It adopts a distributed parallel test architecture with a standard high speed serial bus LVDS (Low Voltage Differential Signal) as the data communication and system control interface. This test platform has an open framework, a strong expansibility and a real-time processing ability for microsatellites test. It has been successfully applied and implements 200ms periodical real-time monitoring and testing in a microsatellite test and simulation system.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133956720","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Acquisition decision factors and the Resource Adapter Information Framework element 获取决策因素和资源适配器信息框架元素
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5313999
H. Pritchett
{"title":"Acquisition decision factors and the Resource Adapter Information Framework element","authors":"H. Pritchett","doi":"10.1109/AUTEST.2009.5313999","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5313999","url":null,"abstract":"A decision by the Department of Defense (DoD) to recommend the use of the Resource Adapter Information (RAI) Framework element in Automatic Test Systems (ATS) acquisition will involve a combination of factors, decisions, and program requirements. Significant work in the last few years has produced a definition and helped to clarify the requirement for RAI. The IEEE Std. 1641 Standard for Signal and Test Definition committee is moving forward to include an annex defining RAI. The IEEE Std. 1671 Automatic Test Markup Language (ATML) also supports RAI and its potential implementations. Ongoing work in demonstrating the RAI technical merit and implementation viability is producing results that will help ensure its inclusion in future DoD ATS. At the same time, costs related to maintenance and operational requirements of weapon systems are important factors in selecting recommended DoD Framework elements and their employment in ATS requirements at acquisition.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131913695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PXI based flight-line test sets 基于PXI的飞行线测试集
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314009
L. Gutterman
{"title":"PXI based flight-line test sets","authors":"L. Gutterman","doi":"10.1109/AUTEST.2009.5314009","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314009","url":null,"abstract":"In the past decade, PXI has proven to be a powerful and robust standard that is suitable for most Mil-Aero test applications. PXI-based testers are widely used today in engineering test stations, as production acceptance testers, environmental stress screening testers, as well as full-fledged Intermediate-Level and Depot-Level testers.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131326785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
TPS data collection and data mining TPS数据收集和数据挖掘
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314049
I. Williams, S. Moran
{"title":"TPS data collection and data mining","authors":"I. Williams, S. Moran","doi":"10.1109/AUTEST.2009.5314049","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314049","url":null,"abstract":"This paper discusses tools and techniques for TPS data collection and near real-time data processing and visualization using commercial, off-the-shelf products such as Microsoft® SQL Server® database software and Visual Studio® development system. Examples will be shown on how to add simple data collection and processing methods to the Unit Under Test (UUT) test process using. NET programming languages.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123545873","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Built in Test - coverage and diagnostics 内置测试覆盖和诊断
2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314056
Jeffrey Smith, D. Lowenstein
{"title":"Built in Test - coverage and diagnostics","authors":"Jeffrey Smith, D. Lowenstein","doi":"10.1109/AUTEST.2009.5314056","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314056","url":null,"abstract":"Idealy, everyone would like to embed test into their products today, whether it's to reduce costs, build in support capabilities, ensure better quality, reduce dependacy on expert technicians, or for one of many other intelligent motivations. However, it seems the technology of Built in Test (BIT) has not taken off or been adopted like many believed it would. The reasons for this poor adoption are diverse: some blame it on design, others fault product specifications and even others blame it on the fundementals of the technology itself.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132197921","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
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