2009 IEEE AUTOTESTCON最新文献_第9页

Bridge the gap between simulation and test: An OSA-compliant Virtual Test Environment 搭建模拟和测试之间的桥梁:一个符合osa的虚拟测试环境

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314059

Ping-Chuan Lu, D. Glaser, G. Uygur, Susanne Weichslgartner, K. Helmreich, A. Lechner

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引用次数: 1

Modular Interconnect Packaging for Scalable Systems (MIPSS) for ATE - IEEE-P1693 standard 模块化互连封装可扩展系统(MIPSS)的ATE - IEEE-P1693标准

2009 IEEE AUTOTESTCON Pub Date : 2009-09-01 DOI: 10.1109/AUTEST.2009.5314061

M. Stora, S. Mann

{"title":"Modular Interconnect Packaging for Scalable Systems (MIPSS) for ATE - IEEE-P1693 standard","authors":"M. Stora, S. Mann","doi":"10.1109/AUTEST.2009.5314061","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314061","url":null,"abstract":"The IEEE-P1693, Modular Integration Packaging Scaleable System (MIPSS) standard as illustrated in Figure 1, defines the electrical and mechanical specifications of a modular interconnect packaging system design for Automatic Test System (ATS). It specifically describes a building block approach based upon the integration of three elements: (1) the outer enclosure and the inner Eurocard standard mechanical chassis that forms the mechanical structure of the building block with alignment features to mate with other enclosures [building blocks]; (2) a hopeful revision of the VME eXtensions for Instrumentation (VXI) chassis and component designs, that includes consideration of an IEEE-1155 backplane modification by the VXI Consortium Technical Committee [1], to add VME VXS 41.4 PCI Express serial bus control, with protocol enhancement under 2eSST, while the IEEE-P1693 working group continues to specify a new pluggable virtual power source, and mechanical extension that couples the VXI module directly to a transition panel that connects to an UUT or test interface choice emulating DOD Interface Standards [2]; and (3) the integration of the instrument modules and UUT personalty modules into a pluggable subassembly that interfaces with the basic enclosure building block.All of which is directly applicable to current DOD ATS (Fig.1).","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"506 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116199419","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

ATML demonstration ATML示范

2009 IEEE AUTOTESTCON Pub Date : 2009-09-01 DOI: 10.1109/autest.2009.5314020

C. Gorringe, I. Neag, Ron Taylor

引用次数: 0

Digital runtime 数字运行时

2009 IEEE AUTOTESTCON Pub Date : 2009-09-01 DOI: 10.1109/autest.2009.5314082

T. Lopes, Y. Eracar

引用次数: 0

Proper frequency planning in a Synthetic Instrument RF system 合成仪器射频系统中正确的频率规划

2009 IEEE AUTOTESTCON Pub Date : 2009-09-01 DOI: 10.1109/AUTEST.2009.5314004

A. Estrada