IEEE-1445 (DTIF) based digital test solution

Abstract

The digital test interchange format (DTIF) is defined by the IEEE-1445 specification and provides a standardized digital data interchange format that can be used with various digital test environments. This standardized format, when used in conjunction with tools for post-processing of DTIF files and appropriate functional test digital hardware, offers a cost effective and viable solution for migrating legacy TPS's to a modern digital test system platform. This paper provides an overview of how DTIF files generated by simulator tools such as Teradyne's LASAR simulator can be used in conjunction with modern digital test post-processing tools and hardware to provide a robust TPS migration strategy for legacy digital test applications including support for Go / No-Go tests, guided probe and fault dictionary functionality. This methodology offers wide applicability for a number of applications that were originally developed on digital test platforms such as the GenRad 1795 / 1796 / 2225/ 2235/ 2750, the Hewlett Packard DTS-70, Teradyne L200 / L300, and Schlumberger 790.