Built in Test - coverage and diagnostics

Jeffrey Smith, D. Lowenstein
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引用次数: 4

Abstract

Idealy, everyone would like to embed test into their products today, whether it's to reduce costs, build in support capabilities, ensure better quality, reduce dependacy on expert technicians, or for one of many other intelligent motivations. However, it seems the technology of Built in Test (BIT) has not taken off or been adopted like many believed it would. The reasons for this poor adoption are diverse: some blame it on design, others fault product specifications and even others blame it on the fundementals of the technology itself.
内置测试覆盖和诊断
理想情况下,今天每个人都希望将测试嵌入到他们的产品中,无论是为了降低成本,构建支持能力,确保更好的质量,减少对专家技术人员的依赖,还是出于许多其他智能动机之一。然而,内建测试(BIT)技术似乎并没有像许多人认为的那样起飞或被采用。这种糟糕的采用的原因是多种多样的:一些归咎于设计,另一些归咎于产品规格,甚至还有一些归咎于技术本身的基础。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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