2009 IEEE AUTOTESTCON最新文献_第7页

Demonstrating the capabilities of IEEE standard P1636.2 mai in support of the DoD ATS framework 演示IEEE标准P1636.2 mai支持DoD ATS框架的功能

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314006

M. Modi, J. Stanco

引用次数: 4

Mission assurance through Test Program Set analysis 通过测试程序集分析来保证任务

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314070

Y. Eracar, T. Lopes

引用次数: 0

Using virtualization to reduce the cost of test 使用虚拟化来降低测试成本

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314086

Casey Weltzin, S. Delgado

引用次数: 11

Optimization test mission scheduling strategy study based on ATML 基于ATML的优化测试任务调度策略研究

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314046

Xiangyu Gao, Lei Wang, Lei Song

引用次数: 0

IEEE-1445 (DTIF) based digital test solution 基于IEEE-1445 (DTIF)的数字测试解决方案

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314007

R. Yazma, A. Quan

引用次数: 2

Instrument design that solves the challenges of both legacy and emerging test requirements 解决传统和新兴测试需求挑战的仪器设计

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/MIM.2010.5521862

C. Heide, D. Kaushansky

{"title":"Instrument design that solves the challenges of both legacy and emerging test requirements","authors":"C. Heide, D. Kaushansky","doi":"10.1109/MIM.2010.5521862","DOIUrl":"https://doi.org/10.1109/MIM.2010.5521862","url":null,"abstract":"In addition to designing an automatic test system (ATS) that meets a customer's current and emerging test requirements, many system integrators must also meet the challenge of creating a system that maintains a customer's investment in existing test program sets (TPSs). Meeting this challenge is difficult because most COTS test instruments are not designed with legacy requirements in mind. Rather, they are designed to meet current test requirements with an eye toward anticipating future requirements. Instruments designed to meet legacy requirements typically do not have much capability to address emerging requirements because the design focus is on emulating previous instrument capabilities and behaviors as exactly as possible. Test instrument manufacturers can help system integrators overcome this challenge by designing instruments that meet the challenges of both legacy and emerging test requirements. While new technology such as FPGAs and advanced DSP can go a long way toward helping the designer meet both challenges, creating an instrument that successfully matches both sets of requirements requires great care in applying the technology to achieve a high degree of flexibility. This paper starts with a discussion of why a design for flexibility approach is so important to the instrument vendor, the ATS integrator, and the end customer. The paper concludes with design guidance and examples illustrating the success of such an approach.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"135 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124228514","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Advanced architecture for achieving true vertical testability in next generation ATE 在下一代ATE中实现真正的垂直可测试性的先进架构

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314088

D. Droste, G. Guilbeaux

{"title":"Advanced architecture for achieving true vertical testability in next generation ATE","authors":"D. Droste, G. Guilbeaux","doi":"10.1109/AUTEST.2009.5314088","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314088","url":null,"abstract":"Equivalent test results across maintenance levels have long been an elusive target for both military and commercial users. The fundamental reason for this is that it has been impractical to deploy the same ATE forward at the operations level as well as in support locations and/or depots. Forward deployed ATE tends to be based on requirements for ruggedness, transportability and a small footprint. In addition, it is usually targeted to support a small number of weapon system components. The other extreme is depot or factory ATE, with requirements for support of more weapon system components, and tending to have wider overall capability and a larger footprint. Because of the diverse size and packaging issues associated with the different environments, invariably, different ATE backplanes and instrument packaging formats are selected for each environment. Use of different instruments at each of the maintenance levels may lead to Can-Not-Duplicates (CNDs) at the depot test for electronic components pulled out of service based on test results of forward-deployed ATE. The goal of having test equivalence (eliminating CNDs) at the various levels is referred to as “Vertical Testability”.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127300905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Design of a software defined, FPGA-based reconfigurable RF Measuring Receiver 一种软件定义、基于fpga的可重构射频测量接收机的设计

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5313998

M. Hunter, A. Kourtellis, W. Mikhael

引用次数: 5

Using PAWS® CIIL emulation modules to rehost Test Program Sets written in the Abbreviated Test Language for All Systems (ATLAS) 使用PAWS®CIIL仿真模块重新托管以所有系统简化测试语言(ATLAS)编写的测试程序集

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314052

Daniel Zimmermann

引用次数: 0

Powering intelligent instruments with Lua scripting 用Lua脚本编写智能仪器

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314042

D. Clark

引用次数: 7